Document Outline
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Dual-Axis ±5 g Accelerometer
with SPI Interface
ADIS16006
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable. However, no
responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other
rights of third parties that may result from its use. Specifications subject to change without notice. No
license is granted by implication or otherwise under any patent or patent rights of Analog Devices.
Trademarks and registered trademarks are the property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
www.analog.com
Fax: 781.461.3113
©2006 Analog Devices, Inc. All rights reserved.
FEATURES
Dual-axis accelerometer
SPI® digital output interface
Internal temperature sensor
Highly integrated; minimal external components
Bandwidth externally selectable
1.9 mg resolution at 60 Hz
Externally controlled electrostatic self-test
3.0 V to 5.25 V single-supply operation
Low power: <2 mA
3500 g shock survival
7.2 mm × 7.2 mm × 3.6 mm package
APPLICATIONS
Industrial vibration/motion sensing
Platform stabilization
Dual-axis tilt sensing
Tracking, recording, analysis devices
Alarms, security devices
GENERAL DESCRIPTION
The ADIS16006 is a low cost, low power, complete dual-axis
accelerometer with an integrated serial peripheral interface
(SPI). An integrated temperature sensor is also available on the
SPI interface. The ADIS16006 measures acceleration with a full-
scale range of ±5 g (minimum). The ADIS16006 can measure
both dynamic acceleration (that is, vibration) and static accel-
eration (that is, gravity).
The typical noise floor is 200 g/Hz, allowing signals below
1.9 mg (60 Hz bandwidth) to be resolved.
The bandwidth of the accelerometer is set with optional
capacitors, C
X
and C
Y
, at the XFILT and YFILT pins. Digital
output data for both axes is available via the serial interface.
An externally driven self-test pin (ST) allows the user to verify
the accelerometer functionality.
The ADIS16006 is available in a 7.2 mm × 7.2 mm × 3.6 mm,
12-terminal LGA package.
FUNCTIONAL BLOCK DIAGRAM
SCLK
DIN
DOUT
CS
TCS
TEMP
SENSOR
SERIAL
INTERFACE
DUAL-AXIS
±5g
ACCELEROMETER
V
CC
C
DC
COM
ST
C
Y
C
X
YFILT
XFILT
ADIS16006
05
97
5-
00
1
Figure 1.
ADIS16006
Rev. 0 | Page 2 of 16
TABLE OF CONTENTS
Features .............................................................................................. 1
Applications....................................................................................... 1
General Description ......................................................................... 1
Functional Block Diagram .............................................................. 1
Revision History ............................................................................... 2
Specifications..................................................................................... 3
Timing Characteristics ................................................................ 4
Circuit and Timing Diagrams..................................................... 4
Absolute Maximum Ratings............................................................ 6
ESD Caution.................................................................................. 6
Pin Configuration and Function Descriptions............................. 7
Typical Performance Characteristics ............................................. 8
Theory of Operation ...................................................................... 11
Self-Test ....................................................................................... 11
Serial Interface ............................................................................ 11
Accelerometer Serial Interface.................................................. 11
Temperature Sensor Serial Interface........................................ 12
Power Supply Decoupling ......................................................... 12
Setting the Bandwidth ............................................................... 13
Selecting Filter Characteristics:
The Noise/Bandwidth Trade-Off ............................................. 13
Applications..................................................................................... 14
Second Level Assembly ............................................................. 14
Outline Dimensions ....................................................................... 15
Ordering Guide .......................................................................... 15
REVISION HISTORY
3/06--Revision 0: Initial Version
ADIS16006
Rev. 0 | Page 3 of 16
SPECIFICATIONS
T
A
= -40°C to +125°C, V
CC
= 5 V, C
X
= C
Y
= 0 F, acceleration = 0 g, unless otherwise noted. All minimum and maximum specifications
are guaranteed. Typical specifications are not guaranteed.
Table 1.
