ChipFind - Datasheet

Part Number CY7C346

Download:  PDF   ZIP
128-Macrocell MAX
®
EPLD
CY7C346
USE ULTRA37000
TM
FOR
ALL NEW DESIGNS
Cypress Semiconductor Corporation
·
3901 North First Street
·
San Jose
,
CA 95134
·
408-943-2600
Document #: 38-03005 Rev. *B
Revised April 19, 2004
Features
· 128 macrocells in eight logic array blocks (LABs)
· 20 dedicated inputs, up to 64 bidirectional I/O pins
· Programmable interconnect array
· 0.8-micron double-metal CMOS EPROM technology
· Available in 84-pin CLCC, PLCC, and 100-pin PGA,
PQFP
Functional Description
The CY7C346 is an Erasable Programmable Logic Device
(EPLD) in which CMOS EPROM cells are used to configure
logic functions within the device. The MAX
®
architecture is
100% user-configurable, allowing the device to accommodate
a variety of independent logic functions.
The 128 macrocells in the CY7C346 are divided into eight
LABs, 16 per LAB. There are 256 expander product terms, 32
per LAB, to be used and shared by the macrocells within each
LAB.
Each LAB is interconnected through the programmable inter-
connect array, allowing all signals to be routed throughout the
chip.
The speed and density of the CY7C346 allow it to be used in
a wide range of applications, from replacement of large
amounts of 7400-series TTL logic, to complex controllers and
multifunction chips. With greater than 25 times the functionality
of 20-pin PLDs, the CY7C346 allows the replacement of over
50 TTL devices. By replacing large amounts of logic, the
CY7C346 reduces board space, part count, and increases
system reliability.
MACROCELL 49
MACROCELL 50
MACROCELL 51
MACROCELL 52
MACROCELL 53
MACROCELL 54
MACROCELL 55
MACROCELL 56
MACROCELL 33
MACROCELL 34
MACROCELL 35
MACROCELL 36
MACROCELL 37
MACROCELL 38
MACROCELL 39
MACROCELL 40
MACROCELL 104
MACROCELL 103
MACROCELL 102
MACROCELL 101
MACROCELL 100
MACROCELL 99
MACROCELL 98
MACROCELL 97
MACROCELL 120
MACROCELL 119
MACROCELL 118
MACROCELL 117
MACROCELL 116
MACROCELL 115
MACROCELL 114
MACROCELL 113
MACROCELL 1
MACROCELL 2
MACROCELL 3
MACROCELL 4
MACROCELL 5
MACROCELL 6
MACROCELL 7
MACROCELL 8
MACROCELL 17
MACROCELL 18
MACROCELL 19
MACROCELL 20
MACROCELL 21
MACROCELL 22
MACROCELL 23
MACROCELL 24
Logic Block Diagram
MACROCELL 88
MACROCELL 87
MACROCELL 86
MACROCELL 85
MACROCELL 84
MACROCELL 83
MACROCELL 82
MACROCELL 81
MACROCELL 121­128
MACROCELL 105­112
MACROCELL 86­96
MACROCELL 41­48
MACROCELL 25­32
MACROCELL 9­16
SYSTEM CLOCK
P
I
A
INPUT [59] (N4)
36
.
INPUT [60] (M5)
37
.
INPUT [61] (N5)
38
.
INPUT [64] (N6)
41
.
INPUT [65] (M7)
42
.
INPUT [66] (L7)
43
.
INPUT [67] (N7)
44
.
INPUT [70] (L8)
47
.
INPUT [71] (N9)
48
.
INPUT [72] (M9)
49
.
