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Part Number CAT525

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1
SERIAL
DATA
OUTPUT
REGISTER
V L1
REF
V H1
REF
V 1
18
16
15
8
17
OUT
V 3
V 4
OUT
V 2
OUT
OUT
DO
+
­
+
­
+
­
+
­
PROG
RDY/
BSY
PROGRAM
CONTROL
H.V.
CHARGE
PUMP
DATA
CONTROLLER
5
CLK
CS
4
6
7
9
V H2
REF
V H3
REF
V H4
REF
7K
(ea)
1
2
20
19
11
12
13
14
V L2
REF
V L3
REF
V L4
REF
NVRAM
GND
CLK
CS
DI
DO
DVD
PROG
RDY/BSY
VREF H1
1
2
3
4
5
6
7
10
9
8
20
19
18
17
14
13
12
11
16
15
VREF H2
VREF H4
VREF H3
VREF L1
V
REF
L2
VREF L4
V
REF L3
VOUT1
V
OUT
2
V
OUT
3
V
OUT
4
GND
CLK
CS
DI
DO
DVD
PROG
RDY/BSY
VREF H1
1
2
3
4
5
6
7
10
9
8
20
19
18
17
14
13
12
11
16
15
VREF H2
VREF H4
VREF H3
VREF L1
V
REF
L2
VREF L4
V
REF L3
VOUT1
V
OUT
2
V
OUT
3
V
OUT
4
CAT525
Configured Digitally Programmable Potentiometer (DPPTM): Programmable Voltage Applications
FEATURES
s
Four 8-bit DPPs configured as programmable
voltage sources in DAC-like applications
s
Independent reference inputs
s
Buffered wiper outputs
s
Non-volatile NVRAM memory wiper storage
s
Output voltage range includes both supply rails
s
4 independently addressable buffered
output wipers
s
1 LSB accuracy, high resolution
s
Serial
µ
P interface
s
Single supply operation: 2.7V-5.5V
s
Setting read-back without effecting outputs
APPLICATIONS
s
Automated product calibration
s
Remote control adjustment of equipment
s
Offset, gain and zero adjustments in
self-calibrating and adaptive control systems
s
Tamper-proof calibrations
s
DAC (with memory) substitute
DESCRIPTION
The CAT525 is a quad 8-Bit digitally programmable
potentiometer (DPPTM) configured for programmable
voltage and DAC-like applications. Intended for final
calibration of products such as camcorders, fax ma-
chines and cellular telephones on automated high vol-
ume production lines and systems capable of self cali-
bration, it is also well suited for applications were equip-
ment requiring periodic adjustment is either difficult to
access or located in a hazardous environment.
The CAT525 offers four independently programmable
DPPs each having its own reference inputs and each
capable of rail to rail output swing. The wipers are
buffered by rail to rail op amps. Wiper settings, stored in
non-volatile NVRAM memory, are not lost when the
device is powered down and are automatically rein-
PIN CONFIGURATION
stated when power is returned. Each wiper can be
dithered to test new output values without effecting the
stored settings and stored settings can be read back
without disturbing the DPP's output.
Control of the CAT525 is accomplished with a simple 3
wire serial interface. A Chip Select pin allows several
CAT525's to share a common serial interface and
communications back to the host controller is via a single
serial data line thanks to the CAT525's Tri-Stated Data
Output pin. A RDY/
BSY
output working in concert with
an internal low voltage detector signals proper operation
of non-volatile NVRAM Memory Erase/Write cycle.
The CAT525 is available in the 0
°
C to 70
°
C commercial
and ­40
°
C to 85
°
C industrial operating temperature
ranges and offered in 20-pin plastic DIP and Surface
mount packages.