Parameter Conditions
Min
Typ
Max
Unit
ACCELEROMETER SENSOR INPUT
Each axis
Measurement Range
1
±5
g
Nonlinearity
% of full scale
±0.5
±2.5
%
Package Alignment Error
±1.5
degrees
Alignment Error
X sensor to Y sensor
±0.1
degrees
Cross Axis Sensitivity
±1.5
±3
%
ACCELEROMETER SENSITIVITY
Each axis
Sensitivity at XFILT, YFILT
242
256
272
LSB/g
Sensitivity Change due to Temperature
2
Delta from 25°C
±0.3
%
ZERO g BIAS LEVEL
Each axis
0 g Voltage at XFILT, YFILT
1905
2048
2190
LSB
0 g Offset vs. Temperature
±0.1
LSB/°C
ACCELEROMETER NOISE PERFORMANCE
Noise Density
@ 25°C
200
g/Hz rms
ACCELEROMETER FREQUENCY RESPONSE
3 , 4
C
X
, C
Y
Range
0
10
F
R
FILT
Tolerance
24
32
40
k
Sensor Bandwidth
C
X
= 0F, C
Y
= 0F
2.26
kHz
Sensor Resonant Frequency
5.5
kHz
ACCELEROMETER SELF-TEST
Logic Input Low
0.2 × V
CC
V
Logic Input High
0.8 × V
CC
V
ST Input Resistance to COM
30
50
k
Output Change at X
OUT
, Y
OUT
T
5
Self-Test 0 to Self-Test 1
102
205
307
LSB
TEMPERATURE SENSOR
Accuracy V
CC
= 3 V to 5.25 V
±2
°C
Resolution
10
Bits
Update Rate
400
s
Temperature Conversion Time
25
s
DIGITAL INPUT
Input High Voltage (V
INH
) V
CC
= 4.75 V to 5.25 V
2.4
V
V
CC
= 3.0 V to 3.6 V
2.1
V
Input Low Voltage (V
INL
) V
CC
= 3.0 V to 5.25 V
0.8
V
Input Current
V
IN
= 0 V or V
CC
-10 1 10 A
Input Capacitance
10
pF
DIGITAL OUTPUT
Output High Voltage (V
OH
) I
SOURCE
= 200 A, V
CC
= 3.0 V to 5.25 V
V
CC
- 0.5
V
Output Low Voltage (V
OL
) I
SINK
= 200 A
0.4
V
ADIS16006
Rev. 0 | Page 4 of 16
Conditions
Min
Typ
Max
Unit
Parameter
POWER SUPPLY
Operating Voltage Range
3.0
5.25
V
Quiescent Supply Current
F
SCLK
= 50 kSPS
1.5
1.9
mA
Power-Down Current
1.0
mA
Turn-On Time
6
C
X
, C
Y
= 0.1 F
20
ms
1
Guaranteed by measurement of initial offset and sensitivity.
2
Defined as the output change from ambient to maximum temperature or ambient to minimum temperature.
3
Actual bandwidth response controlled by user-supplied external capacitor (C
X
, C
Y
).
4
See the Setting the Bandwidth section for more information on how to reduce the bandwidth.
5
Self-test response changes as the square of V
CC
.
6
Larger values of C
X
and C
Y
increase turn-on time. Turn-on time is approximately (160 × (0.0022 + C
X
or C
Y
) + 4) in milliseconds, where C
X
and C
Y
are in F.
TIMING CHARACTERISTICS
T
A
= -40°C to +125°C, acceleration = 0 g, unless otherwise noted.
Table 2.
Parameter
1 , 2
V
CC
= 3.3 V
V
CC
= 5 V
Unit
Description
f
SCLK
3
10 10
kHz
min
2
2
MHz
max
t
CONVERT
14.5 × t
SCLK
14.5 × t
SCLK
t
ACQ
1.5 × t
SCLK
1.5 × t
SCLK
Throughput time = t
CONVERT
+ t
ACQ
= 16 × t
SCLK
10 10
ns
min
TCS/CS to SCLK setup time
t
1
60 30
ns
max
Delay from TCS/CS until DOUT three-state disabled
t
2
4
t
3
4
100
75
ns max
Data access time after SCLK falling edge
t
4
20
20
ns min
Data setup time prior to SCLK rising edge
t
5
20
20
ns min
Data hold time after SCLK rising edge
t
6
0.4 × t
SCLK
0.4 × t
SCLK
ns min
SCLK high pulse width
t
7
0.4 × t
SCLK
0.4 × t
SCLK
ns min
SCLK low pulse width
80 80
ns
max
TCS/CS rising edge to DOUT high impedance
t
8
5
t
9
5
5
s typ
Power-up time from shutdown
1
Guaranteed by design. All input signals are specified with t
R
and t
F
= 5 ns (10% to 90% of V
CC
) and timed from a voltage level of 1.6 V. The 3.3 V operating range spans
from 3.0 V to 3.6 V. The 5 V operating range spans from 4.75 V to 5.25 V.