[100] (C13) NC
[99] (D12) NC
[98] (D13) 77
[97] (E12) 76
[96] (E13) 75
[95] (F11) 74
[92] (G13) 73
[91] (G11) 72
[90] (G12) NC
[89] (H13) NC
[86] (J13) 71
[85] (J12) 70
[84] (K13) 69
[83] (K12) 68
[82] (L13) 67
[81] (L12) 64
[80] (M13) NC
[79] (M12) NC
[78] (N13) 63
[77] (M11) 60
[76] (N12) 59
[75] (N11) 58
[74] (M10) 57
[73] (N10) 56
[58] (M4) NC
[57] (N3) NC
[56] (M3) 55
[55] (N2) 54
[54] (M2) 53
[53] (N1) 52
[52] (L2) 51
[51] (M1) 50
8 (B13)
[1]
9 (C12)
[2]
10 (A13) [3]
11 (B12) [4]
12 (A12) [5]
13 (11)
[6]
NC (A11) [7]
NC (B10) [8]
14 (A4) [23]
15 (B4) [24]
16 (A3) [25]
17 (A2) [26]
18 (B3) [27]
21 (A1) [28]
NC (B2) [29]
NC (B1) [30]
22 (C2) [31]
25 (C1) [32]
26 (D2) [33]
27 (D1) [34]
28 (E2) [35]
29 (E1) [36]
NC (F1) [39]
NC (G2) [40]
30 (G3) [41]
31 (G1) [42]
32 (H3) [45]
33 (J1) [46]
34 (J2) [47]
35 (K1) [48]
NC (K2) [49]
NC (L1) [50]
LAB H
LAB G
LAB F
LAB E
LAB A
LAB B
LAB C
LAB D
3, 20, 37, 54 (A6,B6,F12,F13,H1,H2,M8,N8)
[18, 19, 43, 44, 68, 69, 93, 94]
16, 33, 50, 67 (B8,C8,F2,F3,H11,H12,L6,M6)
[12, 13, 37, 38, 62, 63, 87, 88]
VCC
GND
() ­ PERTAIN TO 100-PIN PGA PACKAGE
1 (C7) [16]
INPUT/CLK
..
78 (A10) [9]
INPUT
.
.....
79 (B9) [10]
INPUT
.
.....
80 (A9) [11]
INPUT
.....
83 (A8) [14]
INPUT
.
.....
84 (B7) [15]
INPUT
.
.....
2 (A7) [17]
INPUT
..
.....
5 (C6) [20]
INPUT
..
.....
6 (A5) [21]
INPUT
..
.....
7 (B5) [22]
INPUT
..
.....
MACROCELL 73­ 80
MACROCELL 72
MACROCELL 71
MACROCELL 70
MACROCELL 69
MACROCELL 68
MACROCELL 67
MACROCELL 66
MACROCELL 65
MACROCELL 57­ 64
[ ] ­PERTAIN TO 100-PIN PQFP PACKAGE
.
CY7C346
USE ULTRA37000
TM
FOR
ALL NEW DESIGNS
Document #: 38-03005 Rev. *B
Page 2 of 21
Selection Guide
7C346-25
7C346-30
7C346-35
Unit
Maximum Access Time
25
30
35
ns
Maximum Operating Current
Commercial
250
250
250
mA
Military
325
320
320
Industrial
320
320
320
Maximum Standby Current
Commercial
225
225
225
mA
Military
275
275
275
Industrial
275
275
275
Pin Configurations
I/O
Top View
PLCC/CLCC
7 6
4
5
3
11
12
10 9 8
43
42
44 45 46
21
22
24
23
25
13
14
41
40
2 1
26
27
18
19
17
16
15
20
28
29
31
30
32
33
36
35
37 38 39
34
52
51
49 50
48
47
53
54
55
60
58
59
57
56
66
65
63
64
62
67
61
INPUT/CLK
I/O
I/O
I/O
V
CC
INP
/CLK
INP
GND
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
V
CC
INP
GND
INP
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
PGA
Bottom View
CY7C346
INP
INP I/O
I/O
I/O
I/O
I/O
I/O
L
K
J
H
G
F
E
D
C
B
A
1
2
3
4
5
6
7
9
10
11
I/O
I/O
I/O
INP
8
I/O
I/O
I/O
I/O
I/O
I/O
I/O
V
CC
12
13
N
M
INP
I/O
INP
INP
INP
I/O
I/O
GND GND
V
CC
V
CC
I/O
I/O
I/O
INP
GND
I/O
I/O
V
CC
V
CC
GND GND
I/O
I/O
I/O
INP
GND
INP
I/O
INP
INP
I/O
INP
V
CC
INP
INP
INP
74
73
72
71
70
69
68
84 83 82 81 80 79 78 77 76 75
INPUT
INPUT
V
CC
V
CC
INPUT
INPUT
INPUT
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
GND
GND
I/O
I/O
V
CC
V
CC
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
INPUT
INPUT
INPUT
GND
GND
INPUT
INPUT
INPUT
INPUT
V
CC
V
CC
INPUT
INPUT
INPUT
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
V
CC
V
CC
I/O
I/O
GND
GND
I/O
I/O
I/O
I/O
I/O
I/O
I/O
INPUT
GND
GND
INPUT
INPUT
INPUT
I/O
I/O
I/O
CY7C346
CY7C346
USE ULTRA37000
TM
FOR
ALL NEW DESIGNS
Document #: 38-03005 Rev. *B
Page 3 of 21
Pin Configurations
(continued)
Top View
PQFP
72
71
69
70
68
2
3
1
36
35
12
13
15
14
16
4
5
34
33
67
66
17
26
9
10
8
7
6
11
27
28
30
29
31 32
61
60
58
59
57
65
64
56