DIP Package (P)
SOIC Package (J)
© 2001 by Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
CAT525
CAT525
Doc. No. 25078-00 4/01-A M-1
FUNCTIONAL DIAGRAM
CAT525
CAT525
2
Doc. No. 25078-00 4/01 - A M-1
Symbol
Parameter
Conditions
Min
Typ
Max
Units
Resolution
8
--
--
Bits
Accuracy
INL
Integral Linearity Error
I
LOAD
= 10
µ
A T
R
= C
--
0.6
±
1
LSB
I
LOAD
= 10
µ
A T
R
= I
--
0.6
±
1
LSB
I
LOAD
= 40
µ
A T
R
= C
--
1.2
--
LSB
I
LOAD
= 40
µ
A T
R
= I
--
1.2
--
LSB
DNL
Differential Linearity Error
I
LOAD
= 10
µ
A T
R
= C
--
0.25
±
0.5
LSB
I
LOAD
= 10
µ
A T
R
= I
--
0.25
±
0.5
LSB
I
LOAD
= 40
µ
A T
R
= C
--
0.5
--
LSB
I
LOAD
= 40
µ
A T
R
= I
--
0.5
--
LSB
Logic Inputs
I
IH
Input Leakage Current
V
IN
= V
DD
--
--
10
µ
A
I
IL
Input Leakage Current
V
IN
= 0V
--
--
­10
µ
A
V
IH
High Level Input Voltage
2
--
V
DD
V
V
IL
Low Level Input Voltage
0
--
0.8
V
References
V
RH
V
REF
H Input Voltage Range
2.7
--
V
DD
V
V
RL
V
REF
L Input Voltage Range
GND
--
V
DD
-2.7
V
Z
IN
V
REF
H­V
REF
L Resistance
--
28
--
k
V
IN
/ R
IN
Input Resistance Match
--
±
0.5
±
1
%
Logic Outputs
V
OH
High Level Output Voltage
I
OH
= ­ 40
µ
A
V
DD
­0.3
--
--
V
V
OL
Low Level Output Voltage
I
OL
= 1 mA, V
DD
= +5V
--
--
0.4
V
I
OL
= 0.4 mA, V
DD
= +3V
--
--
0.4
V
ABSOLUTE MAXIMUM RATINGS
Supply Voltage*
V
DD
to GND ...................................... ­0.5V to +7V
Inputs
CLK to GND ............................ ­0.5V to V
DD
+0.5V
CS to GND .............................. ­0.5V to V
DD
+0.5V
DI to GND ............................... ­0.5V to V
DD
+0.5V
RDY/BSY to GND ................... ­0.5V to V
DD
+0.5V
PROG to GND ........................ ­0.5V to V
DD
+0.5V
V
REF
H to GND ........................ ­0.5V to V
DD
+0.5V
V
REF
L to GND ......................... ­0.5V to V
DD
+0.5V
Outputs
D
0
to GND ............................... ­0.5V to V
DD
+0.5V
V
OUT
1­ 4 to GND ................... ­0.5V to V
DD
+0.5V
Operating Ambient Temperature
Commercial (`C' or Blank suffix) ...... 0
°
C to +70
°
C
Industrial (`I' suffix) ...................... ­ 40
°
C to +85
°
C
Junction Temperature ..................................... +150
°
C
Storage Temperature ....................... ­65
°
C to +150
°
C
Lead Soldering (10 sec max) .......................... +300
°
C
* Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. Absolute
Maximum Ratings are limited values applied individually while
other parameters are within specified operating conditions,
and functional operation at any of these conditions is NOT
implied. Device performance and reliability may be impaired by
exposure to absolute rating conditions for extended periods of
time.
DC ELECTRICAL CHARACTERISTICS:
V
DD
= +2.7V to +5.5V, V
REF
H = V
DD
, V
REF
L = 0V, unless otherwise specified
RELIABILITY CHARACTERISTICS
Symbol
Parameter
Min
Max
Units
Test Method
V
ZAP
(1)
ESD Susceptibility
2000
Volts
MIL-STD-883, Test Method 3015
I
LTH
(1)(2)
Latch-Up
100
mA
JEDEC Standard 17
NOTES: 1. This parameter is tested initially and after a design or process change that affects the parameter.
2. Latch-up protection is provided for stresses up to 100mA on address and data pins from ­1V to V
CC
+ 1V.
