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Part Number 2SK3080

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2SK3080
Silicon N Channel MOS FET
High Speed Power Switching
ADE-208-635A (Z)
2nd. Edition
May 1998
Features
·
Low on-resistance
R
DS(on)
= 20 m
typ. (V
GS
= 10V, I
D
= 15 A)
·
4V gate drive devices.
·
High speed switching
Outline
TO­220AB
1
2
3
1. Gate
2. Drain(Flange)
3. Source
D
G
S
2SK3080
2
Absolute Maximum Ratings (Ta = 25
°
C)
Item
Symbol
Ratings
Unit
Drain to source voltage
V
DSS
30
V
Gate to source voltage
V
GSS
±
20
V
Drain current
I
D
30
A
Drain peak current
I
D(pulse)
Note1
120
A
Body-drain diode reverse drain current I
DR
30
A
Channel dissipation
Pch
Note2
50
W
Channel temperature
Tch
150
°
C
Storage temperature
Tstg
­55 to +150
°
C
Note:
1. PW
10
µ
s, duty cycle
1 %
2. Value at Tc = 25
°
C
Electrical Characteristics (Ta = 25
°
C)
Item
Symbol Min
Typ
Max
Unit
Test Conditions
Drain to source breakdown voltage V
(BR)DSS
30
--
--
V
I
D
= 10mA, V
GS
= 0
Gate to source breakdown voltage V
(BR)GSS
±
20
--
--
V
I
G
=
±
100
µ
A, V
DS
= 0
Zero gate voltege drain current
I
DSS
--
--
10
µ
A
V
DS
= 30 V, V
GS
= 0
Gate to source leak current
I
GSS
--
--
±
10
µ
A
V
GS
=
±
16V, V
DS
= 0
Gate to source cutoff voltage
V
GS(off)
1.0
--
2.0
V
I
D
= 1mA, V
DS
= 10V
Static drain to source on state
resistance
R
DS(on)
--
20
28
m
I
D
= 15A, V
GS
= 10V
Note3
Static drain to source on state
resistance
R
DS(on)
--
35
50
m
I
D
= 15A, V
GS
= 4V
Note3
Forward transfer admittance
|y
fs
|
12
18
--
S
I
D
= 15A, V
DS
= 10V
Note3
Input capacitance
Ciss
--
750
--
pF
V
DS
= 10V
Output capacitance
Coss
--
520
--
pF
V
GS
= 0
Reverse transfer capacitance
Crss
--
210
--
pF
f = 1MHz
Turn-on delay time
t
d(on)
--
16
--
ns
V
GS
= 10V, I
D
= 15A
Rise time
t
r
--
260
--
ns
R
L
= 0.67
Turn-off delay time
t
d(off)
--
85
--
ns
Fall time
t
f
--
90
--
ns
Body­drain diode forward voltage
V
DF
--
1.0
--
V
I
F
= 30A, V
GS
= 0
Body­drain diode reverse
recovery time
t
rr
--
45
--
ns
I
F
= 30A, V
GS
= 0
diF/ dt =50A/
µ
s
Note:
3. Pulse test
2SK3080
3
Main Characteristics
100
75
50
25
0
50
100
150
200
500
200
100
20
50
10
2
5
1
0.5
0.1
0.3
1
3
10
30
100
50
40
30
20
10
0
2
4
6
8
10
50
40
30
20
10
0
2
4
6
8
10
3.5 V
4 V
5 V
10 V
V = 3 V
GS
6 V
4.5 V
Tc = 75°C
25°C
­25°C
Ta = 25 °C
100 µs
1 ms
PW = 10 ms (1shot)
DC Operation (Tc = 25°C)
10 µs
Channel Dissipation Pch (W)
Case Temperature Tc (°C)
Power vs. Temperature Derating
Drain to Source Voltage V (V)
DS
Drain Current I (A)
D
Maximum Safe Operation Area
Drain to Source Voltage V (V)
DS
Drain Current I (A)
D
Typical Output Characteristics
Gate to Source Voltage V (V)
GS
Drain Current I (A)
D
Typical Transfer Characteristics
Operation in
this area is
limited by R
DS(on)
V = 10 V
Pulse Test
DS
Pulse Test
2SK3080
4
1.0
0.8
0.6
0.4
0.2
0
4
8
12
16
20
1
10
100
2
50
500
200
100
20
50
10
5
100
80
60
40
20
­40
0
40
80
120
160
0
0.1
0.3
1
3
10
30
100
100
30
3
10
0.3
1
0.1
I = 20 A
D
5 A
10 A
20
5
V = 4 V
GS
10 V
I = 20 A
D
V = 4 V
GS
10 V
5, 10 A
5, 10, 20 A
25 °C
Tc = ­25 °C
75 °C
Gate to Source Voltage V (V)
GS
Drain to Source Saturation Voltage vs.
