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Part Number M96xG5115Ax0

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SGRAM MODULE
M965G5115AP(Q)0 / M966G5115AP(Q)0
The Samsung M965(6)G5115AP(Q)0 is a 512K bit x 64 Syn-
chronous Graphic RAM high density memory module. The
Samsung M965(6)G5115AP(Q)0 consists of two CMOS 512K
x 32 bit Synchronous Graphic RAMs in 100pin QFP packages
mounted on a 144pin glass-epoxy substrate. Five 0.1uF
decoupling capacitors are mounted on the printed circuit board
for each Synchronous GRAM. The M965(6)G5115AP(Q)0 is a
Small Outline Dual In-line Memory Module and is intended for
mounting into 144-pin edge connector sockets.
Synchronous design allows precise cycle control with the use
of system clock. I/O transactions are possible on every clock
cycle. Range of operating frequencies, programmable laten-
cies and burst lengths allows the same device to be useful for a
variety of high bandwidth, high performance memory system
applications.
FEATURE
GENERAL DESCRIPTION
M965G5115AP(Q)0 / M966G5115AP(Q)0 SGRAM SODIMM
512Kx64 SGRAM SODIMM based on 512Kx32, 2K Refresh, 3.3V Synchronous Graphic RAMs
SAMSUNG ELECTRONICS CO. Ltd. reserves the right to change products and specifications without notice.
·
Performance range
* M965(6)G5115AP0 : based on PQFP Component
M965(6)G5115AQ0 : based on TQFP Component
· Burst Mode Operation
· BLOCK-WRITE and Write-per-bit capability
· Independent byte operation via DQM0 ~ 7
· Auto & Self Refresh Capability (2048 cycles / 32ms)
· LVTTL compatible inputs and outputs
· Single 3.3V
±
0.3V power supply
· MRS cycle with address key programs.
CAS Latency (2, 3)
Burst Length (1, 2, 4, 8 & Full page)
Data Scramble (Sequential & Interleave)
· Optional Serial PD with EEPROM (M966G5115A)
· Resistor Strapping Options for speed and CAS Latency
· PCB : Height(1000mil), single sided components
Part NO.
Max. Freq. (t
CC
)
M965(6)G5115AP(Q)0-C50
200MHz (5ns)
M965(6)G5115AP(Q)0-C60
166MHz (6ns)
M965(6)G5115AP(Q)0-C70
143MHz (7ns)
M965(6)G5115AP(Q)0-C80
125MHz (8ns)
PIN NAMES
*
These pins are not used in this module.
**
These pins should be NC in the system
which does not support SPD.
Pin Name
Function
A0 ~ A9
Address Input(multiplexed)
BA(A10)
Bank Select Address
DQ0 ~ 63
Data Input / Output
CLK0, *CLK1 Clock Input
CKE
Clock Enable Input
CS0, *CS1
Chip Select Input
RAS
Row Address Strobe
CAS
Column Address Strobe
WE
Write Enable
DSF
Define Special Function
DQM0 ~ 7
DQM
V
DD
Power Supply (3.3V)
V
SS
Ground
**SDA
Serial Address Data I/O
**SBA
EEPROM Device Address
**SCL
Serial Clock
RSVD
Reserved
RFU
Reserved for future use
NC
No Connection
PIN CONFIGURATIONS (Front Side / Back Side)
Pin
Front
Pin
Back
Pin
Front
Pin
Back
Pin
Front
Pin
Back
1
3
5
7
9
11
13
15
17
19
21
23
25
27
29
31
33
35
37
39
41
43
45
47
49
V
SS
DQ63
DQ61
DQ59
DQ57
V
DD
DQ55
DQ53
DQ51
DQ49
V
SS
DQM7
DQM5
V
DD
DQ47
DQ45
DQ43
DQ41
V
SS
DQ39
DQ37
DQ35
DQ33
V
DD
RSVD
2
4
6
8
10
12
14
16
18
20
22
24
26
28
30
32
34
36
38
40
42
44
46
48
50
V
SS
DQ62
DQ60
DQ58
DQ56
V
DD
DQ54
DQ52
DQ50
DQ48
V
SS
DQM6
DQM4
V
DD
DQ46
DQ44
DQ42
DQ40
V
SS
DQ38
DQ36
DQ34
DQ32
V
DD
RSVD
Voltage Key
95
97
99
101
103
105
107
109
111
113
115
117
119
121
123
125
127
129
131
133
135
137
139
141
143
DQ31
DQ29
DQ27
DQ25
V
SS
DQ23
DQ21
DQ19
DQ17
V
DD
DQM3
DQM1
V
SS
DQ15
DQ13
DQ11
DQ9
V
DD
DQ7
DQ5
DQ3
DQ1
V
SS
**SDA
V
DD
96
98
100
102
104
106
108
110
112
114
116
118
120
122
124
126
128
130
132
134
136
138
140
142
144
DQ30
DQ28
DQ26
DQ24
V
SS
DQ22
DQ20
DQ18
DQ16
V
DD
DQM2
DQM0
V
SS
DQ14
DQ12
DQ10
DQ8
V
DD
DQ6
DQ4
DQ2
DQ0
V
SS
**SCL
V
DD
51
53
55
57
59
61
63
65
67
69
71
73
75
77
79
81
83
85
87
89
91
93
RSVD
RSVD
V
SS
DSF
RFU
RFU
V
DD
CS1
RAS
WE
V
SS
CLK1
V
DD
RSVD
RSVD
(A11)
BA(A10)
A7
V
SS
A5
A3
A1
V
DD
52
54
56
58
60
62
64
66
68
70
72
74
76
78
80
82
84
86
88
90
92
94
RSVD
RSVD
V
SS
RFU
RFU
**SBA
V
DD
CS0
CAS
CKE
V
SS
CLK0
V
DD
RSVD
A8
A9/AP
A6
V
SS
A4
A2
A0
V
DD
SGRAM MODULE
M965G5115AP(Q)0 / M966G5115AP(Q)0
PIN CONFIGURATION DESCRIPTION
Pin
Name
Input Function
CLK
System Clock
Active on the positive going edge to sample all inputs.