CAT525
3
Doc. No. 25078-00 4/01 - A M-1
DC ELECTRICAL CHARACTERISTICS (Cont.):
V
DD
= +2.7V to +5.5V, V
REF
H = V
DD
, V
REF
L = 0V
, unless otherwise specified
Symbol
Parameter
Conditions
Min
Typ
Max
Units
Symbol
Parameter
Conditions
Min
Typ
Max
Units
Digital
t
CSMIN
Minimum CS Low Time
150
--
--
ns
t
CSS
CS Setup Time
100
--
--
ns
t
CSH
CS Hold Time
0
--
--
ns
t
DIS
DI Setup Time
50
--
--
ns
t
DIH
DI Hold Time
50
--
--
ns
t
DO1
Output Delay to 1
--
--
150
ns
t
DO0
Output Delay to 0
--
--
150
ns
t
HZ
Output Delay to High-Z
--
400
--
ns
t
LZ
Output Delay to Low-Z
--
400
--
ns
t
BUSY
Erase/Write Cycle Time
--
4
5
ms
t
PS
PROG Setup Time
150
--
--
ns
t
PROG
Minimum Pulse Width
700
--
--
ns
t
CLK
H
Minimum CLK High Time
500
--
--
ns
t
CLK
L
Minimum CLK Low Time
300
--
--
ns
f
C
Clock Frequency
DC
--
1
MHz
Analog
t
DS
DAC Settling Time to 1 LSB
C
LOAD
= 10 pF, V
DD
= +5V
--
3
10
µ
s
C
LOAD
= 10 pF, V
DD
= +3V
--
6
10
µ
s
Pin Capacitance
C
IN
Input Capacitance
V
IN
= 0V, f = 1 MHz
(2)
--
8
--
pF
C
OUT
Output Capacitance
V
OUT
= 0V, f = 1 MHz
(2)
--
6
--
pF
NOTES: 1. All timing measurements are defined at the point of signal crossing V
DD
/ 2.
2. These parameters are periodically sampled and are not 100% tested.
C
L
= 100 pF,
see note 1
AC ELECTRICAL CHARACTERISTICS:
V
DD
= +2.7V to +5.5V, V
REF
H = V
DD
, V
REF
L = 0V
, unless otherwise specified
Analog Output
FSO
Full-Scale Output Voltage
V
R
= V
REF
H ­ V
REF
L
0.99 V
R
0.995 V
R
--
V
ZSO
Zero-Scale Output Voltage
V
R
= V
REF
H ­ V
REF
L
--
0.005 V
R
0.01 V
R
V
I
L
DAC Output Load Current
--
--
1
µ
A
R
OUT
DAC Output Impedance
V
DD
= V
REF
H = +5V
--
--
1
k
V
DD
= V
REF
H = +3V
--
--
1
k
PSSR
Power Supply Rejection
I
LOAD
= 1
µ
A
--
--
1
LSB / V
Temperature
TC
O
V
OUT
Temperature Coefficient
V
DD
= +5V, I
LOAD
= 250nA
--
--
200
µ
V/
°
C
V
REF
H= +5V, V
REF
L = 0V
TC
REF
Temperature Coefficient of
V
REF
H to V
REF
L
--
700
--
ppm /
°
C
V
REF
Resistance
Power Supply
I
DD1
Supply Current (Read)
Normal Operating
--
400
600
µ
A
I
DD2
Supply Current (Write)
Programming, V
DD
= 5V
--
1600
2500
µ
A
V
DD
= 3V
--
1000
1600
µ
A
V
DD
Operating Voltage Range
2.7
--
5.5
V
CAT525
4
Doc. No. 25078-00 4/01 - A M-1
A. C. TIMING DIAGRAM
t
o
1 2 3 4 5
CLK
CS
DI
DO
PR
OG
t H CLK
Rising CLK edge to f
alling CLK edge
t L CLK
F
alling CLK edge to CLK r
ising edge
t CSH
F
alling CLK edge f
or last data bit (DI)
to f
alling CS edge
t CSS
Rising CS edge to ne
xt r
ising CLK edge
t CSMIN
F
alling CS edge to r
ising CS edge
t DIS
Data v
alid to first r
ising CLK
edge after CS = high
t DIH
Rising CLK edge to end of data v
alid
t DO0
Rising CLK edge to D0 = lo
w
t LZ
Rising CS edge to D0 becoming high
lo
w impedance (activ
e output)
t DO1
Rising CLK edge to D0 = high
t HZ
F
alling CS edge to D0 becoming high
impedance (T
r
i-State)
Rising PR
OG edge to ne
xt r
ising
CLK edge
F
alling CLK edge after PR
OG=H
to
r
ising RD
Y/
BSY
edge
t H CLK
t L CLK
t CSH
t CSS
t CSMIN
t DIS
t DIH
t DO0
t LZ
t DO1
t HZ
TIMING
FR
OM
T
O
MIN/MAX
Min
Min
Min
Min
Min
Min
Min
Max
(Max)
Max
(Max)
Min
Min
P
ARAM
NAME
RD
Y/BSY
t B
USY
Rising PR
OG edge to f
alling
PR
OG edge
t PS
t PR
OG
t PR
OG
Max
t PS
t
o
1 2 3 4 5
t B
USY
CAT525
5
Doc. No. 25078-00 4/01 - A M-1
PIN DESCRIPTION
Pin
