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Part Number DAC5686

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FEATURES
APPLICATIONS
DESCRIPTION
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
16-BIT, 500-MSPS, 2
×
­16
×
INTERPOLATING DUAL-CHANNEL DIGITAL-TO-ANALOG
CONVERTER
·
On-Chip 1.2-V Reference
·
500 MSPS Maximum Update Rate DAC
·
1.8-V Digital and 3.3-V Analog Supplies
·
WCDMA ACPR
·
1.8-V/3.3-V CMOS Compatible Interface
­ 1 Carrier: 76 dB Centered at 30.72-MHz IF,
·
Power Dissipation: 950 mW at Full Maximum
245.76 MSPS
Operating Conditions
­ 1 Carrier: 73 dB Centered at 61.44-MHz IF,
·
Package: 100-Pin HTQFP
245.76 MSPS
­ 2 Carrier: 72 dB Centered at 30.72-MHz IF,
245.76 MSPS
·
Cellular Base Transceiver Station Transmit
Channel
­ 4 Carrier: 64 dB Centered at 92.16-MHz IF,
­ CDMA: W-CDMA, CDMA2000, IS-95
491.52 MSPS
­ TDMA: GSM, IS-136, EDGE/UWC-136
·
Selectable 2
×
, 4
×
, 8
×
, and 16
×
Interpolation
·
Baseband I and Q Transmit
­ Linear Phase
·
Input Interface: Quadrature Modulation for
­ 0.05-dB Pass-Band Ripple
Interfacing With Baseband Complex Mixing
­ 80-dB Stop-Band Attenuation
ASICs
­ Stop-Band Transition 0.4­0.6 f
DATA
·
Single-Sideband Up-Conversion
·
32-Bit Programmable NCO
·
Diversity Transmit
·
On-Chip 2
×
­16
×
PLL Clock Multiplier With
·
Cable Modem Termination System
Bypass Mode
·
Differential Scalable Current Outputs: 2 mA to
20 mA
The DAC5686 is a dual-channel 16-bit high-speed digital-to-analog converter (DAC) with integrated 2
×
, 4
×
, 8
×
,
and 16
×
interpolation filters, a numerically controlled oscillator (NCO), onboard clock multiplier, and on-chip
voltage reference. The DAC5686 has been specifically designed to allow for low input data rates between the
DAC and ASIC, or FPGA, and high output transmit intermediate frequencies (IF). Target applications include
high-speed digital data transmission in wired and wireless communication systems and high-frequency
direct-digital synthesis DDS.
The DAC5686 provides three modes of operation: dual-channel, single-sideband, and quadrature modulation. In
dual-channel mode, interpolation filtering increases the DAC update rate, which reduces sinx/x rolloff and
enables the use of relaxed analog post-filtering.
Single-sideband mode provides an alternative interface to the analog quadrature modulators. Channel carrier
selection is performed at baseband by mixing in the ASIC/FPGA. Baseband I and Q from the ASIC/FPGA are
input to the DAC5686, which in turn performs a complex mix resulting in Hilbert transform pairs at the outputs of
the DAC5686's two DACs. An external RF quadrature modulator then performs the final single-sideband
up-conversion. The DAC5686's complex mixing frequencies are flexibly chosen with the 32-bit programmable
NCO.
Unmatched gains and offsets at the RF quadrature modulator result in unwanted sideband and local oscillator
feedthrough. Each DAC in the DAC5686 has an 11-bit offset adjustment and 12-bit gain adjustment, which
compensate for quadrature modulator input imbalances, thus reducing RF filtering requirements.
Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas
Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet.
PowerPAD is a trademark of Texas Instruments.
All other trademarks are the property of their respective owners.
PRODUCTION DATA information is current as of publication date.
Copyright © 2003­2004, Texas Instruments Incorporated
Products conform to specifications per the terms of the Texas
Instruments standard warranty. Production processing does not
necessarily include testing of all parameters.
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DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
In quadrature modulation mode, on-chip mixing provides baseband-to-IF up-conversion. Mixing frequencies are
flexibly chosen with a 32-bit programmable NCO. Channel carrier selection is performed at baseband by complex
mixing in the ASIC/FPGA. Baseband I and Q from the ASIC/FPGA are input to the DAC5686, which interpolates
the low data-rate signal to higher data rates. The single DAC output from the DAC5686 is the final IF
single-sideband spectrum presented to RF.
The 2
×
, 4
×
, 8
×
, and 16
×
interpolation filters are implemented as a cascade of half-band 2
×
interpolation filters.
Unused filters for interpolation rates of less than 16
×
are shut off to reduce power consumption. The DAC5686
provides a full bypass mode, which enables the user to bypass all the interpolation and mixing.
The DAC5686 PLL clock multiplier controls all internal clocks for the digital filters and the DAC cores. The
differential clock input and internal clock circuitry provides for optimum jitter performance. Sine wave clock input
signal is supported. The PLL can be bypassed by an external clock running at the DAC core update rate. The
clock divider of the PLL ensures that the digital filters operate at the correct clock frequencies.
The DAC5686 operates with an analog supply voltage of 3.3 V and a digital supply voltage of 1.8 V. Digital I/Os
are 1.8-V and 3.3-V CMOS compatible. Power dissipation is 950 mW at maximum operating conditions. The
DAC5686 provides a nominal full-scale differential current output of 20 mA, supporting both single-ended and
differential applications. The output current can be directly fed to the load with no additional external output buffer
required. The device has been specifically designed for a differential transformer-coupled output with a 50-
doubly terminated load. For a 20-mA full-scale output current, both a 4:1 impedance ratio (resulting in an output
power of 4 dBm) and 1:1 impedance ratio transformer (­2-dBm output power) are supported.
The DAC5686 operational modes are configured by programming registers through a serial interface. The serial
interface can be configured to either a 3- or 4-pin interface allowing it to communicate with many
industry-standard microprocessors and microcontrollers. Data (I and Q) can be input to the DAC5686 as
separate parallel streams on two data buses, or as a single interleaved data stream on one data bus.
An accurate on-chip 1.2-V temperature-compensated band-gap reference and control amplifier allows the user to
adjust the full-scale output current from 20 mA down to 2 mA. This provides 20-dB gain range control
capabilities. Alternatively, an external reference voltage can be applied for maximum flexibility. The device
features a SLEEP mode, which reduces the standby power to approximately 10 mW, thereby minimizing the
system power consumption.
The DAC5686 is available in a 100-pin HTQFP package. The device is characterized for operation over the
industrial temperature range of ­40
°
C to 85
°
C.
ORDERING INFORMATION
T
A
PACKAGE DEVICES
100 HTQFP
(1)
(PZP) PowerPADTM Plastic Quad Flatpack
­40
°
C to 85
°
C
DAC5686IPZP
(1)
Thermal pad size: 6 mm
×
6 mm
2
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FUNCTIONAL BLOCK DIAGRAM
y
2
y
2
y
2
y
2
y
2
y
2
y
2
y
2
CLK1
CLK1C
LPF
PLLLOCK
CLKVDD
CLKGND
DVDD
DGND
PLLVDD
PLLGND
SLEEP
FIR1
FIR2
sin
IOVDD
IOGND
AVDD
AGND
PHSTR
NCO
cos
RESETB
100-Pin HTQFP
EXTIO
EXTLO
1.2 V
Reference
BIASJ
IOUTA1
IOUTA2
16-Bit
FIR5
IOUTB1
IOUTB2
FIR3
x
sin(x)
TxENABLE
DA[15:0]
DB[15:0]
DEMUX
FIR4
CLK2
CLK2C
SIF
SCLK
SDENB
SDO
SDIO
DAC
16-Bit
DAC
2 ­ 16
y
F
data
Internal Clock Generation
2
y
­ 16
y
PLL Clock Multiplier
x
sin(x)
F
data
A Gain
B Gain
A
Offset
B
Offset
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
Block Diagram of the DAC5686
3
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PIN ASSIGNMENTS FOR THE DAC5686
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
100
99
98
97
96
95
94
93
92
91
90
89
88
87
86
85
84
83
82
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
21
22
23
24
25
41
42
43
44
45
46
47
48
49
50
55
54
53
52
51
81
79
78
77
76
DAC5686
Top View 100 HTQFP
DVDD
DGND
QFLAG
TESTMODE
SLEEP
RESETB
PHSTR
DGND
DB15 (MSB)
DB14
DB13
DVDD
DGND
DB12
DB1
1
DB10
DB9
DB8
DVDD
DGND
IOVDD
IOGND
DB7
DB6
DB5
DVDD
DGND
SDENB
SCLK
SDIO
SDO
TxENABLE
DA15 (MSB)
DA14
DA13
DVDD
DGND
DA12
DA1
1
DA10
DA9
DA8
DVDD
DGND
IOVDD
IOGND
DA7
DA6
DA5
AVDD
AVDD
AVDD
AGND
IOUTA1
IOUTA2
AGND
AVDD
AGND
AVDD
EXTLO
AGND
BIASJ
AGND
EXTIO
AVDD
AGND
AVDD
AGND
IOUTB2
IOUTB1
AGND
AVDD
AVDD
AGND
80
DA4
DA3
DA2
DA1
DA0 (LSB)
DVDD
DGND
CLKGND
CLK1
CLK1C
CLKVDD
CLK2
CLK2C
CLKGND
PLLGND
LPF
PLLVDD
DVDD
DGND
PLLLOCK
DB0 (LSB)
DB1
DB2
DB3
DB4
DVDD
DEVICE INFORMATION
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
Terminal Functions
TERMINAL
I/O
DESCRIPTION
NAME
NO.
AGND
1, 4, 7, 9,
I
Analog ground return
12, 17, 19,
22, 25
AVDD
2, 3, 8, 10,
I
Analog supply voltage
14, 16, 18,
23, 24
4
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DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
DEVICE INFORMATION (continued)
Terminal Functions (continued)
TERMINAL
I/O
DESCRIPTION
NAME
NO.
BIASJ
13
I/O
Full-scale output current bias
CLK1
59
I
External clock input; data clock input
CLK1C
60
I
Complementary external clock input; data clock input
CLK2
62
I
External clock input; sample clock for the DAC (optional if PLL disabled)
CLK2C
63
I
Complementary external clock input; sample clock for the DAC (optional if PLL disabled)
CLKGND
58, 64
Ground return for internal clock buffer
CLKVDD
61
Internal clock buffer supply voltage
DA[15:0]
34­36,
I
A-channel data bits 0 through 15
39­43,
DA15 is most significant data bit (MSB).
48­55
DA0 is least significant data bit (LSB).
DB[0:15]
71­78,
I
B-channel data bits 0 through 15
83­87,
DB15 is most significant data bit (MSB).
90­92
DB0 is least significant data bit (LSB).
Note: The order of the B data bus can be reversed by register rev_bbus.
DGND
27, 38, 45,
Digital ground return
57, 69, 81,
88, 93, 99
DVDD
26, 32, 37,
Digital supply voltage
44, 56, 68,
82, 89, 100
EXTIO
11
I
Used as external reference input when internal reference is disabled (i.e., EXTLO connected to AVDD).
Used as internal reference output when EXTLO = AGND, requires a 0.1-
µ
F decoupling capacitor to
AGND when used as reference output
EXTLO
15
I
Internal reference ground. Connect to AVDD to disable the internal reference
IOUTA1
21
O
A-channel DAC current output. Full scale when all input bits are set to 1
IOUTA2
20
O
A-channel DAC complementary current output. Full scale when all input bits are set to 0
IOUTB1
5
O
B-channel DAC current output. Full scale when all input bits are set to 1
IOUTB2
6
O
B-channel DAC complementary current output. Full scale when all input bits are set to 0
IOGND
47, 79
Digital I/O ground return
IOVDD
46, 80
Digital I/O supply voltage
LPF
66
I/O
PLL loop filter connection. Can be left open or connected to GND if PLL is not used (PLLVDD = 0 V).