2
See Figure 3 and Figure 4.
3
Mark/space ratio for the SCLK input is 40/60 to 60/40.
4
Measured with the load circuit in Figure 2 and defined as the time required for the output to cross 0.4 V or 2.0 V with V
CC
= 3.3 V and time for an output to cross 0.8 V or
2.4 V with V
CC
= 5.0 V.
5
t
8
is derived from the measured time taken by the data outputs to change 0.5 V when loaded with the circuit in Figure 2. The measured number is then extrapolated
back to remove the effects of charging or discharging the 50 pF capacitor. This means that the time, t
8
, quoted in the Timing Characteristics is the true bus relinquish
time of the part and is independent of the bus loading.
CIRCUIT AND TIMING DIAGRAMS
200µA
I
OL
200µA
I
OH
1.6V
TO OUTPUT
PIN
C
L
50pF
05
97
5-
00
2
Figure 2. Load Circuit for Digital Output Timing Specifications
ADIS16006
Rev. 0 | Page 5 of 16
SCLK
DOUT
DIN
DON'T
CARE
ZERO
ZERO
ZERO
ADD0
ONE
ZERO
PM0
4 LEADING ZEROS
1
2
3
4
5
6
15
16
t
ACQ
t
CONVERT
THREE-STATE
THREE-STATE
t
1
t
2
t
5
t
4
t
6
t
7
t
3
t
8
DB11
DB10
DB9
DB0
CS
0
59
75
-
00
3
Figure 3. Accelerometer Serial Interface Timing Diagram
TCS
SCLK
DOUT
DIN
1
2
3
4
11
15
16
THREE-
STATE
THREE-STATE
t
1
t
6
t
7
t
3
t
8
DB0
DB9
DB8
LEADING
ZERO
0
59
75
-
00
4
Figure 4. Temperature Serial Interface Timing Diagram
ADIS16006
Rev. 0 | Page 6 of 16
ABSOLUTE MAXIMUM RATINGS
Table 3.
Parameter Rating
Acceleration (Any Axis, Unpowered)
3500 g
Acceleration (Any Axis, Powered)
3500 g
V
CC
-0.3 V to +7.0 V
All Other Pins
(COM - 0.3 V) to
(V
CC
+ 0.3 V)
Output Short-Circuit Duration
(Any Pin to Common)
Indefinite
Operating Temperature Range
-40°C to +125°C
Storage Temperature
-65°C to +150°C
Table 4. Package Characteristics
Package Type
CA
JC
Device Weight
12-Lead LGA
200
°
C/W 25
°
C/W
0.3 grams
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
1.0755
8× BSC
0.670
8× BSC
1.127
12× BSC
0.500
12× BSC
5.873
2×
05
97
5-
00
5
Figure 5. Second Level Assembly Pad Layout
ADIS16006
Rev. 0 | Page 7 of 16
PIN CONFIGURATION AND FUNCTION DESCRIPTIONS
ADIS16006
TOP VIEW
(Not to Scale)
N
C
C
O
M
S
T
V
C
C
S
C
L
K
C
S
NC = NO CONNECT
XFILT
YFILT
NC
9
8
2
7
1
3
6
5
4
10
12
11
TCS
DOUT
DIN
05
97
5-
00
6
Figure 6. Pin Configuration
Table 5. Pin Function Descriptions
Pin No.
Mnemonic
Description
1
TCS
Temperature Chip Select. Active low logic input. This input frames the serial data transfer for the temperature
sensor output.
2 DOUT Data Out, Logic Output. The conversion of the ADIS16006 is provided on this output as a serial data stream.
The bits are clocked out on the falling edge of the SCLK input.
3 DIN Data In, Logic Input. Data to be written into the ADIS16006's control register is provided on this input and
is clocked into the register on the rising edge of SCLK.
4
COM
Common. Reference point for all circuitry on the ADIS16006.
5, 7
NC
No Connect.
6
ST
Self-Test Input. Active high logic input. Simulates a nominal 0.75 g test input for diagnostic purpose.
8 YFILT Y Channel Filter Node. Used in conjunction with an optional external capacitor to band limit the noise
contribution from the accelerometer.
9 XFILT X Channel Filter Node. Used in conjunction with an optional external capacitor to band limit the noise
contribution from the accelerometer.