Name
Function
1
V
REF
H2
Maximum DAC 2 output voltage
2
V
REF
H1
Maximum DAC 1 output voltage
3
V
DD
Power supply positive
4
CLK
Clock input pin
5
RDY/
BSY
Ready/Busy output
6
CS
Chip select
7
DI
Serial data input pin
8
DO
Serial data output pin
9
PROG
EEPROM Programming Enable
Input
10
GND
Power supply ground
11
V
REF
L1
Minimum DAC 1 output voltage
12
V
REF
L2
Minimum DAC 2 output voltage
13
V
REF
L3
Minimum DAC 3 output voltage
14
V
REF
L4
Minimum DAC 4 output voltage
15
V
OUT
4
DAC 4 output
16
V
OUT
3
DAC 3 output
17
V
OUT
2
DAC 2 output
18
V
OUT
1
DAC 1 output
19
V
REF
H4
Maximum DAC 4 output voltage
20
V
REF
H3
Maximum DAC 3 output voltage
DEVICE OPERATION
The CAT525 is a quad 8-bit Digital to Analog Converter
(DAC) whose outputs can be programmed to any one of
256 individual voltage steps. Once programmed, these
output settings are retained in non-volatile EEPROM
memory and will not be lost when power is removed from
the chip. Upon power up the DACs return to the settings
stored in EEPROM memory. Each DAC can be written
to and read from independently without effecting the
output voltage during the read or write cycle. Each
output can also be adjusted without altering the stored
output setting, which is useful for testing new output
settings before storing them in memory.
DIGITAL INTERFACE
The CAT525 employs a standard 3 wire serial control
interface consisting of Clock (CLK), Chip Select (CS)
and Data In (DI) inputs. For all operations, address and
data are shifted in LSB first. In addition, all digital data
must be preceded by a logic "1" as a start bit. The DAC
address and data are clocked into the DI pin on the
clock's rising edge. When sending multiple blocks of
information a minimum of two clock cycles is required
between the last block sent and the next start bit.
Multiple devices may share a common input data line by
selectively activating the CS control of the desired IC.
Data Outputs (DO) can also share a common line
because the DO pin is Tri-Stated and returns to a high
impedance when not in use.
CHIP SELECT
Chip Select (CS) enables and disables the CAT525's
read and write operations. When CS is high data may be
read to or from the chip, and the Data Output (DO) pin is
active. Data loaded into the DAC control registers will
remain in effect until CS goes low. Bringing CS to a logic
low returns all DAC outputs to the settings stored in
EEPROM memory and switches DO to its high imped-
ance Tri-State mode.
Because CS functions like a reset the CS pin has been
desensitized with a 30 ns to 90 ns filter circuit to prevent
noise spikes from causing unwanted resets and the loss
of volatile data.
CLOCK
The CAT525's clock controls both data flow in and out of
the IC and EEPROM memory cell programming. Serial
data is shifted into the DI pin and out of the DO pin on the
clock's rising edge. While it is not necessary for the clock
to be running between data transfers, the clock must be
operating in order to write to EEPROM memory, even
though the data being saved may already be resident in
the DAC control register.
No clock is necessary upon system power-up. The
CAT525's internal power-on reset circuitry loads data
from EEPROM to the DACs without using the external
clock.
