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Part Number NB4N840M

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© Semiconductor Components Industries, LLC, 2005
September, 2005 - Rev. 0
1
Publication Order Number:
NB4N840M/D
NB4N840M
3.3V 2.7Gb/s Dual
Differential Clock/Data 2 x 2
Crosspoint Switch with
CML Output and Internal
Termination
Description
The NB4N840M is a high-bandwidth fully differential dual
2 x 2 crosspoint switch with CML inputs/outputs that is suitable for
applications such as SDH/SONET DWDM and high speed switching.
Fully differential design techniques are used to minimize jitter
accumulation, crosstalk, and signal skew, which make this device
ideal for loop-through and protection channel switching applications.
Each 2 x 2 crosspoint switch can fan-out and/or multiplex up to
2.7 Gb/s data and 2.7 GHz clock signals.
Internally terminated differential CML inputs accept AC-coupled
LVPECL (Positive ECL) or direct coupled CML signals. By providing
internal 50
W input and output termination resistor, the need for
external components is eliminated and interface reflections are
minimized. Differential 16 mA CML outputs provide matching
internal 50
W terminations, and 400 mV output swings when
externally terminated, 50
W to V
CC
.
Single-ended LVCMOS/LVTTL SEL inputs control the routing of
the signals through the crosspoint switch which makes this device
configurable as 1:2 fan-out, repeater or 2 x 2 crosspoint switch. The
device is housed in a low profile 5 x 5 mm 32-pin QFN package.
Features
·
Plug-in compatible to the MAX3840 and SY55859L
·
Maximum Input Clock Frequency 2.7 GHz
·
Maximum Input Data Frequency 2.7 Gb/s
·
225 ps Typical Propagation Delay
·
80 ps Typical Rise and Fall Times
·
7 ps Channel to Channel Skew
·
430 mW Power Consumption
·
< 0.5 ps RMS Jitter
·
7 ps Peak-to-Peak Data Dependent Jitter
·
Power Saving Feature with Disabled Outputs
·
Operating Range: V
CC
= 3.0 V to 3.6 V with V
EE
= 0 V
·
CML Output Level (400 mV Peak-to-Peak Output), Differential
Output
·
These are Pb-Free Devices
QFN32
MN SUFFIX
CASE 488AM
See detailed ordering and shipping information on page 8 of
this data sheet.
ORDERING INFORMATION
MARKING
DIAGRAM
http://onsemi.com
32
1
NB4N
840M
ALYWG
1
A
= Assembly Location
WL
= Wafer Lot
YY
= Year
WW
= Work Week
G
= Pb-Free Package
CML
CML
CML
CML
CML
CML
CML
CML
0
1
0
1
0
1
0
1
Figure 1. Functional Block Diagram
QA0
QA0
ENA0
SELA0
QA1
QA1
ENA1
SELA1
QB0
QB0
ENB0
SELB0
QB1
QB1
ENB1
SELB1
DA0
DA0
DA1
DA1
DB0
DB0
DB1
DB1
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Table 1. TRUTH TABLE
SELA0/SELB0
SELA1/SELB1
ENA0/ENA1 ENA1/ENB1
QA0/QB0
QA1/QB1
Function
L
L
H
H
DA0/DB0
DA0/DB0
1:2 Fanout
L
H
H
H
DA0/DB0
DA1/DB1
Quad Repeater
H
L
H
H
DA1/DB1
DA0/DB0
Crosspoint Switch
H
H
H
H
DA1/DB1
DA1/DB1
1:2 Fanout
X
X
L
L
Disable/Power Down Disable/Power Down
No output (@ V
CC
)
Figure 2. Pin Configuration (Top View)
32
31
30
29
28
27
26
25
9
10
11
12
13
14
15
16
1
2
3
4
5
6
7
8
24
23
22
21
20
19
18
17
ENB1
SELB1
DB1
DB1
DB0
ENB0
SELB0
DB0
GND
V
CC
QA0
QA1
QA1
V
CC
QA0
V
CC
GND
V
CC
V
CC
QB0
QB0
QB1
QB1
V
CC
ENA1
DA1
DA1
DA0
DA0
ENA0
SELA0
SELA1
NB4N840M
NB4N840M
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Table 2. PIN DESCRIPTION
Pin
Name
I/O
Description
1
ENB1
LVTTL
Channel B1 Output Enable. LVTTL low input powers down B1 output stage.