10
CS
Chip Select. Active low logic input. This input provides the dual function of initiating the accelerometer
conversions on the ADIS16006 and framing the serial data transfer for the accelerometer output.
11 V
CC
Power Supply Input. The V
CC
range for the ADIS16006 is 3.0 V to 5.25 V.
12 SCLK Serial Clock, Logic Input. SCLK provides the serial clock for accessing data from the part and writing serial data
to the control register. This clock input is also used as the clock source for the ADIS16006's conversion process.
ADIS16006
Rev. 0 | Page 8 of 16
TYPICAL PERFORMANCE CHARACTERISTICS
262
254
255
256
257
258
259
260
261
50
25
0
25
50
75
100
125
150
SEN
SI
T
I
VI
T
Y (
L
SB
/
g
)
TEMPERATURE (°C)
B1-X
B1-Y
B2-X
B2-Y
B3-X
B3-Y
B4-X
B4-Y
B5-X
B5-Y
05
97
5-
00
7
Figure 7. Sensitivity vs. Temperature (±1 g Stimulus)
2048
2046
2044
2042
2040
2038
40
20
0
20
40
60
80
100
120
BI
AS
L
E
V
E
L
(
L
S
B)
TEMPERATURE (°C)
AVG AT 3.00V
AVG AT 3.30V
AVG AT 3.60V
AVG AT 4.75V
AVG AT 5.25V
5.25V
05
97
5-
00
8
Figure 8. X-Axis 0 g Bias vs. Temperature
2048
2046
2044
2042
2040
2038
2047
2045
2043
2041
2039
3.0
5.5
5.0
4.5
4.0
3.5
BI
AS
L
E
V
E
L
(
L
S
B)
V
CC
(V)
40°C
+25°C
+125°C
05
97
5-
0
09
Figure 9. X-Axis 0 g Bias vs. Supply Voltage
25
20
15
10
5
0
19
95
20
00
20
05
20
10
20
15
20
20
20
25
20
30
20
35
20
40
20
45
20
50
20
55
20
60
20
65
20
70
20
75
20
80
20
85
20
90
PER
C
E
N
T
O
F
PO
PU
L
A
T
I
O
N
(%
)
OUTPUT (LSB)
AVERAGE = 2040.66
STANDARD DEVIATION = 23.19
0
597
5-
0
10
Figure 10. X-Axis 0 g Bias at 25°C
40
35
30
25
20
15
10
5
0
19
95
20
00
20
05
20
10
20
15
20
20
20
25
20
30
20
35
20
40
20
45
20
50
20
55
20
60
20
65
20
70
20
75
20
80
20
85
20
90
PER
C
E
N
T
O
F
PO
PU
L
A
T
I
O
N
(%
)
OUTPUT (LSB)
AVERAGE = 2055.875
STANDARD DEVIATION = 6.464
0
597
5-
0
11
Figure 11. Y-Axis 0 g Bias at 25°C
60
50
40
30
20
10
0
PER
C
E
N
T
O
F
PO
PU
L
A
T
I
O
N
(%
)
NOISE (µg/ Hz)
80
85
90
95 100 105 110 115 120 125 130 135 140
05
97
5-
0
12
Figure 12. Noise (X-Axis) at V
CC
= 5 V, 25°C
ADIS16006
Rev. 0 | Page 9 of 16
45
40
35
30
25
20
15
10
5
0
PER
C
E
N
T
O
F
PO
PU
L
A
T
I
O
N
(%
)
NOISE (µg/ Hz)
80
85
90
95 100 105 110 115 120 125 130 135 140
05
97
5-
0
13
Figure 13. Noise (Y-Axis) at V
CC
= 5 V, 25°C
40
35
30
25
20
15
10
5
0
PER
C
E
N
T
O
F
PO
PU
L
A
T
I
O
N
(%
)
OUTPUT (LSB)
110
130
150
170
190
210
230
250
270
290
AVERAGE = 202.2137
STANDARD DEVIATION = 12.09035
05
97
5-
0
14
Figure 14. X-Axis Self-Test at 25°C, V
CC
= 5 V
40
35
30
25
20
15
10
5
0
PER
C
E
N
T
O
F
PO
PU
L
A
T
I
O
N
(%
)
OUTPUT (LSB)
110
105
100
95
90
85
80
75
70
65
60
55
50
45
40
AVERAGE = 82.89281
STANDARD DEVIATION = 4.908012
05
97
5-
0
15
Figure 15. X-Axis Self-Test at 25°C, V
CC
= 3.3 V
250
200
150
100
50
0
S
E
L
F
T
E
ST
(L
SB
)
TEMPERATURE (°C)
150
50
100
0
50
AVG AT 3.00V