DAC addressing is as follows:
DAC OUTPUT
A0
A1
V
OUT
1
0
0
V
OUT
2
1
0
V
OUT
3
0
1
V
OUT
4
1
1
CAT525
6
Doc. No. 25078-00 4/01 - A M-1
As data transfers are edge triggered clean clock transi-
tions are necessary to avoid falsely clocking data into the
control registers. Standard CMOS and TTL logic fami-
lies work well in this regard and it is recommended that
any mechanical switches used for breadboarding or
device evaluation purposes be debounced by a flip-flop
or other suitable debouncing circuit.
V
REF
V
REF
, the voltage applied between pins V
REF
H
&V
REF
L,
sets the DAC's Zero to Full Scale output range where
V
REF
L = Zero and V
REF
H
= Full Scale. V
REF
can span the
full power supply range or just a fraction of it. In typical
applications V
REF
H
&V
REF
L are connected across the
power supply rails. When using less than the full supply
voltage be mindfull of the limits placed on V
REF
H and
V
REF
L as specified in the References section of DC
Electrical Characteristics.
READY/
BUSY
BUSY
BUSY
BUSY
BUSY
When saving data to non-volatile EEPROM memory, the
Ready/Busy ouput (RDY/
BSY
) signals the start and
duration of the EEPROM erase/write cycle. Upon receiv-
ing a command to store data (PROG goes high) RDY/
BSY
goes low and remains low until the programming
cycle is complete. During this time the CAT525 will
ignore any data appearing at DI and no data will be
output on DO.
RDY/
BSY
is internally ANDed with a low voltage detec-
tor circuit monitoring V
DD.
If V
DD
is below the minimum
value required for EEPROM programming, RDY/
BSY
will remain high following the program command indicat-
ing a failure to record the desired data in non-volatile
memory.
DATA OUTPUT
Data is output serially by the CAT525, LSB first, via the
Data Out (DO) pin following the reception of a start bit
and two address bits by the Data Input (DI). DO
becomes active whenever CS goes high and resumes
its high impedance Tri-State mode when CS returns low.
Tri-Stating the DO pin allows several 525s to share a
single serial data line and simplifies interfacing multiple
525s to a microprocessor.
WRITING TO MEMORY
Programming the CAT525's EEPROM memory is ac-
complished through the control signals: Chip Select
(CS) and Program (PROG). With CS high, a start bit
followed by a two bit DAC address and eight data bits are
clocked into the DAC control register via the DI pin. Data
enters on the clock's rising edge. The DAC output
changes to its new setting on the clock cycle following
D7, the last data bit.
Programming is accomplished by bringing PROG high
sometime after the start bit and at least 150 ns prior to the
rising edge of the clock cycle immediately following the
D7 bit. Two clock cycles after the D7 bit the DAC control
register will be ready to receive the next set of address
and data bits. The clock must be kept running through-
out the programming cycle. Internal control circuitry
takes care of generating and ramping up the program-
ming voltage for data transfer to the EEPROM cells. The
CAT525's EEPROM memory cells will endure over
100,000 write cycles and will retain data for a minimum
of 20 years without being refreshed.
READING DATA
Each time data is transferred into a DAC control register
currently held data is shifted out via the D0 pin, thus in
every data transaction a read cycle occurs. Note,
however, that the reading process is destructive. Data
must be removed from the register in order to be read.