PHSTR
94
I
The PHSTR pin has two functions. When the sync_phstr register is 0, a high on the PHSTR pin resets
the NCO phase accumulator. When the sync_phstr register is 1, a PHSTR pin low-to-high transition
sets the divided clock phase in external clock mode, and a high on the PHSTR pin resets the NCO
phase accumulator.
PLLGND
65
Ground return for internal PLL
PLLVDD
67
PLL supply voltage. When PLLVDD is 0 V, the PLL is disabled.
PLLLOCK
70
O
PLL lock status bit. In PLL clock mode, PLLLOCK is high when PLL is locked to the input clock. In
external clock mode, PLLLOCK outputs the input rate clock.
QFLAG
98
O
Used in the interleaved data input mode: When the qflag register bit is 1, the QFLAG pin is used as an
output to identify the interleaved data sequence. QFLAG high identifies the data as channel B. Pin can
be left open when not used.
RESETB
95
I
Resets the chip when low
SCLK
29
I
Serial interface clock
SDENB
28
I
Active-low serial data enable, always an input to the DAC5686
SDIO
30
I/O
Bidirectional serial-port data in the three-pin serial interface mode. Input-only serial data in the four-pin
serial interface mode.
SDO
31
O
High-impedance state (the pin is not used) in the three-pin serial interface mode. Serial-port output data
in the four-pin serial interface mode.
SLEEP
96
I
Asynchronous hardware power-down input. Active high. Internal pulldown
TESTMODE
97
I
TESTMODE is DGND for the user.
5
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ABSOLUTE MAXIMUM RATINGS
ELECTRICAL CHARACTERISTICS (DC SPECIFICATIONS)
(1)
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
DEVICE INFORMATION (continued)
Terminal Functions (continued)
TERMINAL
I/O
DESCRIPTION
NAME
NO.
TxENABLE
33
I
TxENABLE is used in interleaved mode. The rising edge of TxENABLE synchronizes the data of
channels A and B. The first data after the rising edge of TxENABLE is treated as A data, while the next
data is treated as B data and so on. In any mode, TxENABLE being low sets DAC outputs to midscale.
Internal pulldown
over operating free-air temperature range (unless otherwise noted)
(1)
UNIT
AVDD
(2)
­0.5 V to 4 V
DVDD
(3)
­0.5 V to 2.3 V
Supply voltage range
CLKVDD
(2)
­0.5 V to 4 V
IOVDD
(2)
­0.5 V to 4 V
PLLVDD
(2)
­0.5 V to 4 V
Voltage between AGND, DGND, CLKGND, PLLGND, and IOGND
­0.5 V to 0.5 V
AVDD to DVDD
­0.5 V to 2.6 V
DA[15:0]
(3)
­0.5 V to IOVDD + 0.5 V
DB[15:0]
(3)
­0.5 V to IOVDD + 0.5 V
SLEEP
(3)
­0.5 V to IOVDD + 0.5 V
CLK1, CLK2, CLK1C, CLK2C
(3)
­0.5 V to CLKVDD + 0.5 V
Supply voltage range
RESETB
(3)
­0.5 V to IOVDD + 0.5 V
LPF
(3)
­0.5 V to PLLVDD + 0.5 V
IOUT1, IOUT2
(2)
­1 V to AVDD + 0.5 V
EXTIO, BIASJ
(2)
­0.5 V to AVDD + 0.5 V
EXTLO
(2)
­0.5 V to IOVDD + 0.5 V
Peak input current (any input)
±
20 mA
Operating free-air temperature range, T
A
: DAC5686I
­40
°
C to 85
°
C
Storage temperature range
­65
°
C to 150
°
C
Lead temperature 1,6 mm (1/16 inch) from the case for 10 seconds
260
°
C
(1)
Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings
only, and functional operation of the device at these or any other conditions beyond those indicated under "recommended operating
conditions" is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
(2)
Measured with respect to AGND
(3)
Measured with respect to DGND
over operating free-air temperature range, AVDD = 3.3 V, CLKVDD = 3.3 V, PLLVDD = 3.3 V, IOVDD = 3.3 V,
DVDD = 1.8 V, IOUT
FS
= 20 mA (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Resolution
16
DC Accuracy
(2)
INL
Integral nonlinearity
1 LSB = IOUT
FS
/216, T
MIN
to T
MAX
±
12
LSB
1.84e­4
IOUT
FS
DNL
Differential nonlinearity
±
9
LSB
1.37e­4
IOUT
FS
(1)
Specifications subject to change without notice.
(2)
Measured differential across IOUTA1 and IOUTA2 or IOUTB1 and IOUTB2 with 25
each to AVDD
6
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DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
ELECTRICAL CHARACTERISTICS (DC SPECIFICATIONS) (continued)
over operating free-air temperature range, AVDD = 3.3 V, CLKVDD = 3.3 V, PLLVDD = 3.3 V, IOVDD = 3.3 V,
DVDD = 1.8 V, IOUT
FS
= 20 mA (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Analog Output
Coarse gain linearity (INL)
LSB = 1/10
th
of full scale
±
0.016
LSB
Fine gain linearity (INL)
±
3
LSB
Offset error
Mid-code offset
0.003
%FSR
Without internal reference
0.7
Gain error
%FSR
With internal reference
0.7
Gain mismatch
With internal reference, dual DAC,
­2
2
%FSR
SSB mode
Full-scale output current
(3)
2
20
mA
Output compliance range
(4)
IOUT
FS
= 20 mA
AVDD ­ 0.5
AVDD + 0.5
V
Output resistance
300
k
Output capacitance
5
pF
Reference Output
Reference voltage
1.14
1.2
1.26
V
Reference output current
(5)
100
nA
Reference Input
V
EXTIO
Input voltage range
0.1
1.25
V
Input resistance
1
M
Small-signal bandwidth
2.5
kHz
Input capacitance
100
pF
Temperature Coefficients
ppm of
Offset drift
±
3
FSR/
°
C
Without internal reference
±
15
ppm of
Gain drift
FSR/
°
C
With internal reference
±
40
Reference voltage drift
±
25
ppm/
°
C
Power Supply
AVDD
Analog supply voltage
3
3.3
3.6
V
DVDD
Digital supply voltage
1.65
1.8
1.95
V
CLKVDD
Clock supply voltage
3
3.3
3.6
V
IOVDD
I/O supply voltage
1.65
3.6
V
PLLVDD
PLL supply voltage
3
3.3
3.6
V
Single (quad) DAC mode;
including output current through
30
load resistor, mode 7
I
AVDD
Analog supply current
mA
Dual DAC mode; including output
current through load resistor,
55
mode 11
I
DVDD
Digital supply current
242
mA
I
CLKVDD
Clock supply current
10
mA
f
DATA
= 125 MSPS, SSB mode,
F
update
= 500 MSPS, 40-MHz IF
I
PLLVDD
PLL supply current
28
mA
I
IOVDD
IO supply current
< 3
mA
(3)
Nominal full-scale current, IOUT
FS
, equals 16
×
the IBIAS current.
(4)
The upper limit of the output compliance is determined by the CMOS process. Exceeding this limit may result in transistor breakdown,
resulting in reduced reliability of the DAC5686 device. The lower limit of the output compliance is determined by the load resistors and
full-scale output current. Exceeding the upper limit adversely affects distortion performance and integral nonlinearity.
(5)
Use an external buffer amplifier with high-impedance input to drive any external load.
7
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ELECTRICAL CHARACTERISTICS (AC SPECIFICATIONS)
(1)
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
ELECTRICAL CHARACTERISTICS (DC SPECIFICATIONS) (continued)
over operating free-air temperature range, AVDD = 3.3 V, CLKVDD = 3.3 V, PLLVDD = 3.3 V, IOVDD = 3.3 V,
DVDD = 1.8 V, IOUT
FS
= 20 mA (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
I
AVDD
Sleep mode, AVDD supply current
1
mA
I
DVDD
Sleep mode, DVDD supply current
4
mA
I
CLKVDD
Sleep mode, CLKVDD supply
2
mA
current
Sleep mode
I
PLLVDD
Sleep mode, PLLVDD supply
0.5
mA
current
I
IOVDD
Sleep mode, IOVDD supply current
0.25
mA
Mode 1
(6)
AVDD = 3.3 V,
215
DVDD = 1.8 V
Mode 2
(7)
AVDD = 3.3 V,
495
DVDD = 1.8 V
Mode 5
(8)
AVDD = 3.3 V,
445
DVDD = 1.8 V
P
D
Power dissipation
mW
Mode 7
(9)
AVDD = 3.3 V,
754
DVDD = 1.8 V
Mode 9
(10)
AVDD = 3.3 V,
547
DVDD = 1.8 V
Mode 11
(11)
AVDD = 3.3 V,
855
950
DVDD = 1.8 V
APSRR
Power supply rejection ratio
­0.2
0.2
%FSR/V
DPSRR
Power supply rejection ratio
­0.2
0.2
%FSR/V
(6)
Mode 1: Dual DAC mode, fully bypassed, F
DAC
= 160 MSPS, f
OUT
= 20 MHz
(7)
Mode 2: Dual DAC mode, 2
×
interpolation, F
DAC
= 320 MSPS, f
OUT
= 20 MHz
(8)
Mode 5: Quadrature modulation mode, 4
×
interpolation, fs/4 mixing, F
DAC
= 320 MSPS, f
OUT
= 100 MHz
(9)
Mode 7: Quadrature modulation mode, 4
×
interpolation, NCO running at 320 MHz, F
DAC
= 320 MSPS, f
OUT
= 100 MHz
(10) Mode 9: SSB modulation mode, 4
×
interpolation, fs/4 mixing, F
DAC
= 320 MSPS, f
OUT
= 100 MHz
(11) Mode 11: SSB modulation mode, 4
×
interpolation, NCO running at 320 MHz, f
OUT
= 100 MHz, maximum operating condition
over operating free-air temperature range, AVDD = 3.3 V, CLKVDD = 3.3 V, PLLVDD = 0 V, IOVDD = 3.3 V, DVDD = 1.8 V,
IOUT
FS
= 20 mA, external clock mode, differential transformer-coupled output, 50-
doubly terminated load (unless otherwise
noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
Analog Output
f
CLK
Maximum output update rate
500
MSPS
t
s(DAC)
Output settling time to 0.1%
Mid-scale transition
12
ns
t
pd
Output propagation delay
2.5
ns
t
r(IOUT)
(2)
Output rise time 10% to 90%
2.5
ns
t
f(IOUT)
(2)
Output fall time 90% to 10%
2.5
ns