2
DB1
CML Input
Channel B1 Positive Signal Input
3
DB1
CML Input
Channel B1 Negative Signal Input
4
ENB0
LVTTL
Channel B0 Output Enable. LVTTL low input powers down B0 output stage.
5
SELB0
LVTTL
Channel B0 Output Select. See Table 1.
6
DB0
CML Input
Channel B0 Positive Signal Input
7
DB0
CML Input
Channel B0 Negative Signal Input
8
SELB1
LVTTL
Channel B1 Output Select. See Table 1.
9,24
GND
-
Supply Ground. All GND pins must be externally connected to power supply to guarantee
proper operation.
10, 13, 16,
17, 20, 23
V
CC
-
Positive Supply. All V
CC
pins must be externally connected to power supply to guarantee
proper operation.
11
QB0
CML Output
Channel B0 Negative Output.
12
QB0
CML Output
Channel B0 Positive Output.
14
QB1
CML Output
Channel B1 Negative Output.
15
QB1
CML Output
Channel B1 Positive Output.
18
QA1
CML Output
Channel A1 Negative Output.
19
QA1
CML Output
Channel A1 Positive Output.
21
QA0
CML Output
Channel A0 Negative Output.
22
QA0
CML Output
Channel A0 Positive Output.
25
SELA1
LVTTL
Channel A1 Output Select, LVTTL Input. See Table 1.
26
DA0
CML Input
Channel A0 Positive Signal Input.
27
DA0
CML Input
Channel A0 Negative Signal Input.
28
SELA0
LVTTL
Channel A0 Output Select, LVTTL Input. See Table 1.
29
ENA0
LVTTL
Channel A0 Output Enable. LVTTL low input powers down A0 output stage.
30
DA1
CML Input
Channel A1 Positive Signal Input.
31
DA1
CML Input
Channel A1 Negative Signal Input.
32
ENA1
LVTTL
Channel A1 Output Enable. LVTTL low input powers down A1 output stage.
-
EP
GND
Exposed Pad. The thermally exposed pad (EP) on package bottom (see case drawing)
must be attached to a heat-sinking conduit. The exposed pad must be soldered to the
circuit board GND for proper electrical and thermal operation.
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Table 3. ATTRIBUTES
Characteristics
Value
ESD Protection
Human Body Model
Machine Model
> 2000 V
> 110 V
Moisture Sensitivity (Note 1)
QFN-32
Level 1
Flammability Rating
Oxygen Index: 28 to 34
UL 94 V-0 @ 0.125 in
Transistor Count
380
Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
1. For additional information, refer to Application Note AND8003/D.
Table 4. MAXIMUM RATINGS
Symbol
Parameter
Condition 1
Condition 2
Rating
Unit
V
CC
Positive Power Supply
GND = 0 V
3.8
V
V
I
Positive Input
GND = 0 V
GND = V
I
= V
CC
3.8
V
V
INPP
Differential Input Voltage
|D - D|
3.8
V
I
IN
Input Current Through Internal 50 W Resistor
Static
Surge
45
80
mA
mA
I
OUT
Output Current
Continuous
Surge
25
80
mA
mA
T
A
Operating Temperature Range
QFN-32
-40 to +85
°C
T
stg
Storage Temperature Range
-65 to +150
°C
q
JA
Thermal Resistance (Junction-to-Ambient)
(Note 2)
0 lfpm
500 lfpm
QFN-32
QFN-32
31
27
°C/W
°C/W
q
JC
Thermal Resistance (Junction-to-Case)
2S2P (Note 3)
QFN-32
12
°C/W
T
sol
Wave Solder
Pb-Free <3 sec @ 260 C
260
°C
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit
values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,
damage may occur and reliability may be affected.
