Supplier | Part No | Manufacturer | Price | Stock | |
OMO ELECTRONIC LIMITED | SN74BCT8374ADWRE4 Package: : 24-SOIC | Texas Instruments | | 1796 | |
Geefook (shenzhen) Electronic Co., Ltd | SN74BCT8374ADW Подробнее | Texas Instruments | 11.93$ | 75 | |
SN74BCT8374ANT Подробнее | Texas Instruments | 4.13$ | 35000 | |
SN74BCT8374ADWR Подробнее | Texas Instruments | | 35000 | |
SN74BCT8374ANTG4 Подробнее | Texas Instruments | | 35000 | |
SN74BCT8374ADWRE4 Подробнее | Texas Instruments | | 35000 | |
SN74BCT8374ADWRG4 Подробнее | Texas Instruments | | 35000 | |
BETTLINK ELECTRONIC LIMITED | SN74BCT8374ANT BUS DRIVER Подробнее | Rochester Electronics, LLC | 5.582$ | 4643 | |
SN74BCT8374ANT IC SCAN TEST DEVICE W/FF 24-DIP Подробнее | Texas Instruments | 5.582$ | 5009 | |
Icseek Global Limited | SN74BCT8374ADW Оригинальный и наличный и новый | TI | | 4250 | |
SN74BCT8374ADWR Оригинальный и наличный и новый | TI | | 4250 | |
SN74BCT8374ADWRE4 Оригинальный и наличный и новый | TI | | 4250 | |
Digi-ic_SMART PIONEER Electronic | SN74BCT8374ANT BUS DRIVER Подробнее | Texas Instruments | | 8830 | |
SN74BCT8374ADW IC SCAN TEST DEVICE W/FF 24-SOIC Подробнее | Texas Instruments | | 8505 | |
SN74BCT8374ADWR IC SCAN TEST DEVICE W/FF 24-SOIC Подробнее | Texas Instruments | | 8000 | |
SN74BCT8374ANTG4 IC SCAN TEST DEVICE W/FF 24-DIP Подробнее | Texas Instruments | | 8000 | |
SN74BCT8374ADWRE4 IC SCAN TEST DEVICE W/FF 24-SOIC Подробнее | Texas Instruments | | 8000 | |
SN74BCT8374ADWRG4 IC SCAN TEST DEVICE 24SOIC Подробнее | Texas Instruments | | 7890 | |
DGT Technology (HK) Co., Limited | SN74BCT8374ADW IC SCAN TEST DEVICE W/FF 24-SOIC RoHS compliant Подробнее | Texas Instruments | 11.36$ bulk: 10.2622$ | 10000 | |
AN-CHIP | SN74BCT8374ADW микросхема интегральная электронная IC SCAN TEST DEVICE W/FF 24-SOIC 4-5 недель, цена по запросу; , Package: : N/A; , Min order: : 1; , D/c: : DC: 20+/21 | Texas Instruments | | 23941 | |
SN74BCT8374ANT микросхема интегральная электронная IC SCAN TEST DEVICE W/FF 24-DIP 4-5 недель, цена по запросу; , Package: : N/A; , Min order: : 1; , D/c: : DC: 20+/21 | Texas Instruments | | 24758 | |
SN74BCT8374ADWR микросхема интегральная электронная IC SCAN TEST DEVICE W/FF 24-SOIC 4-5 недель, цена по запросу; , Package: : N/A; , Min order: : 1; , D/c: : DC: 20+/21 | Texas Instruments | | 24756 | |
SN74BCT8374ADWG4 микросхема интегральная электронная IC SCAN TEST DEVICE 24SOIC 4-5 недель, цена по запросу; , Package: : N/A; , Min order: : 1; , D/c: : DC: 20+/21 | Texas Instruments | | 24287 | |
SN74BCT8374ADWE4 микросхема интегральная электронная IC SCAN TEST DEVICE W/FF 24-SOIC 4-5 недель, цена по запросу; , Package: : N/A; , Min order: : 1; , D/c: : DC: 20+/21 | Texas Instruments | | 24286 | |
SN74BCT8374ANTE4 микросхема интегральная электронная IC SCAN TEST DEVICE W/FF 24-DIP 4-5 недель, цена по запросу; , Package: : N/A; , Min order: : 1; , D/c: : DC: 20+/21 | Texas Instruments | | 24759 | |