AC Performance--1:1 Impedance-Ratio Transformer
First Nyquist zone < f
DATA
/2, 4
×
interpolation, dual DAC mode,
89
f
DATA
= 52 MSPS, f
OUT
= 14 MHz, T
A
= 25
°
C
First Nyquist zone < f
DATA
/2, 4
×
interpolation, dual DAC mode,
f
DATA
= 160 MSPS, f
OUT
= 20 MHz, full bypass,T
A
= T
MIN
to
68
79
T
MAX
for MIN, 25
°
C for TYP, IOVDD = 1.8 V for TYP
SFDR
Spurious free dynamic range
dBc
2
×
interpolation, dual DAC mode, f
DATA
= 160 MSPS, f
OUT
=
72
41 MHz, T
A
= 25
°
C, IOVDD = 1.8 V
2
×
interpolation, dual DAC mode, f
DATA
= 160 MSPS, f
OUT
=
68
61 MHz, T
A
= 25
°
C, IOVDD = 1.8 V
(1)
Specifications subject to change without notice
(2)
Measured single-ended into 50-
load
8
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ELECTRICAL CHARACTERISTICS (DIGITAL SPECIFICATIONS)
(1)
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
ELECTRICAL CHARACTERISTICS (AC SPECIFICATIONS) (continued)
over operating free-air temperature range, AVDD = 3.3 V, CLKVDD = 3.3 V, PLLVDD = 0 V, IOVDD = 3.3 V, DVDD = 1.8 V,
IOUT
FS
= 20 mA, external clock mode, differential transformer-coupled output, 50-
doubly terminated load (unless otherwise
noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
First Nyquist zone < f
DATA
/2, f
DATA
= 100 MSPS,
80
f
OUT
= 5 MHz, IOVDD = 1.8 V, f
DAC
= 400 MSPS
SNR
Signal-to-noise ratio
dB
First Nyquist zone < f
DATA
/2, f
DATA
= 78 MSPS,
f
OUT
= 15.6 MHz, 15.8 MHz, 16.2 MHz, 16.4 MHz,
72
IOVDD = 1.8 V, f
DAC
= 314 MSPS
Single carrier W-CDMA with 3.84-MHz BW, 5-MHz spacing,
centered at IF, TESTMODEL 1, 10 ms, f
DATA
= 122.88 MSPS,
72
baseband, dual DAC, 2
×
interpolation,
f
OUT
= 245 MSPS
Single carrier W-CDMA with 3.84-MHz BW, 5-MHz spacing,
centered at IF, TESTMODEL 1, 10 ms, f
DATA
= 76.8 MSPS, IF
77
= 19.2 MHz, dual DAC, 2
×
interpolation,
f
OUT
= 153.6 MSPS
Single carrier W-CDMA with 3.84-MHz BW, 5-MHz spacing,
centered at IF, TESTMODEL 1, 10 ms, f
DATA
= 122.88 MSPS,
76
IF = 30.72 MHz, dual DAC, 2
×
interpolation, f
DAC
= 245 MSPS
ACLR
Adjacent channel power ratio
dB
Single carrier W-CDMA with 3.84-MHz BW, 5-MHz spacing,
centered at IF, TESTMODEL 1, 10 ms, f
DATA
= 61.44 MSPS,
73
IF = 61.44 MHz, quad mode, fs/4, 4
×
interpolation, f
DAC
= 245 MSPS
Two-carrier W-CDMA with 3.84-MHz BW, 5-MHz spacing,
centered at IF, TESTMODEL 1, 10 ms, f
DATA
= 122.88 MSPS,
72
IF = 30.72 MHz, dual DAC, 2
×
interpolation, f
DAC
= 245 MSPS
Four-carrier W-CDMA with 3.84-MHz BW, 5-MHz spacing,
centered at IF, TESTMODEL 1, 10 ms, f
DATA
= 121.88 MSPS,
64
complex IF - 30.72 MHz, quad mode, fs/4, 4
×
interpolation, IF
= 92.16 MHz
f
DATA
= 160 MSPS, f
OUT
= 60.1 and 61.1 MHz, 2
×
interp-
olation,
74
320 MSPS, IOVDD = 1.8 V, each tone at ­6 dBFS
Third-order two-tone
IMD3
dBc
intermodulation
f
DATA
= 100 MSPS, f
OUT
= 15.1 and 16.1 MHz, 2
×
interp-
olation,
84
200 MSPS, IOVDD = 1.8 V, each tone at ­6 dBFS
f
DATA
= 100 MSPS, f
OUT
= 15.6 MHz, 15.8 MHz, 16.2 MHz,
IMD
Four-tone intermodulation
16.4 MHz, 4
×
interpolation, 400 MSPS, IOVDD = 1.8 V, each
85
dBc
tone at ­12 dBFS
over operating free-air temperature range, AVDD = 3.3 V, CLKVDD = 3.3 V, PLLVDD = 3.3 V, IOVDD = 3.3 V, DVDD = 1.8
V, IOUT
FS
= 20 mA (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
CMOS Interface
V
IH
High-level input voltage
2
3
V
V
IL
Low-level input voltage
0
0
0.8
V
I
IH
High-level input current
­40
40
µA
I
IL
Low-level input current
­40
40
µA
Input capacitance
5
pF
I
L
= ­100 µA
IOVDD ­ 0.2
High-level output voltage,
V
OH
V
PLLLOCK, SDO, SDIO (I/O)
I
L
= ­8 mA
0.8
×
IOVDD
(1)
Specifications subject to change without notice.
9
www.ti.com
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
ELECTRICAL CHARACTERISTICS (DIGITAL SPECIFICATIONS) (continued)
over operating free-air temperature range, AVDD = 3.3 V, CLKVDD = 3.3 V, PLLVDD = 3.3 V, IOVDD = 3.3 V, DVDD = 1.8
V, IOUT
FS
= 20 mA (unless otherwise noted)
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNIT
I
L
= 100 µA
0.2
Low-level output voltage,
V
OL
V
PLLLOCK, SDO, SDIO (I/O)
I
L
= 8 mA
0.22
×
IOVDD
PLL
Input data rate supported
1
160
MSPS
At 600-kHz offset, measured at
DAC output, 25-MHz 0-dBFS tone,
128
f
DATA
= 125 MSPS, 4
×
interpolation
Phase noise
dBc/Hz
At 6-MHz offset, measured at DAC
output, 25-MHz 0-dBFS tone, f
DATA
151
= 125 MSPS, 4
×
interpolation
VCO minimum frequency
PLL_rng = 00 (nominal)
120
MHz
VCO maximum frequency
PLL_rng = 00 (nominal)
500
MHz
NCO
NCO clock (DAC update rate)
320
MHz
Serial Port Timing
Setup time, SDENB to rising edge
t
su(SDENB)
20
ns
of SCLK
Setup time, SDIO valid to rising
t
su(SDIO)
10
ns
edge of SCLK
Hold time, SDIO valid to rising
t
h(SDIO)
5
ns
edge of SCLK
t
SCLK
Period of SCLK
100
ns
t
SCLKH
High time of SCLK
40
ns
t
SCLKL
Low time of SCLK
40
ns
Data output delay after falling
t
d(Data)
10
ns
edge of SCLK
Parallel Data Input Timing (PLL Mode, CLK1 Input)
Setup time, data valid to rising
t
su(DATA)
0.3
­0.4
ns
edge of CLK1
Hold time, data valid after rising
t
h(DATA)
1.2
0.6
ns
edge of CLK1
Parallel Data Input Timing (Dual Clock Mode, CLK1 and CLK2 Input)
Setup time, data valid to rising
t
su(DATA)
­0.4
ns
edge of CLK1
Hold time, data valid after rising
t
h(DATA)
0.6
ns
edge of CLK1
Timing Parallel Data Input (External Clock Mode, CLK2 Input)
High-impedance load on PLLLOCK.
Setup time, DATA valid to rising
t
su(DATA)
Note that t
su
increases with a
4.6
3
ns
edge of PLLLOCK
lower-impedance load.
High-impedance load on PLLLOCK.
Hold time, DATA valid after rising
Note that t
h
decreases (becomes
t
h(DATA)
­0.8
­2.4
ns
edge of PLLLOCK
more negative) with a
lower-impedance load.
High-impedance load on PLLLOCK.
Delay from CLK2 rising edge to
Note that PLLLOCK delay in-
t
d(PLLLock)
2.5
4.2
6.5
ns
PLLLOCK rising edge
creases with a lower-impedance
load.
10
www.ti.com
TYPICAL CHARACTERISTICS
-10
-8
-6
-4
-2
0
2
4
6
8
10
0
10000
20000
30000
40000
50000
60000
70000
Input Code
INL ­ Integral Nonlinearity Error ­ LSB
-1
1
3
5
7
9
11
13
15
0
10000
20000
30000
40000
50000
60000
70000
Input Code
DNL ­ Differential Nonlinearity Error ­ LSB
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
INTEGRAL NONLINEARITY
vs
INPUT CODE
Figure 1.
DIFFERENTIAL NONLINEARITY
vs
INPUT CODE
Figure 2.
11
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f ­ Frequency ­ MHz
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
10
0
50
100
150
200
250
f
data
= 125 MSPS
f
IN
= 20 MHz
Dual DAC Mode
4
y
Interpolation
Power ­ dBm
50
55
60
65
70
75
80
85
90
10
15
20
25
30
35
40
45
50
f
O
­ Output Frequency ­ MHz
f
data
= 125 MSPS
Dual DAC Mode
4
y
Interpolation
In-band = 0­62.5 MHz
SFDR ­ In-Band Spurious-Free Dynamic Range ­ dBc
0 dBf
S
­12 dBf
S
­6 dBf
S
f
O
­ Output Frequency ­ MHz
40
45
50
55
60
65
70
75
80
10
15
20
25
30
35
40
45
50
f
data
= 125 MSPS
Dual DAC Mode
4
y
Interpolation
Out-of-Band = 62.5 MHz­250 MHz
SFDR ­ Out-of-Band Spurious-Free Dynamic Range ­ dBc
0 dBf
S
­12 dBf
S
­6 dBf
S
f ­ Frequency ­ MHz
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
10
0
25
50
75
100
125
150
f
data
= 75 MSPS
f
IN
= None
NCO On
f
OUT
= 100 MHz
Quad Mode
4
y
Interpolation
Power ­ dBm
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
TYPICAL CHARACTERISTICS (continued)
IN-BAND SPURIOUS-FREE DYNAMIC RANGE
vs
SINGLE-TONE SPECTRUM
OUTPUT FREQUENCY
Figure 3.
Figure 4.
OUT-OF-BAND SPURIOUS-FREE DYNAMIC RANGE
vs
OUTPUT FREQUENCY
SINGLE-TONE SPECTRUM
Figure 5.
Figure 6.
12
www.ti.com
f
O
­ Output Frequency ­ MHz
65
70
75
80
85
90
95
10
15
20
25
30
35
40
45
50
55
60
T
wo-T
one IMD3 ­ dBc
±
0.5 MHz
±
2 MHz
f
data
= 150 MSPS
Dual DAC Mode
2
y
Interpolation
f ­ Frequency ­ MHz
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
10
15
20
25
30
Power ­ dBm
f
data
= 150 MSPS
f
IN
1 = 19.5 MHz
f
IN
2 = 20.5 MHz
Dual DAC Mode
2
y
Interpolation
f
O
­ Output Frequency ­ MHz
55
60
65
70
75
80
85
90
10
30
50
70
90
110
130
150
f
data
= 80 MSPS
NCO On
Quad Mode
4
y
Interpolation
T
wo-T
one IMD3 ­ dBc
±
0.5 MHz
±
2 MHz
f ­ Frequency ­ MHz
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
60
65
70
75
80
f
data
= 80 MSPS
f
IN
1 = ­0.5 MHz
f
IN
2 = 0.5 MHz
NCO = 70 MHz
Quad Mode
4
y
Interpolation
Power ­ dBm
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
TYPICAL CHARACTERISTICS (continued)
TWO-TONE IMD3
vs
OUTPUT FREQUENCY
TWO-TONE IMD PERFORMANCE
Figure 7.
Figure 8.
TWO-TONE IMD3
vs
OUTPUT FREQUENCY
TWO-TONE IMD PERFORMANCE
Figure 9.
Figure 10.