2. JEDEC standard 51-6, multilayer board - 2S2P (2 signal, 2 power).
3. JEDEC standard multilayer board - 2S2P (2 signal, 2 power) with 8 filled thermal vias under exposed pad.
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Table 5. DC CHARACTERISTICS, CLOCK INPUTS, CML OUTPUTS
V
CC
= 3.0 V to 3.6 V, T
A
= -40°C to +85°C
Symbol
Characteristic
Min
Typ
Max
Unit
I
CC
Power Supply Current (All outputs enabled)
130
170
mA
Vout
diff
CML Differential Output Swing (Note 4, Figures 5 and 12)
640
800
1000
mV
V
CMR
(Note 6)
CML Output Common Mode Voltage (Loaded 50 W to V
CC
)
V
CC
- 200
mV
CML Single-Ended Input Voltage Range
V
CC
- 0.8
V
CC
+ 0.4
mV
V
ID
Differential Input Voltage (V
IHD
- V
ILD
)
300
1600
mV
LVTTL CONTROL INPUT PINS
V
IH
Input HIGH Voltage (LVTTL Inputs)
2000
mV
V
IL
Input LOW Voltage (LVTTL Inputs)
800
mV
I
IH
Input HIGH Current (LVTTL Inputs)
-10
10
mA
I
IL
Input LOW Current (LVTTL Inputs)
-10
10
mA
R
TIN
CML Single-Ended Input Resistance
42.5
50
57.5
W
R
TOUT
Differential Output Resistance
85
100
115
W
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
4. CML outputs require 50 W receiver termination resistors to V
CC
for proper operation (Figure 10).
5. Input and output parameters vary 1:1 with V
CC
.
6. V
CMR
min varies 1:1 with V
EE
, V
CMR
max varies 1:1 with V
CC
.
Table 6. AC CHARACTERISTICS
V
CC
= 3.0 V to 3.6 V, V
EE
= 0 V (Note 7, Figure 9)
Symbol
Characteristic
-40°C
25°C
85°C
Unit
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
V
OUTPP
Output Voltage Amplitude (@ V
INPPmin
) f
in
2 GHz
(See Figure 3)
f
in
3 GHz
f
in
3.5 GHz
280
235
170
365
310
220
280
235
170
365
310
220
280
235
170
365
310
220
mV
f
DATA
Maximum Operating Data Rate
2.7
3.2
2.7
3.2
2.7
3.2
Gb/s
t
PLH
,
t
PHL
Propagation Delay to Output Differential
D/D to Q/Q
140
225
340
140
225
340
140
225
340
ps
t
SKEW
Duty Cycle Skew (Note 8)
Within-Device Skew (Figure 4)
Device-to-Device Skew (Note 12)
5
5
20
25
25
85
5
5
20
25
25
85
5
5
20
25
25
85
ps
t
JITTER
RMS Random Clock Jitter (Note 10) f
in
v 3.2 GHz
Peak-to-Peak Data Dependent Jitter f
in
= 2.5 Gb/s
(Note 11)
f
in
= 3.2 Gb/s
0.15
7
7
0.5
20
20
0.15
7
7
0.5
20
20
0.15
7
7
0.5
20
20
ps
Crosstalk-Induced RMS Jitter (Note 13)
0.5
0.5
0.5
ps
V
INPP
Input Voltage Swing/Sensitivity
(Differential Configuration) (Note 9)
150
800
150
800
150
800
mV
t
r
t
f
Output Rise/Fall Times @ 0.5 GHz
Q, Q
(20% - 80%)
80
135
80
135
80
135
ps
NOTE: Device will meet the specifications after thermal equilibrium has been established when mounted in a test socket or printed circuit
board with maintained transverse airflow greater than 500 lfpm. Electrical parameters are guaranteed only over the declared
operating temperature range. Functional operation of the device exceeding these conditions is not implied. Device specification limit
values are applied individually under normal operating conditions and not valid simultaneously.
7. Measured by forcing V
INPP
(MIN) from a 50% duty cycle clock source. All loading with an external R
L
= 50 W to V
CC
. Input edge rates 40 ps
(20% - 80%).
8. Duty cycle skew is measured between differential outputs using the deviations of the sum of Tpw- and Tpw+ @ 0.5 GHz.
9. V
INPP
(MAX) cannot exceed 800 mV. Input voltage swing is a single-ended measurement operating in differential mode.
10.Additive RMS jitter using 50% duty cycle clock input signal.
11. Additive peak-to-peak data dependent jitter using input data pattern with PRBS 2
23
-1 and K28.5, V
INPP
= 400 mV.
12.Device to device skew is measured between outputs under identical transition @ 0.5 GHz.
13.Data taken on the same device under identical condition.
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Figure 3. Output Voltage Amplitude (V
OUTPP
)
vs. Input Clock Frequency (f
IN
) at Ambient
Temperature (Typ)
0
50
100
150
200
250
300
350
400
450
0.05 0.5
1
1.5 2
2.5
3
3.5
4
4.5
5
INPUT CLOCK FREQUENCY (GHz)
OUTPUT
VOL
T
AGE AMPLITUDE (mV)
Figure 4. Within-Device Skew vs. Temperature
at V
CC
= 3.3 V
0
2
4
6
8
10
12
14
16
18
20
-40
25
85
TEMPERATURE (°C)
TIME (ps)
Channel B
Channel A
Figure 5. CML Differential Voltage vs.