Gate to Source Voltage
V (V)
DS(on)
Drain to Source Saturation Voltage
Drain Current I (A)
D
Drain to Source On State Resistance
R (m )
DS(on)
Static Drain to Source on State Resistance
vs. Drain Current
Case Temperature Tc (°C)
R (m )
DS(on)
Static Drain to Source on State Resistance
Static Drain to Source on State Resistance
vs. Temperature
Drain Current I (A)
D
Forward Transfer Admittance |y | (S)
fs
Forward Transfer Admittance vs.
Drain Current
Pulse Test
Pulse Test
V = 10 V
Pulse Test
DS
Pulse Test
2SK3080
5
0.1
0.3
1
3
10
30
100
0
10
20
30
40
50
10000
2000
5000
1000
100
200
500
50
40
30
20
10
0
20
16
12
8
4
8
16
24
32
40
0
1000
300
30
100
3
10
1
di / dt = 50 A / µs
V = 0, Ta = 25 °C
GS
V = 0
f = 1 MHz
GS
Ciss
Coss
Crss
V = 5 V
10 V
25 V
DD
I = 30 A
D
V
GS
V
DS
V = 25 V
10 V
5 V
DD
1000
300
30
100
3
10
1
0.1
0.3
1
3
10
30
100
V = 10 V, V = 10 V
PW = 5 µs, duty < 1 %
GS
DD
t f
r
t
d(on)
t
d(off)
t
Reverse Drain Current I (A)
DR
Reverse Recovery Time trr (ns)
Body­Drain Diode Reverse
Recovery Time
Capacitance C (pF)
Drain to Source Voltage V (V)
DS
Typical Capacitance vs.
Drain to Source Voltage
Gate Charge Qg (nc)
Drain to Source Voltage V (V)
DS
Gate to Source Voltage V (V)
GS
Dynamic Input Characteristics
Drain Current I (A)
D
Switching Time t (ns)
Switching Characteristics
2SK3080
6
50
40
30
20
10
0
0.4
0.8
1.2
1.6
2.0
V = 0, ­5 V
GS
10 V
5 V
3
1
0.3
0.1
0.03
0.01
10 µ
100 µ
1 m
10 m
100 m
1
10
DM
P
PW
T
D =
PW
T
ch ­ c(t) = s (t) · ch ­ c
ch ­ c = 2.5 °C/W, Tc = 25 °C

Tc = 25°C
D = 1
0.5
0.2
0.1
0.05
0.02
0.01
1shot pulse
Source to Drain Voltage V (V)
SD
Reverse Drain Current I (A)
DR
Reverse Drain Current vs.
Source to Drain Voltage
Pulse Width PW (S)
Normalized Transient Thermal Impedance
s (t)
Normalized Transient Thermal Impedance vs. Pulse Width
Pulse Test
2SK3080
7
Vin Monitor
D.U.T.
Vin
10 V
R
L
V
= 10 V
DD
tr
td(on)
Vin
90%
90%
10%
10%
Vout
td(off)
Vout
Monitor
50
90%
10%
t
f
Switching Time Test Circuit
Waveform
2SK3080
8
Package Dimensions
Unit: mm
10.16±0.2
9.5
8.0
1.26±0.15
2.7 max
1.5 max
0.76 ±0.1
2.54 ±0.5
1.27
18.5 ±0.5
7.8 ±0.5
f 3.6
+ 0.1
­ 0.08
Hitachi Code
EIAJ
JEDEC
TO­220AB
SC­46
--
1.27±0.1
1.2±0.1
15.0 ±0.3
6.4
+ 0.2
­ 0.1
2.79 ±0.2
0.5±0.1
14.0 ±0.5
2.54 ±0.5
4.44±0.2
Cautions
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received the latest product standards or specifications before final design, purchase or use.
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contact Hitachi's sales office before using the product in an application that demands especially high
quality and reliability or where its failure or malfunction may directly threaten human life or cause risk
of bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation,
traffic, safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly
for maximum rating, operating supply voltage range, heat radiation characteristics, installation
conditions and other characteristics. Hitachi bears no responsibility for failure or damage when used
beyond the guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable
failure rates or failure modes in semiconductor devices and employ systemic measures such as fail-
safes, so that the equipment incorporating Hitachi product does not cause bodily injury, fire or other
consequential damage due to operation of the Hitachi product.
5. This product is not designed to be radiation resistant.
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7. Contact Hitachi's sales office for any questions regarding this document or Hitachi semiconductor
products.
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