13
www.ti.com
f ­ Frequency ­ MHz
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
0
140
145
150
155
160
f
data
= 80 MSPS
f
IN
1 = ­0.5 MHz
f
IN
2 = 0.5 MHz
NCO = 150 MHz
Quad Mode
4
y
Interpolation
Power ­ dBm
f ­ Frequency ­ MHz
-130
-120
-110
-100
-90
-80
-70
-60
-50
-40
-30
-20
18
22
26
30
34
38
42
Power ­ dBm
f
data
= 122.88 MSPS
f
IN
= 30.72 MHz
ACLR = 78.6 dB
4
y
Interpolation
Dual DAC Mode
f ­ Frequency ­ MHz
-130
-120
-110
-100
-90
-80
-70
-60
-50
-40
-30
-20
15
20
25
30
35
40
45
Power ­ dBm
f
data
= 122.88 MSPS
f
IN
= 30.72 MHz
ACLR = 71.69 dB
4
y
Interpolation
Dual DAC Mode
f ­ Frequency ­ MHz
-120
-110
-100
-90
-80
-70
-60
-50
-40
-30
-20
46
51
56
61
66
71
76
Power ­ dBm
f
data
= 122.88 MSPS
f
IN
= Baseband Complex
ACLR = 69.08 dB
2
y
Interpolation
Quad Mode
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
TYPICAL CHARACTERISTICS (continued)
TWO-TONE IMD PERFORMANCE
WCDMA TEST MODEL 1: SINGLE CARRIER
Figure 11.
Figure 12.
WCDMA TEST MODEL 1: DUAL CARRIER
WCDMA TEST MODEL 1: DUAL CARRIER
Figure 13.
Figure 14.
14
www.ti.com
f ­ Frequency ­ MHz
-110
-100
-90
-80
-70
-60
-50
-40
-30
-20
-10
72
77
82
87
92
97
102
107
112
Power ­ dBm
f
data
= 122.88 MSPS
f
IN
= ­30.72 MHz Complex
ACLR = 63.29 dB
4
y
Interpolation
Quad Mode
f ­ Frequency ­ MHz
-110
-90
-70
-50
-30
-10
138
143
148
153
158
163
168
Power ­ dBm
f
data
= 122.88 MSPS
f
IN
= 30.72 MHz Complex
ACLR = 58.58 dB
4
y
Interpolation
Quad Mode
f
VCO
­ VCO Frequency ­ MHz
0
100
200
300
400
500
600
0
100
200
300
400
500
600
700
G
V
C
O
­ VCO Gain ­ MHz/V
Boost for 45%
Boost for 15%
Boost for 30%
Boost for 0%
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
TYPICAL CHARACTERISTICS (continued)
WCDMA TEST MODEL 1: FOUR CARRIER
WCDMA TEST MODEL 1: DUAL CARRIER
Figure 15.
Figure 16.
VCO GAIN
vs
VCO FREQUENCY
Figure 17.
15
www.ti.com
DETAILED DESCRIPTION
Dual-Channel Mode
FIR1
FIR2
FIR3
FIR4
IOUTB1
IOUTB2
IOUTA1
IOUTA2
16-Bit
DAC
FIR5
x
sin(x)
DA[15:0]
DB[15:0]
2F
data
2 ­ 16
y
F
data
8F
data
4F
data
16F
data
F
data
y
2
A Gain
A
Offset
FIR1
FIR2
FIR3
FIR4
16-Bit
DAC
FIR5
x
sin(x)
2F
data
8F
data
4F
data
16F
data
y
2
B
Offset
B Gain
DEMUX
Single-Sideband Mode
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
In dual-channel mode, interpolation filtering increases the DAC update rate, thereby reducing sinx/x rolloff and
enabling relaxed analog post-filtering, and is useful for baseband I and Q modulation or two-channel low-IF
signals. The dual-channel mode is set by mode[1:0] = 00 in the config_lsb register. Figure 18 shows the data
path architecture in dual-channel mode. The A- and B-data paths, which are independent, consist of four
cascaded half-band interpolation filters, followed by an optional inverse sinc filter. Interpolation filtering is
selected as 2
×
, 4
×
, 8
×
, or 16
×
by sel[1:0] in the config_lsb register. Magnitude spectral responses of each filter
are presented following in the section on digital filtering. Full bypass of all the interpolation filters is selected by
fbypass in the config_lsb register. The inverse sinc filter is intended for use in single-sideband and quadrature
modulation modes and is of limited benefit in dual-channel mode.
Figure 18. Data Path in Dual-Channel Mode
Single-sideband (SSB) mode provides optimum interfacing to analog quadrature modulators. The SSB mode is
selected by mode[1:0] = 01 in the config_lsb register. Figure 19 shows the data path architecture in
single-sideband mode. Complex baseband I and Q are input to the DAC5686, which in turn performs a complex
mix, resulting in Hilbert transform pairs at the outputs of the DAC5686's two DACs. NCO mixing frequencies are
programmed through 32-bit freq (4 registers); 16-bit phase adjustments are programmed through phase (2
registers). The NCO operates at the DAC update rate; thus, increased amounts of interpolation allow for higher
IFs. More details for the NCO are provided as follows. For mixing to F
dac
/4, DAC5686 provides a specific
architecture that exploits the {
...
­1 0 1 0
...
} resultant streams from sin and cos; the NCO is shut off in this mode
to conserve power. F
dac
/4 mix mode is implemented by deasserting nco in register config_msb while in
single-sideband or quadrature modulation mode.
16
www.ti.com
IOUTA1
IOUTA2
16-Bit
DAC
DA[15:0]
DB[15:0]
2 ­ 16
y
F
data
F
data
y
2 ­
y
16
A Gain
A
Offset
FIR5
x
sin(x)
A
cos
sin
y
2 ­
y
16
+
+/-
IOUTB1
IOUTB2
16-Bit
DAC
B Gain
B
Offset
x
sin(x)
B
sin
cos
+
+
DEMUX
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
DETAILED DESCRIPTION (continued)
Figure 19. Data Path in SSB Mode
Figure 20 shows the DAC5686 interfaced to an RF quadrature modulator. The outputs of the complex mixer
stage can be expressed as:
A(t) = I(t)cos(
c
t) ­ Q(t)sin(
c
t) = m(t)
B(t) = I(t)sin(
c
t) + Q(t)cos(
c
t) = m
h
(t)
where m(t) and m
h
(t) connote a Hilbert transform pair. Upper single-sideband up-conversion is achieved at the
output of the analog quadrature modulator, whose output is expressed as:
IF(t) = A(t)cos(
c
+
1
)t ­ B(t)sin(
c
+
1
)t
Flexibility is provided to the user by allowing for the selection of ­B(t) out, which results in lower-sideband
up-conversion. This option is selected by ssb in the config_msb register. Figure 21 depicts the magnitude
spectrum along the signal path during single-sideband up-conversion for real input. Further flexibility is provided
to the user by allowing for the inverse of sin to be used in the complex mixer by programming rspect in the
config_usb register. The four combinations of rspect and ssb allow the user to select one of four complex
spectral bands to input to a quadrature modulator (see Figure 22).
17
www.ti.com
+
+
+
-
I
Q
DAC
DAC
A
B
LO
Quadrature
Modulator
DAC5686
cos(
c
t)
sin(
c
t)
­sin(
c
t)
­cos(
c
t)
A(t) = I(t)cos(
c
t) ­ Q(t)sin(
c
t)
B(t) = ­I(t)sin(
c
t) ­ Q(t)cos(
c
t)
cos(
LO
t)
sin(
LO
t)
0
°
90
°
IF(t) = I(t)cos(
c
+
LO
)t
­ Q(t)sin(
c
+
LO
)t
0
0
c
LO
LO
­
c
LO
+
c
Real Input
Spectrum
to DAC5686
Complex Input
Spectrum
to Quadrature Modulator
Output Spectrum
to Quadrature Modulator
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
DETAILED DESCRIPTION (continued)
Figure 20. DAC5686 in SSB Mode With Quadrature Modulator
Figure 21. Spectrum After First and Second Up-Converson for Real Input
18
www.ti.com
Complex Input
Spectrums
to Quadrature
Modulator
0
c
­
c
0
0
0
0
rspect = 0
ssb = 0
rspect = 1
ssb = 0
rspect = 1
ssb = 1
rspect = 0
ssb = 1
Complex Input
Spectrum
to DAC5686
c
­
c
c
­
c
c
­
c
DAC Gain and Offset Control
Quadrature Modulation Mode
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
DETAILED DESCRIPTION (continued)
Figure 22. Spectrum After First and Second Up-Converson for Complex Input
To compensate for the sinx/x rolloff of the zero-order hold of the DACs, the DAC5686 provides an inverse sinc
FIR, which provides high-frequency boost. The magnitude spectral response of this filter is presented in the
Digital Filters section.
Unmatched gains and offsets at the RF quadrature modulator result in unwanted sideband and local-oscillator
feedthrough. Gain and offset imbalances between the two DACs are compensated for by programming
daca_gain, dacb_gain, daca_offset, and dacb_offset in registers 0x0A through 0x0F (see the following
register descriptions). The DAC gain value controls the full-scale output current. The DAC offset value adds a
digital offset to the digital data before digital-to-analog conversion. Care must be taken when using the offset by
restricting the dynamic range of the digital signal to prevent saturation when the offset value is added to the
digital signal.
In quadrature modulation mode, on-chip mixing of complex I and Q inputs provides the final baseband-to-IF
up-conversion. Quadrature modulation mode is selected by mode[1:0] = 10 in the config_lsb register. Figure 23
shows the data path architecture in quadrature modulation mode. Complex baseband I and Q from the
ASIC/FPGA are input to the DAC5686, which in turn quadrature modulates I and Q to produce the final IF
single-sideband spectrum. DAC A is held constant, while DAC B presents the DAC5686 quadrature modulator
mode output.
19
www.ti.com
FIR1
FIR2
FIR3
FIR4
IOUTB1
IOUTB2
16-Bit
DAC
DA[15:0]
DB[15:0]
2 ­ 16
y
F
data
F
data
y
2
B Gain
B
Offset
FIR1
FIR2
FIR3
FIR4
y
2
y
2
y
2
y
2
y
2
y
2
y
2
FIR5
x
sin(x)
+
+/-
cos
sin
sin
cos
DEMUX
Serial Interface
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
DETAILED DESCRIPTION (continued)
NCO mixing frequencies are programmed through 32-bit freq (4 registers); 16-bit phase adjustments are
programmed through phase (2 registers). The NCO operates at the DAC update rate; thus, increased amounts
of interpolation allow for higher IFs. More details for the NCO are provided in the NCO section. For mixing to
F
dac
/4, the DAC5686 provides a specific architecture that exploits the {
...
­1 0 1 0
...
} resultant streams from sin
and cos; the NCO is shut off in this mode to conserve power. F
dac
/4 mix mode is implemented by deasserting
nco in register config_msb while in single-sideband or quadrature modulation mode.
Figure 23. Data Path in Quadrature Modulation Mode
In quadrature modulation mode, only one output from the complex mixer stage is routed to the B DAC. The
output can be expressed as:
B(t) = I(t)sin(
c
t) + Q(t)cos(
c
t)
or
B(t) = I(t)cos(
c
t) ­ Q(t)sin(
c
t)
Single-sideband up-conversion is achieved when I and Q are Hilbert transform pairs. Upper- or lower-sideband
up-conversion is selected by ssb in the config_msb register, which selects the output from the mixer stage that
is routed out.
The offset and gain features for the B DAC, as previously described, are functional in the quadrature mode.
The serial port of the DAC5686 is a flexible serial interface that communicates with industry-standard
microprocessors and microcontrollers. The interface provides read/write access to all registers used to define the
operating modes of the DAC5686. It is compatible with most synchronous transfer formats and can be configured
as a 3- or 4-pin interface by sif4 in register config_msb. In both configurations, SCLK is the serial-interface
input clock and SDENB is the serial-interface enable. For the 3-pin configuration, SDIO is a bidirectional pin for
both data-in and data-out. For the 4-pin configuration, SDIO is data-in only and SDO is data-out only.