AVG AT 3.30V
AVG AT 3.60V
AVG AT 4.75V
AVG AT 5.00V
AVG AT 5.25V
05
97
5-
0
16
Figure 16. Self-Test X-Axis vs. Temperature
250
230
210
190
170
150
130
110
90
70
50
S
E
L
F
T
E
ST
(L
SB
)
V
CC
(V)
5.5
+125°C
+25°C
40°C
4.0
4.5
5.0
3.5
3.0
059
75
-
01
7
Figure 17. Self-Test X-Axis vs. Supply Voltage
+125°C
+25°C
40°C
1.8
1.7
1.6
1.5
1.4
1.3
1.2
1.1
1.0
CU
RRE
N
T
(
m
A)
V
CC
(V)
5.5
4.0
4.5
5.0
3.5
3.0
059
75
-
01
8
Figure 18. Supply Current vs. Supply Voltage
ADIS16006
Rev. 0 | Page 10 of 16
45
35
25
15
5
5
PER
C
E
N
T
O
F
PO
PU
L
A
T
I
O
N
(%
)
CURRENT (mA)
05
97
5-
0
23
V
CC
= 5.0V
V
CC
= 3.3V
1.59
1.15 1.19 1.23 1.27 1.31 1.35 1.39 1.43 1.47 1.51 1.55
Figure 19. Supply Current at 25°C
60
50
40
30
20
10
0
PER
C
E
N
T
O
F
PO
PU
L
A
T
I
O
N
(%
)
CURRENT (mA)
1.10
0.70 0.74 0.78 0.82 0.86 0.90 0.94 0.98 1.02 1.06
05
97
5-
0
19
V
CC
= 5.0V
V
CC
= 3.3V
Figure 20. Power-Down Supply Current
1.3
1.2
1.1
1.0
0.9
0.8
0.7
0.6
CU
RRE
N
T
(
m
A)
V
CC
(V)
5.5
5.0
4.5
4.0
3.5
3.0
059
75
-
02
0
+125°C
+25°C
40°C
Figure 21. Power-Down Supply Current vs. Supply Voltage
SA
M
PL
I
N
G
E
R
R
O
R
FREQUENCY (MHz)
05
97
5-
0
24
100
1
10
0.6
1.0
0.8
0.6
0.4
0.2
0
0.2
0.4
Figure 22. Sampling Error vs. Sampling Frequency
ADIS16006
Rev. 0 | Page 11 of 16
THEORY OF OPERATION
The ADIS16006 is a low cost, low power, complete dual-axis
accelerometer with an integrated serial peripheral interface
(SPI) and an integrated temperature sensor whose output is
also available on the SPI interface. The ADIS16006 is capable
of measuring acceleration with a full-scale range of ±5 g
(minimum). The ADIS16006 can measure both dynamic
acceleration (that is, vibration) and static acceleration (that is,
gravity).
SELF-TEST
The ST pin controls the self-test feature. When this pin is set to
V
CC
, an electrostatic force is exerted on the beam of the acceler-
ometer. The resulting movement of the beam allows the user to
test if the accelerometer is functional. The typical change in
output is 801 mg (corresponding to 205 LSB) for V
CC
= 5.0 V.
This pin may be left open-circuit or connected to common in
normal use. The ST pin should never be exposed to voltage
greater than V
CC
+ 0.3 V. If the system design is such that this
condition cannot be guaranteed (that is, multiple supply voltages
present), a low V
F
clamping diode between ST and V
CC
is
recommended.
SERIAL INTERFACE
The serial interface on the ADIS16006 consists of five wires: CS,
TCS, SCLK, DIN, and DOUT. Both accelerometer axes and the
temperature sensor data are available on the serial interface.
The CS and TCS are used to select the accelerometer or tem-
perature sensor outputs, respectively. CS and TCS cannot be
active at the same time.
The SCLK input provides access to data from the internal data
registers.
