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sn74abth182502a from www.ti.com
TI's SN74ABTH182502A is a Scan Test Devices With 18-Bit Universal Bus Transceivers. Find parameters, ordering and quality information.
The SN74ABTH18502A and SN74ABTH182502A are characterized for operation from –40°C to 85°C. ... SN74ABTH182502A (A port or TDO). 128 mA.
Part #: SN74ABTH182502A. Download. File Size: 832Kbytes. Page: 42 Pages. Description: SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVERS.
Bare Die Product Detail: SN74ABTH182502A · Green: This bare die is qualified for space applications or has space level qualification data, please ask for details ...
$20.50
SN74ABTH182502A. Operating Supply Voltage: 5 V. Minimum Operating Temperature: - 40 C. Maximum Operating Temperature: + 85 C. Package / Case: LQFP-64. Packaging ...
Scan Test Devices With 18Bit Universal Bus Transceivers. Documentation: SN74ABTH182502A Datasheet PDF (44 Pages). Package Outline Dimension on: P37 P39 P40.
RUIST SN74ABTH182502A Integrated Circuit Original And New Electronic Component Ic Chips ; Variations. Specification: 1. Standard ; Customizations. Customized ...
The only free public library that contains thousands of BSDL (Boundary Scan Description Language) models to use with BScan/JTAG tools ... This BSDL contains ...
Scan access to the test circuitry is accomplished via the 4-wire test access port (TAP) interface. In the normal mode, these devices are 18-bit universal bus ...
SN54ABTH18502A, SN54ABTH182502A, SN74ABTH18502A, SN74ABTH182502A SCAN TEST DEVICES WITH 18-BIT UNIVERSAL BUS TRANSCEIVER.