20
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Serial-Port Timing Diagrams
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
DETAILED DESCRIPTION (continued)
Each read/write operation is framed by signal SDENB (serial data enable bar) asserted low for 2 to 5 bytes,
depending on the data length to be transferred (1­4 bytes). The first frame byte is the instruction cycle, which
identifies the following data transfer cycle as read or write, how many bytes to transfer, and the address to/from
which to transfer the data. Table 1 indicates the function of each bit in the instruction cycle and is followed by a
detailed description of each bit. Frame bytes 2 through 5 comprise the data to be transferred.
Table 1. Instruction Byte of the Serial Interface
MSB
LSB
Bit
7
6
5
4
3
2
1
0
Description
R/W
N1
N0
­
A3
A2
A1
A0
R/W: Identifies the following data transfer cycle as a read or write operation. A high indicates a read operation
from the DAC5686 and a low indicates a write operation to the DAC5686.
N[1:0]: Identifies the number of data bytes to be transferred per Table 2. Data is transferred MSB-first.
Table 2. Number of Transferred Bytes Within One
Communication Frame
N1
N0
DESCRIPTION
0
0
Transfer 1 byte
0
1
Transfer 2 bytes
1
0
Transfer 3 bytes
1
1
Transfer 4 bytes
A4: Unused
A[3:0]: Identifies the address of the register to be accessed during the read or write operation. For multibyte
transfers, this address is the starting address and the address decrements. Note that the address is written to the
DAC5686 MSB-first.
Figure 24 shows the serial-interface timing diagram for a DAC5686 write operation. SCLK is the serial-interface
clock input to the DAC5686. Serial data enable SDENB is an active-low input to the DAC5686. SDIO is serial
data-in. Input data to the DAC5686 is clocked on the rising edges of SCLK.
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R/W
t
SCLKL
SDENB
SCLK
SDIO
N1 N0
-
A3 A2 A1 A0 D7 D6 D5 D4 D3 D2 D1 D0
SDENB
SCLK
SDIO
Instruction Cycle
Data Transfer Cycle(s)
t
s(SDENB)
t
SCLK
t
h(SDIO)
t
s(SDIO)
t
SCLKH
R/W
D7
SDENB
SCLK
SDIO
N1 N0
-
A3 A2 A1 A0
D6 D5 D4 D3 D2
D0 0
Instruction Cycle
Data Transfer Cycle(s)
SDO
D7 D6 D5 D4 D3 D2 D1 D0 0
3-Pin Configuration
Output
4-Pin Configuration
Output
SDENB
SCLK
SDIO
Data n
Data n-1
SDO
t
d(Data)
D1
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
Figure 24. Serial-Interface Write Timing Diagram
Figure 25 shows the serial-interface timing diagram for a DAC5686 read operation. SCLK is the serial-interface
clock input to the DAC5686. Serial data enable SDENB is an active-low input to the DAC5686. SDIO is serial
data-in during the instruction cycle. In the 3-pin configuration, SDIO is data-out from the DAC5686 during the
data transfer cycle(s), while SDO is in a high-impedance state. In the 4-pin configuration, SDO is data-out from
the DAC5686 during the data transfer cycle(s). SDO is never placed in the high-impedance state in the four-pin
configuration.
Figure 25. Serial-Interface Read Timing Diagram
22
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Clock Generation
t
_align
+
1
2F
CLK2
*
0.5 ns
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
In the DAC5686, the internal clocks (1
×
, 2
×
, 4
×
, 8
×
, and 16
×
, as needed) for the logic, FIR interpolation filters,
and DAC are derived from a clock at either the input data rate using an internal PLL (PLL clock mode) or the
DAC output sample rate (external clock mode). Power for the internal PLL blocks (PLLVDD and PLLGND) is
separate from power for the other clock generation blocks (CLKVDD and CLKGND), thus minimizing phase noise
within the PLL.
The DAC5686 has three clock modes for generating the internal clocks (1
×
, 2
×
, 4
×
, 8
×
, and 16
×
, as needed) for
the logic, FIR interpolation filters, and DACs. The clock mode is set using the PLLVDD pin and dual_clk in
register config_usb. A block diagram for the clock generation circuit is shown in Figure 27.
1. PLLVDD = 0V and dual_clk = 0: EXTERNAL CLOCK MODE
In EXTERNAL CLOCK MODE, the user provides a clock signal at the DAC output sample rate through
CLK2/CLK2C. CLK1/CLK1C and the internal PLL are not used, so the LPF circuit is not applicable. The input
data rate clock and interpolation rate are selected by the registers sel[1:0], and are output through the
PLLLOCK pin. It is common to use the PLLLOCK clock to drive the chip that sends the data to the DAC;
otherwise, there is phase ambiguity regarding how the DAC divides down to the input sample rate clock and
an external clock divider divides down. (For a divide by N, there are N possible phases.) The phase
ambiguity can also be solved by using PHSTR pin with a synchronization signal.
2. PLLVDD = 3.3V (dual_clk can be 0 or 1 and is ignored): PLL CLOCK MODE
Power for the internal PLL blocks (PLLVDD and PLLGND) is separate from power for the other clock
generation blocks (CLKVDD and CLKGND), thus minimizing PLL phase noise.
In PLL CLOCK MODE, the DAC is driven at the input sample rate (unless the data is multiplexed) through
CLK1/CLK1C. CLK2/CLK2C is not used. In this case, there is no phase ambiguity on the clock. The DAC
generates the higher speed DAC sample rate clock using an internal PLL/VCO. In PLL clock mode, the user
provides a differential external reference clock on CLK1/CLK1C.
A type-4 phase-frequency detector (PFD) in the internal PLL compares this reference clock to a feedback
clock and drives the PLL to maintain synchronization between the two clocks. The feedback clock is
generated by dividing the VCO output by 1
×
, 2
×
, 4
×
, or 8
×
as selected by the prescaler (div[1:0]). The output
of the prescaler is the DAC sample rate clock and is divided down to generate clocks at
÷
2,
÷
4,
÷
8, and
÷
16.
The feedback clock is selected by the registers sel[1:0], an then is fed back to the PFD for synchronization
to the input clock. The feedback clock is also used for the data input rate, so the ratio of DAC output clock to
feedback clock sets the interpolation rate of the DAC5686. The PLLLOCK pin is an output that indicates
when the PLL has achieved lock. An external RC low-pass PLL filter is provided by the user at pin LPF. See
the low-pass filter section for filter setting calculations. This is the only mode where the LPF filter applies.
3. PLLVDD = 0V and dual_clk = 1: DUAL CLOCK MODE
In DUAL CLOCK MODE, the DAC is driven at the DAC sample rate through CLK2/CLK2C and at the input
data rate through CLK1/CLK1C. The DUAL CLOCK MODE has the advantage of a clean external clock for
the DAC sampling without the phase ambiguity. The edges of CLK1 and CLK2 must be aligned to within
±
t
_align
(See Figure 26), defined as
where F
CLK2
is the clock frequency of CLK2. For example, t
_align
= 0.5 ns at F
CLK2
= 500 MHz and 1.5 ns at
F
CLK2
= 250 MHz.
23
www.ti.com
t
h
CLK2
CLK1
D[0:15]
< t
align
t
s
T0002-01
PLLVDD
PLLGND
CLKGND
CLKVDD
pfd
Charge
Pump
vco
/1
/2
/4
/8
clk_16x
DAC
Sample
Clock
D[15:0]
DIV[1:0]
PLLVDD
SEL[1:0]
PLLVDD
PLLLOCK
LPF
Data
s
1
0
clk_2x
/2
/2
/2
/2
clk_1x
clk_4x
clk_8x
CLK1
CLK1C
Clk Buffer
CLK2
CLK2C
Clk Buffer
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
Figure 26. DAC and Data Clock Mode
The CDC7005 from Texas Instruments is recommended for providing phase-aligned clocks at different
frequencies for this application.
Table 3 provides a summary of the clock configurations with corresponding data rate ranges.
Figure 27. Clock-Generation Architecture
Table 3. Clock-Mode Configuration
CLOCK MODE
PLLVDD
DIV[1:0]
SEL[1:0]
DATA RATE (MSPS)
PLLLOCK PIN FUNCTION
Non-interleaved input data; internal PLL off; DA[15:0] data rate matches DB[15:0] data rate.
External 2
×
0 V
XX
00
DC to 160
External clk2/clk2c clock
÷
2
External 4
×
0 V
XX
01
DC to 125
External clk2/clk2c clock
÷
4
External 8
×
0 V
XX
10
DC to 62.5
External clk2/clk2c clock
÷
8
External 16
×
0 V
XX
11
DC to 31.25
External clk2/clk2c clock
÷
16
External dual clock 2
×
0 V
XX
00
DC to 160
None - held low
External dual clock 4
×
0 V
XX
01
DC to 125
None - held low
24
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DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
Table 3. Clock-Mode Configuration (continued)
CLOCK MODE
PLLVDD
DIV[1:0]
SEL[1:0]
DATA RATE (MSPS)
PLLLOCK PIN FUNCTION
External dual clock 8
×
0 V
XX
10
DC to 62.5
None - held low
External dual clock 16
×
0 V
XX
11
DC to 31.25
None - held low
Interleaved input data on the DA[15:0] input pins; internal PLL off
External 2
×
0 V
XX
00
DC to 80
External clk2/clk2c clock
÷
2
External 4
×
0 V
XX
01
DC to 80
External clk2/clk2c clock
÷
4
External 8
×
0 V
XX
10
DC to 62.5
External clk2/clk2c clock
÷
8
External 16
×
0 V
XX
11
DC to 31.25
External clk2/clk2c clock
÷
16
External dual clock 2
×
0 V
XX
00
DC to 80
None - held low
External dual clock 4
×
0 V
XX
01
DC to 62.5
None - held low
External dual clock 8
×
0 V
XX
10
DC to 31.25
None - held low
External dual clock 16
×
0 V
XX
11
DC to 15.625
None - held low
Non-interleaved input data; internal PLL on; DA[15:0] data rate matches DB[15:0] data rate.
