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32-bit Single Chip Microcontroller. High-speed 32-bit RISC Core. Multiply Accumulation. 10-bit ADC. Built-in RAM. High-speed DMA, Intelligent DMA. Twin-clock Oscillator. DESCRIPTIONS. The S1C33221/222 is a CMOS 32-bit microcomputer composed of a CMOS 32-bit RISC core, ROM, RAM, DMA, timers, SIO, PLL and other circuits.
Part #: S1C33221. Download. File Size: 354Kbytes. Page: 2 Pages. Description: 32-bit Single Chip Microcontroller. Manufacturer: Epson Company.
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- S1C33221
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- External clock input characteristics
- BCLK clock output chracteristics
- DRAM access cycle common characteristics
- Input, Output and I/O port
- Input, output and I/O port timing
- 2.6.6.7 Oscillation Characteristics
- 5.3 Test Pattern Creation
- 7.1 Precautions on Mounting
- Reset Circuit
- Precautions for Visible Radiation (when bare chip is mounted)
No part of this material may be reproduced or duplicated in any form or by any means without the written permission of Seiko Epson. Seiko Epson reserves the right to make changes to this material without notice. Seiko Epson does not assume any liability of any kind arising out of any inaccuracies contained in this material or due to its application...
Note: These AC characteristics apply to input signals from outside the IC.
Note: These AC characteristic values are applied only when the high-speed oscillation circuit is used.
The #RAS and #CAS symbols in the stipulations for the DRAM interface in the following tables are to be interpreted as follows. #RAS refers to that signal any one of the chip enable signals (P_CEX signals) set up by the bus controller (BCU) to operate as a RAS signal for the DRAM. #CAS refers to the P_HCAS_X or the P_LCAS_X signal.
The tables in this section stipulate the AC characteristics of the P_Pxx and P_Kxx ports.
P_BCLK Kxx, Pxx (input: data read tINPS tINPH from the port) Pxx, Rxx (output) Kxx (K-port interrupt input) Valid input tOUTD tKINW
Oscillation characteristics change depending on conditions (board pattern, components used, etc.). Use the following characteristics as reference values. In particular, when a ceramic or crystal oscillator is used, use the oscillator manufacturer recommended values for constants such as capacitance and resistance.
When the logic design is complete, the next step is test pattern creation. Test patterns are not only used in simulation to verify operation of the circuit design, but are also used in product pre-shipment in-spection.
The following shows the precautions when designing the board and mounting the IC.
The power-on reset signal which is input to the P_RESETX pin changes depending on conditions (power rise time, components used, board pattern, etc.). Decide the time constant of the capacitor and resistor after enough tests have been completed with the application product. In order to prevent any occurrences of unnecessary resetting caused by noise...
Visible radiation causes semiconductor devices to change the electrical characteris-tics. It may cause this IC to malfunction. When developing products which use this IC, consider the following precautions to prevent malfunctions caused by visible radi-ation. Design the product and implement the IC on the board so that it is shielded from vis-ible ...
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S1C33221 S1C33222 S1C33240 Comparison table between new and previous number of development tools Development tools for the S1C33 Family Previous No. ICE33 EM33-4M PRC33001 POD33001 ICD33 DMT33004 DMT33004PD DMT33005 DMT33005PD DMT33006LV DMT33006PDLV DMT33007 DMT33007PD DMT33008LV DMT33008PDLV DMT332S08LV DMT332S08PDLV DMT33209LV DMT33209PDLV ...
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33207 ; Insertion of new or replacement of permanent pacemaker with transvenous electrode(s); ventricular $461 . 5223 $10,185: 33208 . Insertion of new or replacement of permanent pacemaker with transvenous
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33240 Insertion of implantable defibrillator pulse generator only; with existing single lead (Do not report 33240 in conjunction with 33271, 93260, 93261)