ACCELEROMETER SERIAL INTERFACE
Figure 3 shows the detailed timing diagram for serial interfacing to
the accelerometer in the ADIS16006. The serial clock provides
the conversion clock. CS initiates the conversion process and
data transfer and also frames the serial data transfer for the
accelerometer output. The accelerometer output is sampled on
the second rising edge of the SCLK input after the falling edge
of the CS. The conversion requires 16 SCLK cycles to complete.
The rising edge of CS puts the bus back into three-state. If CS
remains low, the next digital conversion is initiated. The details
for the control register bit functions are shown in Table 6.
Accelerometer Control Register
MSB
LSB
DONTC ZERO ZERO ZERO ZERO ONE ZERO PM0
Table 6. Accelerometer Control Register Bit Functions
Bit Mnemonic
Comments
7
DONTC
Don't care. Can be 1 or 0.
6, 5, 4
ZERO
These bits should be held low.
3 ADD0 This address bit selects the X-axis or Y-axis
outputs. A 0 selects the X-axis; a 1 selects
the Y-axis.
2
ONE
This bit should be held high.
1
ZERO
This bit should be held low.
0 PM0
This bit selects the operation mode for
the accelerometer; set to 0 for normal
operation and 1 for power-down mode.
Power-Down
By setting PM0 to 1 when updating the accelerometer control
register, the ADIS16006 is put into a shutdown mode. The
information stored in the control register is maintained during
shutdown. The ADIS16006 changes modes as soon as the control
register is updated. Therefore, if the part is in shutdown mode
and PM0 is changed to 0, the part powers up on the 16th SCLK
rising edge.
ADD0
By setting ADD0 to 0 when updating the accelerometer control
register, the X-axis output is selected. By setting ADD0 to 1, the
Y-axis output is selected.
ZERO
ZERO is defined as the logic low level.
ONE
ONE is defined as the logic high level.
DONTC
DONTC is defined as don't care and can be a low or high logic
level.
Accelerometer Conversion Details
Every time the accelerometer is sampled, the sampling function
discharges the internal C
X
or C
Y
filtering capacitors by up to 2%
of their initial values (assuming no additional external filtering
capacitors have been added). The recovery time for the filter
capacitor to recharge is approximately 10 s. Thus, sampling the
accelerometer at a rate of 10 kSPS or less does not induce a
sampling error. However, as sampling frequencies increase
above 10 kSPS, one can expect sampling errors to attenuate the
actual acceleration levels.
ADIS16006
Rev. 0 | Page 12 of 16
TEMPERATURE SENSOR SERIAL INTERFACE
Read Operation
Figure 4 shows the timing diagram for a serial read from the
temperature sensor. The TCS line enables the SCLK input.
Ten bits of data and a leading 0 are transferred during a read
operation. Read operations occur during streams of 16 clock
pulses. The serial data can be received into two bytes to
accommodate the entire 10-bit data stream. If only eight bits
of resolution are required, then the data can be received into
a single byte. At the end of the read operation, the DOUT line
remains in the state of the last bit of data clocked out until TCS
goes high, at which time the DOUT line from the temperature
sensor goes three-state.
Write Operation
Figure 4 also shows the timing diagram for the serial write to
the temperature sensor. The write operation takes place at the
same time as the read operation. Data is clocked into the
control register on the rising edge of SCLK. DIN should remain
low for the entire cycle.
Temperature Sensor Control Register
MSB
LSB
ZERO ZERO ZERO ZERO ZERO ZERO ZERO ZERO
Table 7. Temperature Sensor Control Register Bit Functions
Bit Mnemonic Comments
7 to 0
ZERO
All bits should be held low.
ZERO
ZERO is defined as the logic low level.
Output Data format
The output data format for the temperature sensor is twos
complement. Table 8 shows the relationship between the digital
output and the temperature.
Temperature Sensor Conversion Details
The ADIS16006 features a 10-bit digital temperature sensor that
allows accurate measurement of the ambient device temperature.
The conversion clock for the temperature sensor is internally
generated so no external clock is required except when reading
from and writing to the serial port. In normal mode, an internal
clock oscillator runs the automatic conversion sequence. A con-
version is initiated approximately every 350 s. At this time,
the temperature sensor wakes up and performs a temperature
conversion. This temperature conversion typically takes 25 s,
at which time the temperature sensor automatically shuts down.
The result of the most recent temperature conversion is avail-
able in the serial output register at any time. Once the conversion is
finished, an internal oscillator starts counting and is designed to
time out every 350 s. The temperature sensor then powers up
and does a conversion.