Internal 2
×
3.3 V
00
00
125 to 160
Internal PLL lock indicator
Internal 2
×
3.3 V
01
00
62.5 to 125
Internal PLL lock indicator
Internal 2
×
3.3 V
10
00
31.25 to 62.5
Internal PLL lock indicator
Internal 2
×
3.3 V
11
00
15.63 to 31.25
Internal PLL lock indicator
Internal 4
×
3.3 V
00
01
62.5 to 125
Internal PLL lock indicator
Internal 4
×
3.3 V
01
01
31.25 to 62.5
Internal PLL lock indicator
Internal 4
×
3.3 V
10
01
15.63 to 31.25
Internal PLL lock indicator
Internal 4
×
3.3 V
11
01
7.8125 to 15.625
Internal PLL lock indicator
Internal 8
×
3.3 V
00
10
31.25 to 62.5
Internal PLL lock indicator
Internal 8
×
3.3 V
01
10
15.63 to 31.25
Internal PLL lock indicator
Internal 8
×
3.3 V
10
10
7.8125 to 15.625
Internal PLL lock indicator
Internal 8
×
3.3 V
11
10
3.9 to 7.8125
Internal PLL lock indicator
Internal 16
×
3.3 V
00
11
15.625 to 31.25
Internal PLL lock indicator
Internal 16
×
3.3 V
01
11
7.8125 to 15.625
Internal PLL lock indicator
Internal 16
×
3.3 V
10
11
3.9062 to 7.8125
Internal PLL lock indicator
Interleaved input data on the DA[15:0] input pins; internal PLL on
Internal 2
×
3.3 V
00
00
Not recommended
Internal PLL lock indicator
Internal 2
×
3.3 V
01
00
62.5 to 80
Internal PLL lock indicator
Internal 2
×
3.3 V
10
00
31.25 to 62.5
Internal PLL lock indicator
Internal 2
×
3.3 V
11
00
15.625 to 31.25
Internal PLL lock indicator
Internal 4
×
3.3 V
00
01
62.5 to 80
Internal PLL lock indicator
Internal 4
×
3.3 V
01
01
31.25 to 62.5
Internal PLL lock indicator
Internal 4
×
3.3 V
10
01
15.625 to 31.25
Internal PLL lock indicator
Internal 4
×
3.3 V
11
01
7.8125 to 15.625
Internal PLL lock indicator
Internal 8
×
3.3 V
00
10
31.25 to 62.5
Internal PLL lock indicator
Internal 8
×
3.3 V
01
10
15.625 to 31.25
Internal PLL lock indicator
Internal 8
×
3.3 V
10
10
7.8125 to 15.625
Internal PLL lock indicator
Internal 8
×
3.3 V
11
10
3.9062 to 7.8125
Internal PLL lock indicator
Internal 16
×
3.3 V
00
11
15.625 to 31.25
Internal PLL lock indicator
Internal 16
×
3.3 V
01
11
7.8125 to 15.625
Internal PLL lock indicator
Internal 16
×
3.3 V
10
11
3.9062 to 7.8125
Internal PLL lock indicator
Internal 16
×
3.3 V
11
11
1.9531 to 3.9062
Internal PLL lock indicator
25
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Dual-Bus Mode
IOUTB1
IOUTB2
IOUTA1
IOUTA2
16-Bit
DAC
DA[15:0]
DB[15:0]
2F
data
2 ­ 16
y
F
data
F
data
y
2
16-Bit
DAC
2F
data
y
2
FIR1
Edge Triggered
Input Latches
·
· ·
·
· ·
DEMUX
CLK1
DA[15:0]
DB[15:0]
t
s(DATA)
t
h(DATA)
A
0
A
1
A
2
A
N
A
N+1
A
3
B
0
B
1
B
2
B
N
B
N+1
B
3
CLK2
DA[15:0]
DB[15:0]
t
s(DATA)
t
h(DATA)
A
0
A
1
A
2
A
N
A
N+1
A
3
B
0
B
1
B
2
B
N
B
N+1
B
3
PLLLOCK
t
d(PLLLOCK)
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
In dual-bus mode, two separate parallel data streams (I and Q) are input to the DAC5686 on data bus DA and
data bus DB. Dual-bus mode is selected by setting INTERL to 0 in the config_msb register. Figure 28 shows
the DAC5686 data path in dual-bus mode. The dual-bus mode timing diagram is shown in Figure 29 for the PLL
clock mode and in Figure 30 for the external clock mode.
Figure 28. Dual-Bus Mode Data Path
Figure 29. Dual-Bus Mode Timing Diagram (PLL Mode)
Figure 30. Dual-Bus Mode Timing Diagram (External Clock Mode)
26
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Interleave Bus Mode
IOUTB1
IOUTB2
IOUTA1
IOUTA2
16-Bit
DAC
2F
data
2 ­ 16
y
F
data
F
data
y
2
16-Bit
DAC
2F
data
y
2
FIR1
Edge Triggered
Input Latches
·
· ·
·
· ·
DA[15:0]
DEMUX
DA[15:0]
t
s(DATA)
t
h(DATA)
A
0
B
0
A
1
A
N
B
N
B
1
TxENABLE
t
s(TxENABLE)
CLK1 or
PLLLOCK
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
In interleave bus mode, one parallel data stream with interleaved data (I and Q) is input to the DAC5686 on data
bus DA. Interleave bus mode is selected by setting INTERL to 1 in the config_msb register. Figure 31 shows
the DAC5686 data path in interleave bus mode. The interleave bus mode timing diagram is shown in Figure 32.
Figure 31. Interleave Bus Mode Data Path
Figure 32. Interleave Bus Mode Timing Diagram Using TxENABLE
Interleaved user data on data bus DA is alternately multiplexed to internal data channels A and B. Data channels
A and B can be synchronized using either the QFLAG pin or the TxENABLE pin. When qflag in register
config_usb is 0, transitions on TxENABLE identify the interleaved data sequence. The first data after the rising
edge of TxENABLE is latched with the rising edge of CLK as channel-A data. Data is then alternately distributed
to B and A channels with successive rising edges of CLK. When qflag is 1, the QFLAG pin is used as an output
to identify the interleaved data sequence. QFLAG high identifies data as channel B (see Figure 33).
27
www.ti.com
DA[15:0]
t
s(DATA)
t
h(DATA)
A
0
B
0
A
1
A
N
B
N
B
1
QFLAG
CLK1 or
PLLLOCK
T0001-01
Clock Synchronization Using the PHSTR Pin in External Clock Mode
CLK2
PLLLOCK
CLK2C
T0003-01
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
Figure 33. Interleave Bus Mode Timing Diagram Using QFLAG
The dual-clock mode is selected by setting dualclk high in the config_usb register. In this mode, the DAC5686
uses both clock inputs; CLK1/CLK1C is the input data clock, and CLK2/CLK2C is the external clock. The edges
of the two input clocks must be phase-aligned within
±
500 ps to function properly.
In external clock mode, the DAC5686 is clocked at the DAC output sample frequency (CLK2 and CLK2C). For an
interpolation rate N, there are N possible phases for the DAC input clock on the PLLLOCK pin (see Figure 34 for
N = 4).
Figure 34. Four Possible PLLLOCK Phases for N = 4 in External Clock Mode
To synchronize PLLLOCK input clocks across multiple DAC5686 chips, a sync signal on the PHSTR pin is used.
During configuration of the DAC5686 chips, address sync_phstr in config_msb is set high to enable the
PHSTR input pin as a sync input to the clock dividers generating the input clock. A simultaneous low-to-high
transition on the PHSTR pin for each DAC5686 then forces the input clock on PLLLOCK to start in phase on
each DAC. See Figure 35.
28
www.ti.com
PHSTR
D[0:15]
PLLLOCK
DAC1
CLK2
CLK2C
t
h_PHSTR
1/F
PLLLOCK
= N/F
CLK2
t
s_PHSTR
t
d_CLK
t
h
t
s
T0004-01
Digital Filters
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
Figure 35. Using PHSTR to Synchronize PLLLOCK Input Clock for Multiple DACs in External Clock Mode
The PHSTR transition has a setup and hold time relative to the DAC output sample clock (t
s_PHSTR
and t
h_PHSTR
)
equal to 50% of the DAC output sample clock period up to a maximum of 1 ns. At 500 MHz, the setup and hold
times are therefore 0.5 ns. The PHSTR signal can remain high after synchronization, or can return low. A new
low-to-high transition resynchronizes the input clock. Note that the PHSTR transition also resets the NCO
accumulator.
Figure 36 through Figure 39 show magnitude spectrum responses for 2
×
, 4
×
, 8
×
, and 16
×
FIR interpolation
filtering. The transition band is from 0.4 to 0.6 f
DATA
with < 0.002-dB pass-band ripple and > 80-dB stop-band
attenuation for all four configurations. The filters are linear phase. The sel field in register config_lsb selects the
interpolation filtering rate as 2
×
, 4
×
, 8
×
, or 16
×
; interpolation filtering can be completely bypassed by setting
fullbypass in register config_lsb.
Figure 40 shows the spectral correction of the DAC sinx/x rolloff achieved with use of inverse sinc filtering.
Pass-band ripple from 0 to 0.4 f
DATA
is < 0.03 dB. Inverse sinc filtering is enabled by sinc in register
config_msb.
29
www.ti.com
f/F
Data
-160
-140
-120
-100
-80
-60
-40
-20
0
20
0.0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
Magnitude ­ dB
f/F
Data
-160
-140
-120
-100
-80
-60
-40
-20
0
20
0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
1.8
2.0
Magnitude ­ dB
f/F
Data
-160
-140
-120
-100
-80
-60
-40
-20
0
20
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
Magnitude ­ dB
f/F
Data
-160
-140
-120
-100
-80
-60
-40
-20
0
20
0
1
2
3
4
5
6
7
8
Magnitude ­ dB
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
MAGNITUDE
MAGNITUDE
vs
vs
FREQUENCY
FREQUENCY
Figure 36. Magnitude Spectrum for
Figure 37. Magnitude Spectrum for
2
×
Interpolation (dB)
4
×
Interpolation (dB)
MAGNITUDE
MAGNITUDE
vs
vs
FREQUENCY
FREQUENCY
Figure 38. Magnitude Spectrum for
Figure 39. Magnitude Spectrum for
8
×
Interpolation (dB)
16
×
Interpolation (dB)
30
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f/F
DAC
-5
-4
-3
-2
-1
0
1
2
3
4
5
0.0
0.1
0.2
0.3
0.4
0.5
Magnitude ­ dB
Rolloff
FIR
Corrected
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
MAGNITUDE
vs
FREQUENCY
Figure 40. Magnitude Spectrum for Inverse Sinc Filtering
The filter taps for interpolation filters FIR1 - FIR4 and inverse sinc filter FIR5 are listed in Table 4.
Table 4. Filter Taps for FIR1­FIR5
FIR1
FIR2
FIR3
FIR4
FIR5 (INVSINC)
8
9
31
-33
1
0
0
0
0
­3
­24
­58
­219
289
9
0
0
0
512
­34
58
214
1212
289
400
0
0
2048
0
­34
­120
­638
1212
­33
9
0
0
0
­3
221
2521
­219
1
0
4096
0
­380
2521
31
0
0
619
­638
0
0
-971
214
0
0
1490
­58
0
0
­2288
9
0
3649
0
­6628
0
31
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NCO
Frequency
Register
32
Accumulator
32
RESET
CLK
PHSTR
32
32
Phase
Register
16
16
16
Look-Up
Table
sin
cos
16
16
F
DAC
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
Table 4. Filter Taps for FIR1­FIR5 (continued)
FIR1
FIR2
FIR3
FIR4
FIR5 (INVSINC)
20750
32768
20750
0
­6628
0
3649
0
­2288
0
1490
0
­971
0
619
0
­380
0
221
0
­120
0
58
0
­24
0
8
The DAC5686 uses a numerically controlled oscillator (NCO) with a 32-bit frequency register and a 16-bit phase
register. The NCO is used in quadrature-modulation and single-sideband modes to provide sin and cos for
mixing. The NCO tuning frequency is programmed in registers 0x1 through 0x4. Phase offset is programmed is
registers 0x5 and 0x6. A block diagram of the NCO is shown in Figure 41.
Figure 41. Block Diagram of the NCO
32
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f
NCO
+
freq
F
DAC
2
32
Register Bit Allocation Map
REGISTER DESCRIPTIONS
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
The NCO accumulator is reset to zero when the PHSTR pin is high and remains at zero until PHSTR is set low.
Frequency word freq in the frequency register is added to the accumulator every clock cycle. The output
frequency of the NCO is:
While the maximum clock frequency of the DACs is 500 MSPS, the maximum clock frequency the NCO can
operate at is 320 MHz; mixing at DAC rates higher than 320 MSPS requires using the fs/4 mixing option.