SN74BCT8374ADWRE4 микросхема интегральная электронная IC SCAN TEST DEVICE W/FF 24-SOIC 4-5 недель, цена по запросу; , Package: : N/A; , Min order: : 1; , D/c: : DC: 20+/21 | Texas Instruments | | 24757 | |
SN74BCT8374ADWRG4 микросхема интегральная электронная IC SCAN TEST DEVICE 24SOIC 4-5 недель, цена по запросу; , Package: : N/A; , Min order: : 1; , D/c: : DC: 20+/21 | Texas Instruments | | 24866 | |
深圳市诺佰仕商贸有限公司 | SN74BCT8374ADW Device w/Octal D-Typ Edge-Trig Flip-Flop | Texas Instruments | | 10000 | |
Shenzhen Boruiwei Electronics Co.,Ltd. | SN74BCT8374ADW | Texas Instruments | | 10000 | |
SN74BCT8374ANT | Texas Instruments | | 10000 | |
Kontest | SN74BCT8374ADW Подробнее | | 246.24 RUB | 1 | |
SN74BCT8374ADW Подробнее | TEXAS INSTRUMENTS | | | |
SN74BCT8374ADW Подробнее | TEXAS INSTRUMENTS | | | |
SN74BCT8374ADWE4 IC SCAN TEST DEVICE W/FF 24-SOIC Подробнее | Texas Instruments | | | |
Acme Chip Technology Co.,Limited | SN74BCT8374ADW IC SCAN TEST DEVICE W/FF 24-SOIC | Texas Instruments | 9.32$ | 14289 | |
SN74BCT8374ADWR IC SCAN TEST DEVICE W/FF 24-SOIC | Texas Instruments | | 6596 | |
SN74BCT8374ADWRG4 IC SCAN TEST DEVICE 24SOIC | Texas Instruments | | 5675 | |
SN74BCT8374ANT IC SCAN TEST DEVICE W/FF 24-DIP | Texas Instruments | 5.36$ | 5087 | |
SN74BCT8374ANTG4 IC SCAN TEST DEVICE W/FF 24-DIP | Texas Instruments | | 4402 | |
ООО "ЭНЕРГОФЛОТ" | SN74BCT8374ADW | | 222.3 RUB | 1 | |
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"SINERGY-DISTRIBUTION" LLC | SN74BCT8374ADW IC SCAN TEST DEVICE W/FF 24-SOIC | Texas Instruments | 14821.12 RUB bulk: 13397.08 RUB mult: 12774.92 RUB | 235 | |
SN74BCT8374ADWR IC SCAN TEST DEVICE W/FF 24-SOIC | Texas Instruments | | | |
SN74BCT8374ADWRE4 IC SCAN TEST DEVICE W/FF 24-SOIC | Texas Instruments | | | |
SN74BCT8374ANT IC SCAN TEST DEVICE W/FF 24-DIP | Texas Instruments | | | |
SN74BCT8374ANTG4 IC SCAN TEST DEVICE W/FF 24-DIP | Texas Instruments | | | |
SN74BCT8374ADWRG4 IC SCAN TEST DEVICE 24SOIC | Texas Instruments | | | |
SN74BCT8374ANT BUS DRIVER | Rochester Electronics, LLC | | 825 | |
ООО "Интегральные схемы" | SN74BCT8374A | | | from 7 days | |
SN74BCT8374ADW | | | from 7 days | |
SN74BCT8374ADWE4 | | | from 7 days | |
SN74BCT8374ADWG4 | | | from 7 days | |
SN74BCT8374ADWR | | | from 7 days | |
SN74BCT8374ADWRE4 | | | from 7 days | |
SN74BCT8374ADWRG4 | | | from 7 days | |
SN74BCT8374AM | | | from 7 days | |
SN74BCT8374ANT | | | from 7 days | |
SN74BCT8374ANTE4 | | | from 7 days | |
Delta Electronics | SN 74BCT8374ADW | | 213.76 RUB | 1 | |
Aspect | SN74BCT8374A | | | from 7 days | |
SN74BCT8374ADW | | | from 7 days | |
SN74BCT8374ADWE4 | | | from 7 days | |
SN74BCT8374ADWG4 | | | from 7 days | |
SN74BCT8374ADWR | | | from 7 days | |
SN74BCT8374ADWRE4 | | | from 7 days | |
SN74BCT8374ADWRG4 | | | from 7 days | |
SN74BCT8374AM | | | from 7 days | |
SN74BCT8374ANT | | | from 7 days | |
SN74BCT8374ANTE4 | | | from 7 days | |