Note that if the TCS is brought low every 350 s (±30%) or less,
the same temperature value is output onto the DOUT line every
time without changing. It is recommended that the TCS line not
be brought low every 350 s (±30%) or less. The ±30% covers
process variation. The TCS should become active (high to low)
outside this range.
The device is designed to autoconvert every 350 s. If the
temperature sensor is accessed during the conversion process,
an internal signal is generated to prevent any update of the
temperature value register during the conversion. This prevents
the user from reading back spurious data. The design of this
feature results in this internal lockout signal being reset only at
the start of the next autoconversion. Therefore, if the TCS line
goes active before the internal lockout signal is reset to its
inactive mode, the internal lockout signal is not reset. To ensure
that no lockout signal is set, bring TCS low at a greater time
than 350 s (±30%). As a result, the temperature sensor is not
interrupted during a conversion process.
In the automatic conversion mode, every time a read or write
operation takes place, the internal clock oscillator is restarted at
the end of the read or write operation. The result of the conversion
is typically available 25 s later. Reading from the device before
conversion is complete provides the same set of data.
Table 8. Temperature Sensor Data Format
Temperature
Digital Output (DB9 ... DB0)
40°C
11 0110 0000
25°C
11 1001 1100
0.25°C
11 1111 1111
0°C
00 0000 0000
+0.25°C
00 0000 0001
+10°C
00 0010 1000
+25°C
00 0110 0100
+50°C
00 1100 1000
+75°C
01 0010 1100
+100°C
01 1001 0000
+125°C
01 1111 0100
POWER SUPPLY DECOUPLING
The ADIS16006 integrates two decoupling capacitors that are
0.047 F in value. For local operation of the ADIS16006, no
additional power supply decoupling capacitance is required.
However, if the system power supply presents a substantial
amount of noise, additional filtering can be required. If
additional capacitors are required, connect the ground terminal
of each of these capacitors directly to the underlying ground
plane. Finally, note that all analog and digital grounds should be
referenced to the same system ground reference point.
ADIS16006
Rev. 0 | Page 13 of 16
SETTING THE BANDWIDTH
The ADIS16006 has provisions for band limiting the acceler-
ometer. Capacitors can be added at the XFILT and YFILT pins
to implement further low-pass filtering for antialiasing and
noise reduction. The equation for the 3 dB bandwidth is
F
-3dB
= 1/(2(32 k) × (C
(XFILT, YFILT)
+ 2200 pF))
or more simply,
F
-3dB
= 5 F/(C
(XFILT, YFILT)
+ 2200 pF)
The tolerance of the internal resistor (R
FILT
) can vary typically as
much as ±25% of its nominal value (32 k); thus, the bandwidth
varies accordingly.
A minimum capacitance of 0 pF for C
XFILT
and C
YFILT
is
allowable.
Table 9. Filter Capacitor Selection, C
XFILT
and C
YFILT
Bandwidth (Hz)
Capacitor (F)
1
4.7
10
0.47
50
0.10
100 0.047
200 0.022
400 0.01
2250 0
SELECTING FILTER CHARACTERISTICS:
THE NOISE/BANDWIDTH TRADE-OFF
The accelerometer bandwidth selected ultimately determines
the measurement resolution (smallest detectable acceleration).
Filtering can be used to lower the noise floor, which improves
the resolution of the accelerometer. Resolution is dependent on
the analog filter bandwidth at XFILT and YFILT.
The ADIS16006 has a typical bandwidth of 2.25 kHz with no
external filtering. The analog bandwidth may be further
decreased to reduce noise and improve resolution.
The ADIS16006 noise has the characteristics of white Gaussian
noise, which contributes equally at all frequencies and is described
in terms of g/Hz (that is, the noise is proportional to the
square root of the accelerometer's bandwidth). The user should
limit bandwidth to the lowest frequency needed by the applica-
tion to maximize the resolution and dynamic range of the
accelerometer.
With the single pole roll-off characteristic, the typical noise of
the ADIS16006 is determined by
rmsNoise = (200 g/root Hz) x (root (BW x 1.57))
At 100 Hz, the noise is
rmsNoise = (200 g/root Hz) x (root (100 x 1.57)) =2.5 mg
Often, the peak value of the noise is desired. Peak-to-peak noise
can be estimated only by statistical methods. Table 10 is useful
for estimating the probabilities of exceeding various peak
values, given the rms value.