NAME
R/W
AD-
BIT 7
BIT 6
BIT 5
BIT 4
BIT 3
BIT 2
BIT 1
BIT 0
DRESS
chip_ver
R/W
0x00
atest[4:0]
version[2:0] read only
freq_lsb
R/W
0x01
freq_int[7:0]
freq_lmidsb
R/W
0x02
freq_int[15:8]
freq_umidsb
R/W
0x03
freq_int[23:16]
freq_msb
R/W
0x04
freq_int[31:24]
phase_lsb
R/W
0x05
phase_int[7:0]
phase_msb
R/W
0x06
phase_int[15:8]
config_lsb
R/W
0x07
mode[1:0]
div[1:0]
sel[1:0]
counter
fbypass
config_msb
R/W
0x08
ssb
interl
sinc
dith
sync_phstr
nco
sif4
twos
config_usb
R/W
0x09
dual clk
dds_gain[1:0]
rspect
qflag
pll_rng[1:0]
rev_bbus
daca_offset_lsb
R/W
0x0A
daca_offset[7:0]
daca_gain_lsb
R/W
0x0B
daca_gain[7:0]
daca_offset_gain_
R/W
0x0C
daca_offset[10:8]
sleepA
daca_gain[11:8]
msb
dacb_offset_lsb
R/W
0x0D
dacb_offset[7:0]
dacb_gain_lsb
R/W
0x0E
dacb_gain[7:0]
dacb_offset_gain_
R/W
0x0F
dacb_offset[10:8]
sleepB
dacb_gain[11:8]
msb
Register Name: chip_ver
MSB
LSB
atest[4:0]
chip_ver[2:0] read only
0
0
0
0
0
1
0
1
chip_ver[3:0]: chip_ver [3:0] stores the device version, initially 0x5. The user can find out which version of the
DAC5686 is in the system by reading this byte.
a_test[4:0]: must be 0 for proper operation.
Register Name: freq_lsb
MSB
LSB
freq_int[7:0]
0
0
0
0
0
0
0
0
33
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DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
freq_int[7:0]: The lower 8 bits of the frequency register in the DDS block
Register Name: freq_lmidsb
MSB
LSB
freq_int[15:8]
0
0
0
0
0
0
0
0
freq_int[15:8]: The lower mid 8 bits of the frequency register in the DDS block
Register Name: freq_umidsb
MSB
LSB
freq_int[23:16]
0
0
0
0
0
0
0
0
freq_int[23:16]: The upper mid 8 bits of the frequency register in the DDS block
Register Name: freq_msb
MSB
LSB
freq_int[31:24]
0
0
1
0
0
0
0
0
freq_int[31:24]: The most significant 8 bits of the frequency register in the DDS block
Register Name: phase_lsb
MSB
LSB
phase_int[7:0]
0
0
0
0
0
0
0
0
phase_int[7:0]: The lower 8 bits of the phase register in the DDS block
Register Name: phase_msb
MSB
LSB
phase_int[15:8]
0
0
0
0
0
0
0
0
phase_int[15:8]: The most significant 8 bits of the phase register in the DDS block
Register Name: config_lsb
MSB
LSB
mode[1:0]
div[1:0]
sel[1:0]
counter
Full_bypass
0
0
0
0
0
0
0
1
mode[1:0]: Controls the mode of the DAC5686; summarized in Table 5.
Table 5. DAC5686 Modes
mode[1:0]
DAC5686 MODE
00
Dual-DAC
01
Single-sideband
10
Quadrature
11
Dual-DAC
34
www.ti.com
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
div[1:0]: Controls the PLL divider value; summarized in Table 6.
Table 6. PLL Divide Ratios
div[1:0]
PLL DIVIDE RATIO
00
1
×
divider
01
2
×
divider
10
4
×
divider
11
8
×
divider
sel[1:0]: Controls the selection of interpolating filters used; summarized in Table 7.
Table 7. DAC5686 Filter Configuration
sel[1:0]
INTERP. FIR SETTING
00
×
2
01
×
4
10
×
8
11
×
16
counter: When asserted, the DAC5686 goes into counter mode and uses an internal counter as a ramp input to
the DAC. The count range is determined by the A-side input data DA[2:0], as summarized in Table 8.
Table 8. DAC5686 Counter Mode Count Range
DA[2:0]
COUNT RANGE
000
All bits D[15:0]
001
Lower 7 bits D[6:0]
010
Mid 4 bits D[10:7]
100
Upper 5 bits D[15:11]
Full_bypass: When asserted, the interpolation filters and mixer logic are bypassed and the data inputs DA[15:0]
and DB[15:0] go straight to the DAC inputs.
Register Name: config_msb
MSB
LSB
ssb
interl
sinc
dith
sync_phstr
nco
sif4
twos
0
0
0
0
0
0
0
0
ssb: In single-sideband mode, assertion inverts the B data; in quadrature modulation mode, assertion routes the
A data path to DACB instead of the B data path.
interl: When asserted, data input to the DAC5686 on channel DA[15:0] is interpreted as a single interleaved
stream (I/Q); channel DB[15:0] is unused.
sinc: Assertion enables the INVSINC filter.
dith: Assertion enables dithering in the PLL.
sync_phstr: Assertion enables the PHSTR input as a sync input to the clock dividers in external single-clock
mode.
nco: Assertion enables the NCO.
sif4: When asserted, the sif interface becomes a 4-pin interface instead of a 3-pin interface. The SDIO pin
becomes an input only and the SDO is the output.
twos: When asserted, the chip interprets the input data as 2s complement form instead of binary offset.
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DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
Register Name: config_usb
MSB
LSB
dualclk
DDS_gain[1:0]
rspect
qflag
pll_rng[1:0]
rev_bbus
0
0
0
0
0
0
0
0
dualclk: When asserted, the DAC5686 uses both clock inputs; CLK1/CLK1C is the input data clock and
CLK2/CLK2C is the DAC output clock. These two clocks must be phase-aligned within
±
500 ps to function
properly. When deasserted, CLK2/CLK2C is the DAC output clock and is divided down to generate the input data
clock, which is output on PLLLOCK. Dual clock mode is only available when PLLVDD = 0.
DDS_gain[1:0]: Controls the gain of the DDS so that the overall gain of the DDS is unity. It is important to
ensure that max(abs(cos(
t) + sin(
t))) < 1. At different frequencies, the summation produces different maximum
outputs and must be reduced. The simplest is fs/4 mode where the maximum is 1 and the gain multiply should
be 1 to maintain unity. However, due to the fact that the digital logic does a divide-by-two in this summation, the
gain necessary to achieve unity must be double (DDS_gain[1:0] = 01). Table 9 shows the digital gain necessary
and the actual signal gain needed to make the above equation have a maximum value of 1.
Table 9. Digital Gain for DDS
DDS_gain [1:0]
DIGITAL GAIN
SIGNAL GAIN FOR UNITY
00
1.40625
0.703125
01
2
1
10
1.59375
0.7936
11
1.40625
0.703125
rspect: When asserted, the sin term is negated before being used in mixing. This gives the reverse spectrum in
single-sideband mode.
qflag: When asserted, the QFLAG pin is used during interleaved data input mode to identify the Q sample. When
deasserted, the TXENABLE pin transition is used to start an internal toggling signal, which is used to interpret
the interleaved data sequence; the first sample clocked into the DAC5686 after TXENABLE goes high is routed
through the A data path.
PLL_rng[1:0]: Increases the PLL VCO VtoI current, summarized in Table 10. See Figure 17 for the effect on
VCO gain and range.
Table 10. PLL VCO Vtol Current Increase
PLL_rng[1:0]
VtoI CURRENT INCREASE
00
nominal
01
15%
10
30%
11
45%
rev_bbus[1:0]: When asserted, pin 92 changes from DB15 to DB0, pin 91 changes from DB14 to DB1, etc.,
reversing the order of the DB[15:0] pins.
Register Name: daca_offset_lsb (2s complement)
MSB
LSB
daca_offset[7:0]
0
0
0
0
0
0
0
0
36
www.ti.com
I
fullscale
+
16 V
extio
R
biasj
(GAINCODE
)
1)
16
B
1
*
FINEGAIN
3072
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
daca_offset[7:0]: The lower 8 bits of the DACA offset
Register Name: daca_gain_lsb (2s complement)
MSB
LSB
daca_gain[7:0]
0
0
0
0
0
0
0
0
daca_gain[7:0]: The lower 8 bits of the DACA gain control register. These lower 8 bits are for fine gain control.
This word is a 2s complement value that adjusts the full-scale output current over an approximate 4% to ­4%
range.
Register Name: daca_offset_gain_msb (2s complement)
MSB
LSB
daca_offset[10:8]
sleepa
daca_gain[11:8]
0
0
0
0
0
0
0
0
daca_offset[10:8]: The upper 3 bits of the DACA _offset
sleepa: When asserted, DACA is put into the sleep mode.
daca_gain[11:8]: Coarse gain control for DACA; the full-scale output current is:
where GAINCODE is the decimal equivalent of daca_gain [11:8] {0
...
15} and the FINEGAIN is daca_gain [1:0] as
2s complement [­127
...
128].
Register Name: dacb_offset_lsb (2s complement)
MSB
LSB
dacb_offset[7:0]
0
0
0
0
0
0
0
0
dacb_offset[7:0]: The lower 8 bits of the DACB offset
Register Name: dacb_gain_lsb (2s complement)
MSB
LSB
dacb_gain[7:0]
0
0
0
0
0
0
0
0
dacb_gain[7:0]: The lower 8 bits of the DACB gain control register. These lower 8 bits are for fine gain control.
This word is a 2s complement value that adjusts the full-scale output current over an approximate 4% to ­4%
range.
Register Name: dacb_offset_gain_msb (2s complement)
MSB
LSB
dacb_offset[10:8]
sleepb
dacb_gain[11:8]
0
0
0
0
0
0
0
0
37
www.ti.com
I
fullscale
+
16 V
extio
R
biasj
(GAINCODE
)
1)
16
B
1
*
FINEGAIN
3072
DIGITAL INPUTS
DA[15:0]
DB[15:0]
SLEEP
PHSTR
TxENABLE
QFLAG
SDIO
SCLK
SDENB
Internal
Digital In
IOVDD
IOGND
RESETB
Internal
Digital In
IOVDD
IOGND
CLOCK INPUT AND TIMING
CLK
Internal
Digital In
CLKC
CLKGND
R1
10 k
CLKVDD
R1
10 k
R2
10 k
R2
10 k
CLKVDD
CLKVDD
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
dacb_offset[10:8]: The upper 3 bits of the DACA _offset
sleepb: When asserted, DACB is put into the sleep mode.
dacb_gain[11:8]: Coarse gain control for DACB; the full-scale output current is:
where GAINCODE is the decimal equivalent of dacb_gain [11:8] {0
...
15} and the FINEGAIN is dacb_gain [1:0] as
2s complement [­127
...
128].
Figure 42 shows a schematic of the equivalent CMOS digital inputs of the DAC5686. DA[0:15], DB[0:15], SLEEP,
PHSTR, TxENABLE, QFLAG, SDIO, SCLK, and SDENB have pulldown resistors and RESETB has a pullup
resistor internal to the DAC5686. See the specification table for logic thresholds.
Figure 42. CMOS/TTL Digital Equivalent Input
Figure 43 shows an equivalent circuit for the clock input.
Figure 43. Clock Input Equivalent Circuit
38
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R
T
200
CLK
1:4
CLKC
Termination Resistor
Swing Limitation
Optional, May Be Bypassed
for Sine Wave Input
C
AC
0.1
µ
F
R
opt
22
CLK
1:1
CLKC
Optional, Reduces
Clock Feed-Through
C
AC
0.01
µ
F
TTL/CMOS
Source
R
opt
22
CLK
CLKC
Node CLKC Internally Biased
to CLKVDD 2
TTL/CMOS
Source
0.01
µ
F
R
T
130
C
AC
0.1
µ
F
C
AC
0.1
µ
F
R
T
130
V
TT
Differential
ECL
or
(LV)PECL
Source
+
­
CLK
CLKC
R
T
82.5
R
T
82.5
100
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
CLOCK INPUT AND TIMING (continued)
Figure 44, Figure 45, and Figure 46 show various input configurations for driving the differential clock input
(CLK/CLKC).