CS
Chip Select
Disables or enables device operation by masking or enabling all inputs except
CLK, CKE and DQM
CKE
Clock Enable
Masks system clock to freeze operation from the next clock cycle.
CKE should be enabled at least one clock + t
SS
prior to new command.
Disable input buffers for power down in standby.
A0 ~ A9
Address
Row / column addresses are multiplexed on the same pins.
Row address : RA0 ~ RA9, column address : CA0 ~ CA7
BA(A10)
Bank Select Address
Selects bank to be activated during row address latch time.
Selects bank for read/write during column address latch time.
RAS
Row Address Strobe
Latches row addresses on the positive going edge of the CLK with RAS low.
Enables row access & precharge.
CAS
Column Address Strobe
Latches column addresses on the positive going edge of the CLK with CAS low.
Enables column access.
WE
Write Enable
Enables write operation and row precharge.
Latches data in starting from CAS, WE active.
DQM0 ~ 7
Data Input/Output Mask
Makes data output Hi-Z, t
SHZ
after the clock and masks the output.
Blocks data input when DQM active. (Byte masking)
DQ0 ~ 63
Data Input/Output
Data inputs/outputs are multiplexed on the same pins.
DSF
Define Special Function
Enables write per bit, block write and special mode register set.
V
DD
/V
SS
Power Supply/Ground
Power and ground for the input buffers and the core logic.
Three resistor straps are used to indicate the synchronous clock frequency (period) and memory timing.Timing information
for each clock frequency is indicated in the section titled AC CHARATERISTICS.
Clock Frequency and Memory Timing
CAS Latency
Cycle Time
DQ30
DQ29
8ns
1
0
7ns
1
1
6ns
0
0
5ns
0
1
CAS Latency
DQ31
3
0
2 and 3
1
RESISTOR STRAPPING OPTIONS
SGRAM MODULE
M965G5115AP(Q)0 / M966G5115AP(Q)0
DQ0
DQ7
FUNCTIONAL BLOCK DIAGRAM
V
DD
Vss
Five 0.1uF Capacitors
per SGRAM device
To all SGRAMs
CKE
DSF
RAS
CAS
WE
U0 to U1
U0 to U1
U0 to U1
U0 to U1
U0 to U1
CLK0
0
CS0
DQ0
DQ7
U0
DQM0
DQM0
DQ8
DQ15
DQ8
DQ15
DQM1
DQM1
DQ16
DQ23
DQ16
DQ23
DQM2
DQM2
DQ24
DQ31
DQ24
DQ31
DQM3
DQM3
DQ32
DQ39
DQ0
DQ7
U1
DQM0
DQM4
DQ40
DQ47
DQ8
DQ15
DQM1
DQM5
DQ48
DQ55
DQ16
DQ23
DQM2
DQM6
DQ56
DQ63
DQ24
DQ31
DQM3
DQM7
BA(A10)
A(9:0)
U0 to U1
U0 to U1
.
.
.
U0, U1
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
·
Serial PD
SDA
SCL
A1
A2
A0
SBA
V
SS
·
* Serial PD is optional
SGRAM MODULE
M965G5115AP(Q)0 / M966G5115AP(Q)0
ABSOLUTE MAXIMUM RATINGS
(Voltages referenced to
V
SS
)
Parameter
Symbol
Value
Unit
Voltage on any pin relative to Vss V
IN
, V
OUT
-1.0 ~ 4.6 V
Voltage on V
DD
supply relative to Vss V
DD
-1.0 ~ 4.6 V
Storage temperature T
STG
-55 ~ +150
°
C
Power dissipation P
D
2 W
Short circuit current I
OS
50 mA
Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded.