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
INPUT
I/O
INPUT
V
CC
V
CC
INPUT
INPUT
INPUT
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
INPUT
INPUT
INPUT
62
63
I/O
I/O
I/O
GND
I/O
GND
GND
I/O
I/O
V
INPUT
INPUT
I/O
I/O
GND
GND
INPUT
INPUT
INPUT
I/O
I/O
I/O
I/O
V
CC
V
CC
INPUT
INPUT
INPUT
I/O
I/O
I/O
I/O
I/O
I/O
18
19
20
21
22
23
24
25
55
54
53
52
51
50
49
48
47
46
45
37 38 39 40 41 42 43
CC
44
80
79
77
78
76
75
74
73
95
96
97
98
100 99
81
82
83
84
85
86
94 93 92 91 90 89 88 87
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
I/O
INPUT
GND
GND
INPUT
INPUT/CLK
INPUT
I/O
GND
V
CC
I/O
I/O
I/O
V
CC
I/O
I/O
I/O
V
CC
CY7C346
CY7C346
USE ULTRA37000
TM
FOR
ALL NEW DESIGNS
Document #: 38-03005 Rev. *B
Page 4 of 21
Logic Array Blocks
There are eight logic array blocks in the CY7C346. Each LAB
consists of a macrocell array containing 16 macrocells, an
expander product term array containing 32 expanders, and an
I/O block. The LAB is fed by the programmable interconnect
array and the dedicated input bus. All macrocell feedbacks go
to the macrocell array, the expander array, and the program-
mable interconnect array. Expanders feed themselves and the
macrocell array. All I/O feedbacks go to the programmable
interconnect array so that they may be accessed by macro-
cells in other LABs as well as the macrocells in the LAB in
which they are situated.
Externally, the CY7C346 provides 20 dedicated inputs, one of
which may be used as a system clock. There are 64 I/O pins
that may be individually configured for input, output, or bidirec-
tional data flow.
Programmable Interconnect Array
The Programmable Interconnect Array (PIA) solves inter-
connect limitations by routing only the signals needed by each
logic array block. The inputs to the PIA are the outputs of every
macrocell within the device and the I/O pin feedback of every
pin on the device.
Timing Delays
Timing delays within the CY7C346 may be easily determined
using Warp
®
,
Warp ProfessionalTM,
or Warp EnterpriseTM
software. The CY7C346 has fixed internal delays, allowing the
user to determine the worst case timing delays for any design.
Design Recommendations
Operation of the devices described herein with conditions
above those listed under "Maximum Ratings" may cause
permanent damage to the device. This is a stress rating only
and functional operation of the device at these or any other
conditions above those indicated in the operational sections of
this data sheet is not implied. Exposure to absolute maximum
ratings conditions for extended periods of time may affect
device reliability. The CY7C346 contains circuitry to protect
device pins from high static voltages or electric fields, but
normal precautions should be taken to avoid application of any
voltage higher than the maximum rated voltages.
For proper operation, input and output pins must be
constrained to the range GND
(V
IN
or V
OUT
)
V
CC
. Unused
inputs must always be tied to an appropriate logic level
(either V
CC
or GND). Each set of V
CC
and GND pins must
be connected together directly at the device. Power supply
decoupling capacitors of at least 0.2
µ
F must be connected
between V
CC
and GND. For the most effective decoupling,
each V
CC
pin should be separately decoupled to GND
directly at the device. Decoupling capacitors should have
good frequency response, such as monolithic ceramic types
have.
