SN54BCT8374A data sheet, product information and support | TI.com
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The 'BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPETM testability integrated-circuit family.
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The 'BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPETM testability integrated-circuit family.
Part #: SN54BCT8374A. Download. File Size: 644Kbytes. Page: 28 Pages. Description: SCAN TEST DEVICES WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS.
description. The 'BCT8374A scan test devices with octal edge-triggered D-type flip-flops are members of the Texas Instruments SCOPE testability.
SN54BCT8374A datasheet - Scan Test Devices With Octal D-type ...
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SN54BCT8374A Scan Test Devices With Octal D-type Edge-triggered Flip ... Details, datasheet, quote on part number: SN54BCT8374A. Part, SN54BCT8374A.
Brand Name: Texas Instruments ; Description: SN54BCT8374A SCAN TEST DEVICES W ; Place of Origin: - ; Mounting Type: - ; Model Number: 5962-9172701QLA.
SN54BCT8374A SCAN TEST DEVICES W. Manufacturer: Texas Instruments. $55.81. Categories: Specialty Logic. 5962-9172701QLA quantity ﹣ ﹢. Add to cart. Add to cart.
Apr 15, 2024 · SN54BCT8374A SCAN TEST DEVICES W. Manufacturer: Texas Instruments. $75.24. Categories: Specialty Logic. 5962-9172701Q3A quantity ﹣ ﹢. Add to ...
The SN54BCT8374A is characterized for operation over the full military temperature range to 125°C. The SN74BCT8374A is characterized for operation from to 70°C.
This family of devices supports IEEE Standard 1149.1-1990 boundary scan to facilitate testing of complex circuit-board assemblies. Scan access to the test ...