Figure 2 depicts a Read Only cycle in which no change
occurs in the DAC's output. This feature allows
µ
Ps to
poll DACs for their current setting without disturbing the
output voltage but it assumes that the setting being read
is also stored in EEPROM so that it can be restored at the
end of the read cycle. In Figure 2 CS returns low before
the 13
th
clock cycle completes. In doing so the EEPROM's
Figure 1. Writing to Memory
Figure 2. Reading from Memory
A0
A1
1
DO
DI
CS
PROG
DAC
OUTPUT
t 1 2 3 4 5 6 7 8 9 10 11 12
o
CURRENT
DAC VALUE
NON-VOLATILE
D0
D1
D2
D3
D4
D5
D6
D7
CURRENT DAC DATA
RDY/BSY
D0
D1
D2
D3
D4
D5
D6
D7
A0
A1
D0
D1
D2
D3
D4
D5
D6
D7
1
NEW DAC DATA
CURRENT DAC DATA
CURRENT
DAC VALUE
NON-VOLATILE
DAC
OUTPUT
PROG
DO
DI
CS
NEW
DAC VALUE
VOLATILE
NEW
DAC VALUE
NON-VOLATILE
t 1 2 3 4 5 6 7 8 9 10 11 12 N N+1 N+2
o
RDY/BSY
CAT525
7
Doc. No. 25078-00 4/01 - A M-1
MSB LSB
1111 1111 ---- (.98 V ) + .01 V = .990 V V = +4.90V
1000 0000 ---- (.98 V ) + .01 V = .502 V V = +0.02V
0111 1111 ---- (.98 V ) + .01 V = .498 V V = -0.02V
0000 0001 ---- (.98 V ) + .01 V = .014 V V = -4.86V
0000 0000 ---- (.98 V ) + .01 V = .010 V V = -4.90V
REF REF REF
I
F
V = 5V
REF
255
255
OUT
DAC INPUT DAC OUTPUT ANALOG
R = R
OUTPUT
REF REF REF
OUT
128
255
127
255
REF REF REF
OUT
1
255
REF REF REF
OUT
REF REF REF
OUT
0
255
V = 0.99 V
FS REF
V = 0.01 V
ZERO
REF
V = ------ (V - V ) + V
DAC
CODE
255
FS
ZERO ZERO
Figure 3. Temporary Change in Output
D0
D1
D2
D3
D4
D5
D6
D7
A0
A1
D0
D1
D2
D3
D4
D5
D6
D7
1
NEW DAC DATA
CURRENT DAC DATA
DO
DI
CS
PROG
DAC
OUTPUT
t 1 2 3 4 5 6 7 8 9 10 11 12 N N+1 N+2
o
CURRENT
DAC VALUE
NON-VOLATILE
NEW
DAC VALUE
VOLATILE
CURRENT
DAC VALUE
NON-VOLATILE
RDY/BSY
setting is reloaded into the DAC control register. Since
this value is the same as that which had been there
previously no change in the DAC's output is noticed.
Had the value held in the control register been different
from that stored in EEPROM then
a change would occur
at the read cycle's conclusion.
TEMPORARILY CHANGE OUTPUT
The CAT525 allows temporary changes in DAC's output
to be made without disturbing the settings retained in
EEPROM memory. This feature is particularly useful
when testing for a new output setting and allows for user
adjustment of preset or default values without losing the
original factory settings.
Figure 3 shows the control and data signals needed to
effect a temporary output change. DAC settings may be
changed as many times as required and can be made to
any of the four DACs in any order or sequence. The
temporary setting(s) remain in effect long as CS remains
high. When CS returns low all four DACs will return to the
output values stored in EEPROM memory.
When it is desired to save a new setting acquired using
this feature, the new value must be reloaded into the
DAC control register prior to programming. This is be-
cause the CAT525's internal control circuitry discards
from the programming register the new data two clock
cycles after receiving it if no PROG signal is received.
Amplified DAC Output
APPLICATION CIRCUITS
Bipolar DAC Output
OPT 505
GND
VDD
V H
REF
V L
REF
CONTROL
& DATA
+
­
OP 07
V = ( ) -V
OUT
RF
R +
I
-15V
+15V
+5V
R
R
I
F
RI
I
RF
VDAC
For R =
I
RF
V = 2V -V
OUT
I
DAC
Vi
V
OUT
CAT525
OPT 505
GND
VDD
V H
REF
V L
REF
CONTROL
& DATA
+
­
OP 07
V
OUT
-15V
+15V
+5V
R
R
I
F
V = (1 + ­­­) V
OUT DAC
RF
RI
CAT525
CAT525
8
Doc. No. 25078-00 4/01 - A M-1
APPLICATION CIRCUITS (Cont.)