Temperature
0
100
200
300
400
500
600
700
800
900
-40
25
85
TEMPERATURE (°C)
VOL
T
AGE (mV)
Figure 6. Supply Current vs. Temperature
(All 4 Outputs Enabled)
110
120
130
140
150
160
170
-40
25
85
TEMPERATURE (°C)
CURRENT (mA)
Figure 7. Typical Output Waveform at 2.488 Gb/s
with PRBS 2
23
-1 (Input Signal DDJ = 12 ps)
Figure 8. Typical Output Waveform at 3.2 Gb/s
with K28.5 (Input Signal DDJ = 14 ps)
TIME (80.4 ps/div)
VOL
T
AGE (50 mV/div)
TIME (62.5 ps/div)
VOL
T
AGE (50 mV/div)
DDJ = 4 ps
DDJ = 3 ps
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Figure 9. AC Reference Measurement
Dx
Dx
Qx
Qx
t
PHL
t
PLH
V
INPP
= V
IH
(D
X
) - V
IL
(D
X
)
V
OUTPP
= V
OH
(Q
X
) - V
OL
(Q
X
)
Figure 10. Typical Termination for Output Driver and Device Evaluation
(See Application Note AND8057/D)
Driver
Device
Receiver
Device
Q
D
Q
D
Z
o
= 50 W
Z
o
= 50 W
50 W
50 W
V
CC
Q
X
Q
X
V
CC
16 mA
50 W
50 W
Figure 11. CML Input and Output Structure
GND
V
CC
50 W
GND
GND
D
X
D
X
50 W
Input
Output
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8
(Q
X
- Q
X
)
640 mV
MIN
320 mV
MIN
500 mV
MAX
1000 mV
MAX
Q
X
Q
X
Figure 12. CML Output Levels
Q
X
Q
X
(Q
X
- Q
X
)
ORDERING INFORMATION
Device
Package
Shipping
NB4N840MMNG
QFN32
(Pb-Free)
74 Units / Tray
NB4N840MMNR4G
QFN32
(Pb-Free)
1000 / Tape & Reel
For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging
Specifications Brochure, BRD8011/D.
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PACKAGE DIMENSIONS
QFN32 5*5*1 0.5 P
CASE 488AM-01
ISSUE O
SEATING
32 X
K
0.15 C
(A3)
A
A1
D2
b
1
9
16
17
32
2 X
2 X
E2
32 X
8
24
32 X
L
32 X
BOTTOM VIEW
EXPOSED PAD
TOP VIEW
SIDE VIEW
D
A
B
E
0.15 C
ÉÉ
ÉÉ
PIN ONE
LOCATION
0.10 C
0.08 C
C
25
e
A
0.10
B
C
0.05 C
NOTES:
1. DIMENSIONS AND TOLERANCING PER
ASME Y14.5M, 1994.
2. CONTROLLING DIMENSION: MILLIMETERS.
3. DIMENSION b APPLIES TO PLATED
TERMINAL AND IS MEASURED BETWEEN
0.25 AND 0.30 MM TERMINAL
4. COPLANARITY APPLIES TO THE EXPOSED
PAD AS WELL AS THE TERMINALS.
PLANE
DIM MIN
NOM
MAX
MILLIMETERS
A
0.800 0.900 1.000
A1
0.000 0.025 0.050
A3
0.200 REF
b
0.180 0.250 0.300
D
5.00 BSC
D2
2.950 3.100 3.250
E
5.00 BSC
E2
e
0.500 BSC
K
0.200
---
---
L
0.300 0.400 0.500
2.950 3.100 3.250
*For additional information on our Pb-Free strategy and soldering
details, please download the ON Semiconductor Soldering and
Mounting Techniques Reference Manual, SOLDERRM/D.
SOLDERING FOOTPRINT*
0.50 PITCH
3.20
0.28
3.20
32 X
28 X
0.63
32 X
5.30
5.30
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to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability
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"Typical" parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All
operating parameters, including "Typicals" must be validated for each customer application by customer's technical experts. SCILLC does not convey any license under its patent rights
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Phone: 81-3-5773-3850
NB4N840M/D
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