Table 10. Estimation of Peak-to-Peak Noise
Peak-to-Peak
Value
Percentage of Time That Noise Exceeds
Nominal Peak-to-Peak Value
2 × rms
32%
4 × rms
4.6%
6 × rms
0.27%
8 × rms
0.006%
12
4
10
11
6
5
8
9
7
3
2
1
12
4
10
11
6
5
8
9
7
3
2
1
12
4
10
11
6
5
8
9
7
3
2
1
12
4
10
11
6
5
8
9
7
3
2
1
Top View
Not to Scale
DIGITAL OUTPUT (IN LSBs)
X-AXIS: 1792
Y-AXIS: 2048
DIGITAL OUTPUT (IN LSBs)
X-AXIS: 2304
Y-AXIS: 2048
DIGITAL OUTPUT (IN LSBs)
X-AXIS: 2048
Y-AXIS: 2304
DIGITAL OUTPUT (IN LSBs)
X-AXIS: 2048
Y-AXIS: 1792
DIGITAL OUTPUT (IN LSBs)
X-AXIS: 2048
Y-AXIS: 2048
05975-
021
Figure 23. Output Response vs. Orientation
ADIS16006
Rev. 0 | Page 14 of 16
APPLICATIONS
SECOND LEVEL ASSEMBLY
The ADIS16006 can be attached to the second-level assembly
board using SN63 (or equivalent) or lead-free solder. Figure 24
and Table 11 provide acceptable solder reflow profiles for each
solder type. Note that these profiles cannot be the optimum
profile for the user's application. In no case shall 260°C be
exceeded. It is recommended that the user develop a reflow
profile based upon the specific application. In general, keep
in mind the lowest peak temperature and shortest dwell time
above the melt temperature of the solder result in less shock
and stress to the product. In addition, evaluating the cooling
rate and peak temperature can result in a more reliable assembly.
t
P
t
L
t
25°C TO PEAK
t
S
PREHEAT
CRITICAL ZONE
T
L
TO T
P
T
E
M
P
E
RAT
URE
TIME
RAMP-DOWN
RAMP-UP
T
SMIN
T
SMAX
T
P
T
L
05975-
022
Figure 24. Acceptable Solder Reflow Profiles
Table 11.
Condition
Profile Feature
Sn63/Pb37
Pb-free
Average Ramp Rate (T
L
to T
P
) 3°C/sec
max
3°C/sec
max
Preheat
Minimum Temperature (T
SMIN
) 100°C
150°C
Maximum Temperature (T
SMAX
) 150°C 200°C
Time (T
SMIN to
T
SMAX
) (t
s
)
60 sec to
120 sec
60 sec to
150 sec
T
SMAX to
T
L
Ramp-Up Rate
3°C/sec
3°C/sec
Time Maintained
Above Liquidous (T
L
)
Liquidous Temperature (T
L
) 183°C 217°C
Time (t
L
)
60 sec to
150 sec
60 sec to
150 sec
Peak Temperature (T
P
)
240°C +
0°C/-5°C
260°C +
0°C/-5°C
Time Within 5°C of Actual Peak
Temperature (t
p
)
10 sec to
30 sec
20 sec to
40 sec
Ramp-Down Rate
6°C/sec max
6°C/sec max
Time 25°C to Peak Temperature
6 min max
8 min max
ADIS16006
Rev. 0 | Page 15 of 16
OUTLINE DIMENSIONS
TOP VIEW
SIDE VIEW
PIN 1
INDICATOR
5.00 TYP
BOTTOM VIEW
1.3025
BSC
0.373 BSC
(12 PLCS)
0.227 BSC
(4 PLCS)
PIN 1
INDICATOR
0.797
BSC
1.00
BSC
3.60
MAX
1
3
9
7
4
6
12
10
03
17
06
-
A
7.33 MAX
SQ
Figure 25. 12-Terminal Land Grid Array [LGA]
(CC-12-1)
Dimensions shown in millimeters
ORDERING GUIDE
Model
Temperature Range
Package Description
Package Option
ADIS16006CCCZ
1
-40°C to +125°C
12-Terminal Land Grid Array (LGA)
CC-12-1
ADIS16006/PCB
Evaluation
Board
1
Z = Pb-free part.
ADIS16006
Rev. 0 | Page 16 of 16
T
NOTES
©2006 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
D05975-0-3/06(0)
TTT
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