Coarse-Fine Offset Control by Averaging DPP Outputs
for Single Power Supply Systems
Coarse-Fine Offset Control by Averaging DPP Outputs
for Dual Power Supply Systems
OPT 505
LT 1029
I > 2 mA
V+
GND
VDD
V = 5.000V
REF
V H
REF
V L
REF
CONTROL
& DATA
OPT 505
GND
VDD
V H
REF
V L
REF
CONTROL
& DATA
+
­
15K
10 µF
5.1V
10K
4.02 K
1.00K
10 µF
35V
LM 324
1N5231B
MPT3055EL
28 - 32V
OUTPUT
0 - 25V
@ 1A
Digitally Trimmed Voltage Reference
Digitally Controlled Voltage Reference
CAT525
CAT525
+
­
FINE ADJUST
DPP
COARSE ADJUST
DPP
GND
V L
REF
V H
REF
VDD
RC
127RC
+V
+5V
VREF
R = ----------
C
256 1
µ
A
VREF
*
Fine adjust gives
±
1 LSB change in V
when V = ------
OFFSET
VREF
2
OFFSET
V OFFSET
+
­
FINE ADJUST
DPP
COARSE ADJUST
DPP
GND
V L
REF
V H
REF
VDD
RC
127RC
+V
+5V
+V
REF
-V
-V
REF
Ro
R = ----------------------
C
1
µ
A
OFFSET
VOFFSET
REF
(+V ) - (V )
R = ----------------------
o
1
µ
A
OFFSET
REF
(-V ) + (V )
+
+
CAT525
9
Doc. No. 25078-00 4/01 - A M-1
APPLICATION CIRCUITS (Cont.)
Staircase Window Comparator
Overlapping Window Comparator
CAT525
+
­
+
­
+
­
+
­
+
­
+
­
+
­
+
­
10K
+5V
WINDOW 2
10K
+5V
WINDOW 3
10K
+5V
WINDOW 4
10K
+5V
WINDOW 5
+
­
+
­
10K
+5V
WINDOW 1
GND
V L
REF
CS
DI
DO
PROG
CLK
VPP
VDD
V H
REF
V
REF
+5V
1.0
µ
F
LM 339
DPP 1
DPP 2
DPP 3
DPP 4
WINDOW 1
WINDOW 2
WINDOW 3
WINDOW 4
WINDOW 5
V
REF
V 1
OUT
V 2
OUT
V 3
OUT
V 4
OUT
GND
WINDOW STRUCTURE
OPT 505
V
IN
CAT525
+
­
+
­
+
­
10K
+5V
WINDOW 2
10K
+5V
WINDOW 3
+
­
+
­
10K
+5V
WINDOW 1
GND
V L
REF
CS
DI
DO
PROG
CLK
VPP
VDD
V H
REF
V
REF
+5V
1.0
µ
F
LM 339
DPP 1
DPP 2
DPP 3
DPP 4
WINDOW 1
WINDOW 2
V 1
OUT
V 2
OUT
V 3
OUT
V 4
OUT
GND
WINDOW STRUCTURE
V
IN
+
­
WINDOW 3
V H
REF
CAT525
10
Doc. No. 25078-00 4/01 - A M-1
GND
V L
REF
VDD
V H
REF
+5V
DPP1
+
­
OPT 505
CONTROL
& DATA
DPP2
+
­
5M
5M
39 1W
39 1W
5M
5M
3.9K
LM385-2.5
-15V
5
µ
A steps
I = 2 - 255 mA
SOURCE
1 mA steps
+
­
10K
10K
+15V
TIP 29
BS170P
BS170P
51K
APPLICATION CIRCUITS (Cont.)
Current Sink with 4 Decades of Resolution
Current Source with 4 Decades of Resolution
CAT525
CAT525
GND
V L
REF
VDD
V
REF
+5V
DPP1
+
­
CONTROL
& DATA
DPP2
+
­
10K
10K
39 1W
LM385-2.5
5
µ
A steps
I = 2 - 255 mA
SINK
2N7000
10K
10K
TIP 30
39 1W
5M
5M
3.9K
+
­
-15V
2N7000
+5V
+15V
4.7
µ
A
1 mA steps
2.2K
CAT525
11
Doc. No. 25078-00 4/01 - A M-1
ORDERING INFORMATION
Notes:
(1) The device used in the above example is a CAT525JI-TE13 (SOIC, Industrial Temperature, Tape & Reel)
Prefix
Device #
Suffix
525
J
Product
Number
Package
P: PDIP
J: SOIC
CAT
Optional
Company ID
I
Temperature Range
Blank = Commercial (0°C to 70°C)
I = Industrial (-40°C to 85°C)
-TE13
Tape & Reel
TE13: 2000/Reel
© 2001 Catalyst Semiconductor, Inc.
Publication No:
Revision:
Issue Date:
CAT525
12
Doc. No. 25078-00 4/01 - A M-1