Design Security
The CY7C346 contains a programmable design security
feature that controls the access to the data programmed into
the device. If this programmable feature is used, a proprietary
design implemented in the device cannot be copied or
retrieved. This enables a high level of design control to be
Figure 1. CY7C346 Internal Timing Model
LOGIC ARRAY
CONTROL DELAY
t
LAC
EXPANDER
DELAY
t
EXP
CLOCK
DELAY
t
IC
t
RD
t
COMB
t
LATCH
INPUT
DELAY
t
IN
REGISTER
OUTPUT
DELAY
t
OD
t
XZ
t
ZX
LOGIC ARRAY
DELAY
t
LAD
FEEDBACK
DELAY
t
FD
OUTPUT
INPUT
SYSTEM CLOCK DELAY t
ICS
t
RH
t
RSU
t
PRE
t
CLR
PIA
DELAY
t
PIA
I/O DELAY
t
IO
CY7C346
USE ULTRA37000
TM
FOR
ALL NEW DESIGNS
Document #: 38-03005 Rev. *B
Page 5 of 21
obtained since programmed data within EPROM cells is
invisible. The bit that controls this function, along with all other
program data, may be reset simply by erasing the entire
device.
The CY7C346 is fully functionally tested and guaranteed
through complete testing of each programmable EPROM bit
and all internal logic elements thus ensuring 100%
programming yield.
The erasable nature of these devices allows test programs to
be used and erased during early stages of the production flow.
The devices also contain on-board logic test circuitry to allow
verification of function and AC specification once encapsu-
lated in non-windowed packages.
Timing Considerations
Unless otherwise stated, propagation delays do not include
expanders. When using expanders, add the maximum
expander delay t
EXP
to the overall delay. Similarly, there is an
additional t
PIA
delay for an input from an I/O pin when
compared to a signal from straight input pin.
When calculating synchronous frequencies, use t
S1
if all
inputs are on dedicated input pins. The parameter t
S2
should
be used if data is applied at an I/O pin. If t
S2
is greater than
t
CO1
, 1/t
S2
becomes the limiting frequency in the data path
mode unless 1/(t
WH
+ t
WL
) is less than 1/t
S2
.
When expander logic is used in the data path, add the appro-
priate maximum expander delay, t
EXP
to t
S1
. Determine which
of 1/(t
WH
+ t
WL
), 1/t
CO1
, or 1/(t
EXP
+ t
S1
) is the lowest
frequency. The lowest of these frequencies is the maximum
data path frequency for the synchronous configuration.
When calculating external asynchronous frequencies, use
t
AS1
if all inputs are on the dedicated input pins. If any data
is applied to an I/O pin, t
AS2
must be used as the required
set-up time. If (t
AS2
+ t
AH
) is greater than t
ACO1
, 1/(t
AS2
+ t
AH
)
becomes the limiting frequency in the data path mode unless
1/(t
AWH
+ t
AWL
) is less than 1/(t
AS2
+ t
AH
).
When expander logic is used in the data path, add the appro-
priate maximum expander delay, t
EXP
to t
AS1
. Determine
which of 1/(t
AWH
+ t
AWL
), 1/t
ACO1
, or 1/(t
EXP
+ t
AS1
) is the
lowest frequency. The lowest of these frequencies is the
maximum data path frequency for the asynchronous config-
uration.
The parameter t
OH
indicates the system compatibility of this
device when driving other synchronous logic with positive
input hold times, which is controlled by the same
synchronous clock. If t
OH
is greater than the minimum
required input hold time of the subsequent synchronous
logic, then the devices are guaranteed to function properly
with a common synchronous clock under worst-case
environmental and supply voltage conditions.
The parameter t
AOH
indicates the system compatibility of this
device when driving subsequent registered logic with a
positive hold time and using the same asynchronous clock
as the CY7C346.
In general, if t
AOH
is greater than the minimum required input
hold time of the subsequent logic (synchronous or
asynchronous) then the devices are guaranteed to function
properly under worst-case environmental and supply voltage
conditions, provided the clock signal source is the same.
This also applies if expander logic is used in the clock signal
path of the driving device, but not for the driven device. This
is due to the expander logic in the second device's clock
signal path adding an additional delay (t
EXP
) causing the
output data from the preceding device to change prior to the
arrival of the clock signal at the following device's register.
Typical I
CC
vs. f
MAX
Output Drive Current
400
300
200
100
1 kHz
10 kHz
100 kHz 1 MHz
I
CC
MAXIMUM FREQUENCY
10 MHz
0
50 MHz
100 Hz
ACTIVE (mA) Ty
p
.
V
CC
= 5.0V
Room Temp.
0
1
2
3
4
I OUTPU
T
CUR
RENT (
m
A) T
Y
PIC
A
L
V
O
OUTPUT VOLTAGE (V)
100
80
60
40
20
5
O
I
OH
I
OL
V
CC
= 5.0V
Room Temp.
0.45