Functional operation should be restricted to recommended operating condition.
Exposure to higher than recommended voltage for extended periods of time could affect device reliability.
DC OPERATING CONDITIONS
Recommended operating conditions (Voltage referenced to V
SS
= 0V)
Parameter
Symbol
Min
Typ
Max
Unit
Note
Supply voltage V
DD
3.0 3.3 3.6 V 4
Input high voltage V
IH
2.0 3.0 V
DD
+0.3 V
Input low voltage V
IL
-0.3 0 0.8 V Note 1
Output high voltage V
OH
2.4 - - V I
OH
= -2mA
Output low voltage V
OL
- - 0.4 V I
OL
= 2mA
Input leakage current I
LI
-20 - 20 uA Note 2
Output leakage current I
LO
-10 - 10 uA Note 3
Output loading conditon See Figure 1
1. V
IL
(min.) = -1.5V AC (pulse width
5ns)
2. Any input 0V
V
IN
V
DD
+ 0.3V, all other pins are not under test = 0V.
3. Dout is disabled, 0V
V
OUT
V
DD
4. The VDD condition of M965(6)G5115AP(Q)0-C50/60 is 3.135V~3.6V.
Note :
CAPACITANCE
(V
CC
= 3.3V, T
A
= 25
°
C, f = 1MHz)
Parameter
Symbol
Min
Max
Unit
Input capacitance (A0 ~ A9, BA)
Input capacitance (RAS, CAS, WE, CKE, DSF)
Input capacitance (CLK0)
Input capacitance (CS0)
Input capacitance (DQM0 ~ DQM7)
Data input/output capacitance (DQ0 ~ DQ63)
C
IN1
C
IN2
C
IN3
C
IN4
C
IN5
C
OUT
-
-
-
-
-
-
18
18
18
18
14
15
pF
pF
pF
pF
pF
pF
Note :
SGRAM MODULE
M965G5115AP(Q)0 / M966G5115AP(Q)0
DC CHARACTERISTICS
Note : 1. Unless otherwise notes, Input level is CMOS(V
IH
/V
IL
=V
DDQ
/V
SSQ
) in LVTTL.
2. Measured with outputs open. Address are changed only one time during tcc(min).
3. Refresh period is 32ms. Address are changed only one time during tcc(min).
(Recommended operating condition unless otherwise noted, T
A
= 0 to 70
°
C, V
IH(min)
/V
IL(max)
=2.0V/0.8V)
Parameter
Symbol
Test Condition
CAS
Latency
Speed
Unit Note
-50
-60
-70
-80
Operating Current
(One Bank Active)
I
CC1
Burst Length =1
t
RC
t
RC
(min), t
CC
t
CC
(min), I
o
= 0mA
3
400
360
320
300
mA
2
2
-
-
-
300
Precharge Standby Current
in power-down mode
I
CC2
P
CKE
V
IL
(max), t
CC
= 15ns
4
mA
I
CC2
PS
CKE
&
CLK
V
IL
(max), t
CC
=
4
Precharge Standby Current
in non power-down mode
I
CC2
N
CKE
V
IH
(min), CS
V
IH
(min), t
CC
= 15ns
Input signals are changed one time during 30ns
60
mA
I
CC2
NS
CKE
V
IH
(min), CLK
V
IL
(max), t
CC
=
Input signals are stable
30
Active Standby Current
in power-down mode
I
CC3
P
CKE
V
IL
(max), t
CC
= 15ns
6
mA
I
CC3
PS
CKE
V
IL
(max), t
CC
=
6
Active Standby Current
in non power-down mode
(One Bank Active)
I
CC3
N
CKE
V
IH
(min), CS
V
IH
(min), t
CC
= 15ns
Input signals are changed one time during 30ns
100
mA
I
CC3
NS
CKE
V
IH
(min), CLK
V
IL
(max), t
CC
=
Input signals are stable
60
Operating Current
(Burst Mode)
I
CC4
I
o
= 0 mA, Page Burst
All bank Activated, t
CCD
= t
CCD
(min)
3
540
520
460
400
mA
2
2
-
-
-
320
Refresh Current
I
CC5
t
RC
t
RC
(min)
3
400
360
320
300
mA
3
2
-
-
-
300
Self Refresh Current
I
CC6
CKE
0.2V
4
mA
Operating Current
(One Bank Block Write)
I
CC7
t
CC
t
CC
(min), I
o
=0mA, t
BWC
(min)
460
400
340
300
mA