Figure 44. Preferred Clock Input Configuration
Figure 45. Driving the DAC5686 With a Single-Ended TTL/CMOS Clock Source
Figure 46. Driving the DAC5686 With a Differential ECL/PECL Clock Source
39
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DAC Transfer Function
IOUT1
+
IOUT
FS
CODE
65536
IOUT2
+
IOUT
FS
(65536
*
CODE)
65536
VOUT1
+
IOUT1
R
L
+
CODE
65536
IOUT
FS
R
L
VOUT2
+
IOUT2
R
L
+
(65536
*
CODE)
65536
IOUT
FS
R
L
VOUT
DIFF
+
IOUT1
*
VOUT2
+
(2CODE
*
65536)
65536
IOUT
FS
R
L
Reference Operation
IOUT
FS
+
16
V
EXTIO
R
BIAS
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
CLOCK INPUT AND TIMING (continued)
The CMOS DACs consist of a segmented array of NMOS current sources, capable of delivering a full-scale
output current up to 20 mA. Differential current switches direct the current of each current source to either one of
the complementary output nodes IOUT1 or IOUT2. Complementary output currents enable differential operation,
thus canceling out common-mode noise sources (digital feed-through, on-chip, and PCB noise), dc offsets,
even-order distortion components, and increasing signal output power by a factor of two.
The full-scale output current is set using external resistor R
BIAS
in combination with an on-chip band-gap voltage
reference source (1.2 V) and control amplifier. Current I
BIAS
through resistor R
BIAS
is mirrored internally to provide
a full-scale output current equal to 16 times I
BIAS
. The full-scale current can be adjusted from 20 mA down to 2
mA.
The DAC5686 delivers complementary output currents IOUT1 and IOUT2. Output current IOUT1 equals the
approximate full-scale output current when all bits (after the digital processing) are high. Full-scale output current
flows through terminal IOUT2 when all input bits are low. The relation between IOUT1 and IOUT2 can thus be
expressed as:
IOUT1 = IOUT
FS
­ IOUT2
where IOUT
FS
is the full-scale output current. The output currents can be expressed as:
where CODE is the decimal representation of the DAC data input word. Output currents IOUT1 and IOUT2 drive
resistor loads R
L
or a transformer with equivalent input load resistance (R
L
). This translates into single-ended
voltages VOUT1 and VOUT2 at terminals IOUT1 and IOUT2, respectively, of:
The differential output voltage VOUT
DIFF
can thus be expressed as:
The latter equation shows that applying the differential output results in doubling of the signal power delivered to
the load. Because the output currents IOUT1 and IOUT2 are complementary, they become additive when
processed differentially. Note that care should be taken not to exceed the compliance voltages at nodes IOUT1
and IOUT2, which would lead to increased signal distortion.
The DAC5686 comprises a band-gap reference and control amplifier for biasing the full-scale output current. The
full-scale output current is set by applying an external resistor R
BIAS
. The bias current I
BIAS
through resistor R
BIAS
is defined by the on-chip band-gap reference voltage and control amplifier. The full-scale output current equals
16 times this bias current. The full-scale output current IOUT
FS
can thus be expressed as (coarse gain = 15, fine
gain = 0):
,
where V
EXTIO
is the voltage at terminal EXTIO. The band-gap reference voltage delivers an accurate voltage of
1.2 V. This reference is active when terminal EXTLO is connected to AGND. An external decoupling capacitor
40
www.ti.com
Analog Current Outputs
IOUT1
IOUT2
S(1)
S(1)C
R
LOAD
R
LOAD
S(2)
S(2)C
S(N)
S(N)C
AVDD
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
CLOCK INPUT AND TIMING (continued)
C
EXT
of 0.1
µ
F should be connected externally to terminal EXTIO for compensation. The band-gap reference
additionally can be used for external reference operation. In that case, an external buffer with a high-impedance
input should be used in order to limit the band-gap load current to a maximum of 100 nA. The internal reference
can be disabled and overridden by an external reference by connecting EXTLO to AVDD. Capacitor C
EXT
may
hence be omitted. Terminal EXTIO serves as either input or output node.
The full-scale output current can be adjusted from 20 mA down to 2 mA by varying resistor R
BIAS
or changing the
externally applied reference voltage. The internal control amplifier has a wide input range supporting the
full-scale output current range of 20 dB.
Figure 47 shows a simplified schematic of the current source array with corresponding switches. Differential
switches direct the current of each individual NMOS current source to either the positive output node IOUT1 or
its complementary negative output node IOUT2. The output impedance is determined by the stack of the current
sources and differential switches, and is typically >300 k
in parallel with an output capacitance of 5 pF.
The external output resistors are terminated to AVDD. The maximum output compliance at nodes IOUT1 and
IOUT2 is limited to AVDD + 0.5 V, determined by the CMOS process. Beyond this value, transistor breakdown
can occur, resulting in reduced reliability of the DAC5686 device. The minimum output compliance voltage at
nodes IOUT1 and IOUT2 equals AVDD ­ 0.5 V. Exceeding the minimum output compliance voltage adversely
affects distortion performance and integral nonlinearity. The optimum distortion performance for a single-ended
or differential output is achieved when the maximum full-scale signal at IOUT1 and IOUT2 does not exceed
0.5 V.
Figure 47. Equivalent Analog Current Output
The DAC5686 can be easily configured to drive a doubly terminated 50-
cable using a properly selected RF
transformer. Figure 48 and Figure 49 show the 50-
doubly terminated transformer configuration with 1:1 and
4:1 impedance ratios, respectively. Note that the center tap of the primary input of the transformer must be
connected to AVDD to enable a dc current flow. Applying a 20-mA full-scale output current would lead to a
0.5-Vpp output for a 1:1 transformer and a 1-Vpp output for a 4:1 transformer.
41
www.ti.com
IOUT1
1:1
IOUT2
50
50
R
LOAD
50
100
AVDD (3.3 V)
AVDD (3.3 V)
IOUT1
4:1
IOUT2
100
100
R
LOAD
50
AVDD (3.3 V)
AVDD (3.3 V)
SLEEP MODE
POWER-UP SEQUENCE
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
CLOCK INPUT AND TIMING (continued)
Figure 48. Driving a Doubly Terminated 50-
Cable Using a 1:1 Impedance-Ratio Transformer
Figure 49. Driving a Doubly Terminated 50-
Cable Using a 4:1 Impedance-Ratio Transformer
The DAC5686 features a power-down mode that turns off the output current and reduces the supply current to
less than 5 mA over the supply range of 3 V to 3.6 V and temperature range of ­40
°
C to 85
°
C. The power-down
mode is activated by applying a logic level 1 to the SLEEP pin (e.g., by connecting pin SLEEP to IOVDD). An
internal pulldown circuit at node SLEEP ensures that the DAC5686 is enabled if the input is left disconnected.
Power-up and power-down activation times depend on the value of the external capacitor at node SLEEP. For a
nominal capacitor value of 0.1 mF, it takes less than 5 ms to power down and approximately 3 ms to power up.
In all conditions, bring up DVDD first. If PLLVDD is powered (PLL on), CLKVDD should be powered before or
simultaneously with PLLVDD. AVDD, CLKVDD and IOVDD can be powered simultaneously or in any order.
Within AVDD, the multiple AVDD pins should be powered simultaneously.
42
www.ti.com
DAC5686 EVALUATION BOARD
Appendix A. PLL LOOP FILTER COMPONENTS
R3
C3
R1
C1
C2
External
Internal
S0006-01
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
There is a combination EVM board for the DAC5686 digital-to-analog converter for evaluation. This board allows
the user the flexibility to operate the DAC5686 in various configurations. Possible output configurations include
transformer-coupled, resistor-terminated, inverting/non-inverting and differential amplifier outputs. The digital
inputs are designed to be driven directly from various pattern generators with the onboard option to add a
resistor network for proper load termination.
For the external second-order filter shown in Figure 50, the components R, C1, and C2 are calculated for a
desired phase margin and loop bandwidth. Resistor R3 = 200
and capacitor C3 = 8 pF are internal to the
DAC5686.
Figure 50. DAC5686 Loop Filter
The VCO gain (Gvco) as a function of VCO frequency for the DAC5686 is shown in Figure 17. For a desired
VCO
frequency,
the
loop
filter
values
can
be
calculated
using
the
following
equations.
Nominal PLL design parameters include:
Charge pump current:
iqp = 1 mA
VCO gain:
K
VCO
= 2
×
G
VCO
rad/A
PLL divide ratio
×
interpolation:
N = {2, 4, 8, 16, 32}
Phase detector gain:
K
d
= iqp
×
(2
N)
­1
A/rad
Let
Desired loop bandwidth =
d
Desired phase margin =
d
43
www.ti.com
C1
+ t
1 1
*
t
2
t
3
C2
+
t
1
* t
2
t
3
R
+
t
3
2
t
1(
t
3
* t
2)
t
1
+
K
d
K
VCO
w
2
d
(
tan
f
d
)
sec
f
d
)
t
2
+
1
w
d
(
tan
f
d
)
sec
f
d
)
t
3
+
tan
f
d
)
sec
f
d
w
d
H(s)
+
K
VCO
K
d
(1
)
sRC1)
s
3
RC1C2
)
s
2
(C1
)
C2)
f - Frequency - MHz
Gain - dB
0.01
0.1
1
100
10
60
40
20
0
-20
-40
-60
N = 2, 4, 8, 16, 32
-180
-160
-140
-120
-100
f - Frequency - MHz
Phase -
°
0.01
0.1
1
100
10
G005
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
DAC5686 EVALUATION BOARD (continued)
Then
where
Example:
d
= 70
°
,
d
= 1 MHz, G
VCO
= 300e6 MHz/A
N
R (
)
C1 (
µ
F)
C2 (pF)
2
43
0.02
670
4
86
0.01
335
8
173
0.005
167
16
346
0.002
84
32
692
0.001
42
The calculated phase margin and loop bandwidth can be verified by plotting the gain and phase of the open-loop
transfer function given by
Figure 51 shows the open-loop gain and phase for the DAC5686 evaluation-board loop filter.
Figure 51. Open-Loop Phase and Gain Plots for DAC5686 Evaluation Board
44
www.ti.com
f
err
+
Df
[1
) w
n
t
*
(
w
n
t)
2
]
e
*w
nt
phase step response
f
err
+
Dw
w
n
[
w
n
t
*
(
w
n
t)
2
]
e
*w
nt
frequency step response
0.0
0.2
0.4
0.6
0.8
1.0
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
t - Time -
µ
s
Normalized Phase Error
Response to a Frequency Step at Time 0
N = 2, 4, 8, 16, 32
Increasing N
G006
t - Time -
µ
s
-0.5
0.0
0.5
1.0
0.0
0.5
1.0
1.5
2.0
2.5
3.0
3.5
4.0
Normalized Phase Error
Response to a Phase Step at Time 0
N = 2, 4, 8, 16, 32
Increasing N
DAC5686
SLWS147B ­ APRIL 2003 ­ REVISED AUGUST 2004
The phase error (
err
) phase and frequency step responses are given by the following equations and are plotted
in Figure 52 for the DAC5686 evaluation-board loop filter.
Figure 52. Phase and Frequency Step Responses for DAC5686 Evaluation Board
45
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